Abstract: A transition device is provided for coupling contact points on a printed circuit board to points in a standard test fixture matrix wherein the pattern of the two sets of points probably do not match. A product pattern plate has holes in the pattern of a printed circuit board to be tested and a grid plate has the pattern of the standard test fixture matrix. Pins are passed through the holes in the product pattern plate and find a hole in the grid plate in accord with the relative size of the pins and the holes in the product pattern plate.