Abstract: The invention relates to an apparatus for analyzing a material comprising an excitation emission device for generating at least one electromagnetic excitation beam, in particular an exciting light beam, having at least one excitation wavelength, further comprising a detection device for detecting a reaction signal, and a device for analyzing the material on the basis of the detected reaction signal.
Type:
Grant
Filed:
June 28, 2018
Date of Patent:
April 16, 2019
Assignee:
DiaMonTech GmbH
Inventors:
Alexander Bauer, Otto Hertzberg, Thorsten Lubinski