Patents Assigned to DireenTech, Inc.
  • Publication number: 20130187814
    Abstract: A scanning measurement apparatus and method comprising a device under test for receiving or transmitting a signal, a measurement probe, a robot for moving the device or the probe relative to one another to scan continuously over a two-dimensional planar, cylindrical or spherical surface in a three-dimensional space, and a controller for obtaining measurement samples at generalized grid points on the two-dimensional surface computing characteristic coefficients from the measured values, wherein the characteristic coefficients are recovered using a conjugate gradient method, using in part an unequally spaced fast Fourier transform or using a conjugate gradient method and an unequally spaced fast Fourier transform.
    Type: Application
    Filed: January 4, 2013
    Publication date: July 25, 2013
    Applicant: DireenTech, Inc.
    Inventor: DireenTech, Inc.