Abstract: A universal switching platform is configured to test a device under test, and includes a first power source, a first switch, a second switch and a second power source. The first switch, the second switch and the second power source are coupled in series between positive and negative terminals of the first power source. The common node of the first and second switches and the negative terminal of the first power source are configured to be respectively coupled to first and second terminals of the device under test. The universal switching platform provides a voltage and a current to test the device under test when the first and second switches are controlled to transition between conduction and non-conduction.

Abstract: A level adjusting circuit includes a parallel resistor-capacitor (RC) sub-circuit, a first diode and an adjustable voltage supply. The RC sub-circuit includes an input capacitor and an input resistor, and includes an input node electrically connected to a driving signal source for receiving a driving signal therefrom, and an output node that outputs an adjusted driving signal. The first diode and the adjustable voltage supply are electrically connected, and are further electrically connected to the output node and a reference voltage node, respectively.

Abstract: A gate-driving circuit includes a unidirectional module and two driving modules, and has a low-potential terminal, an output terminal, and two input terminals via which two driving signals are received. Each of the driving modules includes a capacitor and a resistor that are connected in parallel and between the output terminal and the respective one of input terminals, a power source that is connected between the output terminal and the low-potential terminal, and a diode that is connected between the output terminal and the power source. The unidirectional module is connected between the output terminal and one of the driving modules, and allows an electrical signal to pass only from the one of the driving modules to the output terminal.

Abstract: A universal switching platform is configured to test a device under test, and includes a first power source, a first switch, a second switch and a second power source. The first switch, the second switch and the second power source are coupled in series between positive and negative terminals of the first power source. The common node of the first and second switches and the negative terminal of the first power source are configured to be respectively coupled to first and second terminals of the device under test. The universal switching platform provides a voltage and a current to test the device under test when the first and second switches are controlled to transition between conduction and non-conduction.