Abstract: A power semiconductor device includes a substrate layer, a semiconductor layer, a barrier layer, a source structure, a drain structure, first and second gate structures, and a field plate that cooperatively form an equivalent circuit including first and second transistors, and a Schottky diode. The barrier layer and the semiconductor layer cooperatively form a 2DEG. The first gate structure controls presence and movement of the 2DEG for controlling a current flow between the source structure and the drain structure. The second gate structure cooperates with the barrier layer to form a diode structure with Schottky diode characteristics. A drain terminal of the first transistor is electrically connected to a source terminal of the second transistor. A gate terminal of the second transistor is electrically connected to a cathode of the Schottky diode. An anode of the Schottky diode is electrically connected to a source terminal of the first transistor.

Abstract: A power circuit includes a reference terminal, a power supply terminal for receiving a power supply voltage, an input terminal for receiving a driving signal, a power semiconductor device electrically connected between the power supply terminal and the reference terminal, an enhancement-mode transistor, and a depletion-mode transistor. The power semiconductor device has a source terminal and a gate terminal. The enhancement-mode transistor has a drain terminal electrically connected to the gate terminal of the power semiconductor device, and a gate terminal and a source terminal that are electrically connected to the input terminal. The depletion-mode transistor has a drain terminal electrically connected to the gate terminal of the power semiconductor device, a gate terminal electrically connected to the source terminal of the power semiconductor device, and a source terminal electrically connected to the input terminal.

Abstract: A universal switching platform is configured to test a device under test, and includes a first power source, a first switch, a second switch and a second power source. The first switch, the second switch and the second power source are coupled in series between positive and negative terminals of the first power source. The common node of the first and second switches and the negative terminal of the first power source are configured to be respectively coupled to first and second terminals of the device under test. The universal switching platform provides a voltage and a current to test the device under test when the first and second switches are controlled to transition between conduction and non-conduction.

Abstract: A level adjusting circuit includes a parallel resistor-capacitor (RC) sub-circuit, a first diode and an adjustable voltage supply. The RC sub-circuit includes an input capacitor and an input resistor, and includes an input node electrically connected to a driving signal source for receiving a driving signal therefrom, and an output node that outputs an adjusted driving signal. The first diode and the adjustable voltage supply are electrically connected, and are further electrically connected to the output node and a reference voltage node, respectively.

Abstract: A gate-driving circuit includes a unidirectional module and two driving modules, and has a low-potential terminal, an output terminal, and two input terminals via which two driving signals are received. Each of the driving modules includes a capacitor and a resistor that are connected in parallel and between the output terminal and the respective one of input terminals, a power source that is connected between the output terminal and the low-potential terminal, and a diode that is connected between the output terminal and the power source. The unidirectional module is connected between the output terminal and one of the driving modules, and allows an electrical signal to pass only from the one of the driving modules to the output terminal.

Abstract: A universal switching platform is configured to test a device under test, and includes a first power source, a first switch, a second switch and a second power source. The first switch, the second switch and the second power source are coupled in series between positive and negative terminals of the first power source. The common node of the first and second switches and the negative terminal of the first power source are configured to be respectively coupled to first and second terminals of the device under test. The universal switching platform provides a voltage and a current to test the device under test when the first and second switches are controlled to transition between conduction and non-conduction.