Patents Assigned to Dot Laboratories, Inc.
  • Method of detecting and treating endometriosis in a female subject
    Patent number: 11315660
    Abstract: Described herein are improved methods for the detection of endometriosis. Generally, the methods include, but are not limited to, applying machine learning algorithm to miRNA levels in order to detect, predict, diagnose, or monitor the presence or absence of endometriosis.
    Type: Grant
    Filed: April 28, 2020
    Date of Patent: April 26, 2022
    Assignees: Dot Laboratories, Inc., Yale University
    Inventors: Hugh Taylor, Heather Bowerman