Abstract: A source for reducing drift of a hot spot by producing infrared (IR) light with an insulating housing; an electrical power supply; first and second resistance elements having first and second resistivities; a third resistance element having a third resistivity; the third resistance element disposed between the first and second resistance elements, with the resistivity of the third resistance element having a value greater than the resistivity of both the first and second resistance elements. Alternatively, the first and second resistance elements can have cross-sectional areas that are greater than that of the third resistance. A method of reducing drift of a hot spot in a radiating element of a source of IR illumination by applying constant polarity substantially constant direct current from the power supply and reversing polarity in less than 24 hours, by a square wave AC source, or a Class E amplifier at constant power.
Abstract: An adapter is interposed between the objective and the microscope. The adapter has a support structure to which are mounted an objective-engaging structure, a microscope-engaging structure, and a reflecting element. The objective-engaging structure and the microscope-engaging structure, when mounted to the support structure, are characterized by respective axes that are non-collinear, and the reflecting element is positioned and oriented so that light incident along the objective-engaging structure's axis is reflected to travel along the microscope-engaging structure's axis. The relative angle between the axes is preferably 90 degrees. A user mounts the adapter to the microscope and the objective to the adapter, at which point, the microscope is capable of viewing a sample at an angle displaced from the vertical. In the specific example of a 90-degree angle, a sample of any size can be viewed merely by bringing the sample beside the microscope and in front of the objective.