Patents Assigned to Dr. Johannes Heidenhain GmbH
  • Patent number: 10953607
    Abstract: An arrangement includes a carrier and a scale disposed on the carrier in a spaced-apart relation therewith. The scale has a measuring graduation and is attached to the carrier via areally distributed and spaced-apart adhesive dots. The adhesive dots, which can be circular in shape, each include at least three spacers, which can be spheres, enclosed within an adhesive.
    Type: Grant
    Filed: October 24, 2018
    Date of Patent: March 23, 2021
    Assignee: DR. JOHANNES HEIDENHAIN GMBH
    Inventors: Dirk Ettelt, Reiner Lang, Wolfgang Pucher, Thomas Sigl
  • Patent number: 10935397
    Abstract: A position-measuring device includes a graduation carrier having a measuring graduation disposed thereon. At least one position sensor is configured to generate position-dependent measurement signals by scanning the measuring graduation. A processor is configured to process the position-dependent measurement signals into position signals. An interface is configured to transmit the position signals to subsequent electronics via at least one data channel. At least one motion sensor is configured to generate time-varying measurement signals. A signal analyzer is configured to analyze the measurement signals in the frequency domain dependent on parameters that are transmittable from the subsequent electronics to the interface unit, and to produce result data that is transmittable from the interface unit to the subsequent electronics.
    Type: Grant
    Filed: September 5, 2018
    Date of Patent: March 2, 2021
    Assignee: DR. JOHANNES HEIDENHAIN GMBH
    Inventors: Ingo Joachimsthaler, Sebastian Lenz, Thomas Geisler, Johannes Soier
  • Patent number: 10914615
    Abstract: A scanning reticle for an optical position measuring device includes a substrate having an upper surface, operating in transmission, and having different functional regions. The upper surface includes at least one region having a grating made up of gaps and ribs, the ribs being formed in the substrate. The upper surface includes an antireflection layer, which is discontinuous in the region of the gaps.
    Type: Grant
    Filed: July 30, 2018
    Date of Patent: February 9, 2021
    Assignee: DR. JOHANNES HEIDENHAIN GmbH
    Inventors: Stefan Funk, Andreas Hofmann, Peter Speckbacher
  • Publication number: 20210010807
    Abstract: In an optical position-measuring device for acquiring the rotational angle between two objects that are rotationally moveable relative to each other, a grating measuring standard rotating about an axis of rotation is arranged as a reflection grating. Position information both about an azimuthal rotary movement about the axis of rotation and about a radial displacement of the grating measuring standard is able to be obtained. At least one detection unit is used for scanning the rotating grating measuring standard in order to determine the azimuthal rotational angle as well as a radial displacement of the grating measuring standard. The neutral pivot points of the scanning of the grating measuring standard for the determination of the rotational angle and the displacement are situated in the same plane, with this plane being situated in parallel with the grating measuring standard.
    Type: Application
    Filed: July 10, 2020
    Publication date: January 14, 2021
    Applicant: DR. JOHANNES HEIDENHAIN GmbH
    Inventors: Wolfgang HOLZAPFEL, Daniel FRESE, Christoph LINGK
  • Publication number: 20210003393
    Abstract: An angle measuring device includes first and second component groups and a bearing. The first component group includes a scale element having a first graduation. The second component group has a first modular unit, including a position sensor, and a second modular unit, including first, second, and third position transducers, and a compensation coupling. The first and second modular units are connected in a torsionally stiff but axially and radially flexible manner. The angle measuring device is operable in first and second modes. In the first mode, the first graduation is scannable by the position sensor to determine a first angular position. In the second mode, the first graduation or a further graduation situated on the scale element is scannable by the position transducers to determine further angular positions. A corrected relative angular position is determinable based on the first angular position and the further angular positions.
    Type: Application
    Filed: July 2, 2020
    Publication date: January 7, 2021
    Applicant: DR. JOHANNES HEIDENHAIN GmbH
    Inventors: Johann MITTERREITER, Sebastian GRUBER, Alois BARTLECHNER
  • Patent number: 10871763
    Abstract: A display unit for a manually operated machine tool includes a display having windows and text each associated with and indicating positions of different axes of the manually operated machine tool which are manually adjustable. A memory stores configuration modes of the display including a stationary mode in which the windows and text provided in the display are each the same size and color, and at least one emphasis mode in which the window and/or text associated with one of the different axes is larger and/or a different color. A processor is configured to switch the display from using the stationary mode to using an emphasis mode based a position signal indicating that one of the different axes is being adjusted by manual operation of an operator such that the window and text associated with the axis being adjusted is emphasized on the display.
    Type: Grant
    Filed: October 27, 2017
    Date of Patent: December 22, 2020
    Assignee: DR. JOHANNES HEIDENHAIN GMBH
    Inventors: Joachim Norz, Judy Swanson, John Parker
  • Publication number: 20200366185
    Abstract: In a high-frequency line filter for a converter, the converter has three phase connections for receiving a three-phase alternating signal from a three-phase voltage network and is adapted to convert the received three-phase alternating signal into an output signal for a load. The high-frequency line filter includes: a first filter path for establishing a conductive connection between a first phase connection of the three phase connections and a ground connection; a second filter path for establishing a conductive connection between a second phase connection of the three phase connections and the ground connection; and a third filter path for establishing a conductive connection between a third phase connection of the three phase connections and the ground connection. The high-frequency line filter includes a series connection of a pulse-proof capacitor and a parallel connection of at least two Y capacitors, the series connection being provided in each filter path.
    Type: Application
    Filed: May 14, 2020
    Publication date: November 19, 2020
    Applicant: DR. JOHANNES HEIDENHAIN GmbH
    Inventors: Simon HEINRICH, Franz GRAMSAMER
  • Publication number: 20200348123
    Abstract: A measuring device includes a movable probe head and an optical position sensing device for determining the spatial position and orientation of the probe head relative to a reference point. The position sensing device includes at least three position determination modules, arranged as a transmission unit or as a receiving unit, at least one position determination module being situated on the probe head, and at least one position determination module being situated at the reference point. A transmission unit has transmission unit marking element(s). A receiving unit includes optoelectronic detector(s) and receiving unit marking element(s), positioned in a defined spatial relationship relative to the optoelectronic detector. Visual contacts exist between at least some of the position determination modules. The position determination module on the probe head and the position determination module at the reference point are connected by at least one uninterrupted chain of visual contacts.
    Type: Application
    Filed: May 4, 2020
    Publication date: November 5, 2020
    Applicant: DR. JOHANNES HEIDENHAIN GmbH
    Inventors: Wolfgang HOLZAPFEL, Markus MEISSNER, Michael STEPPUTAT, Robert KRAUS, Manuel SCHERER
  • Patent number: 10823550
    Abstract: In an optical position measuring device for the interferential determination of the relative distance of two objects which are movable relative to each other in at least one measuring direction, a bundle of rays emitted by a light source is split up into at least two partial bundles of rays, which fall on a grating or a plurality of gratings on separate optical paths and undergo distance-dependent phase shifts as a result. The partial bundles of rays are superpositioned at a mixing grating, whereupon at least three pairs of interfering partial bundles of rays propagate in different directions in space. Via the mixing grating, each pair of interfering partial bundles of rays is focused on a detector element so that at least three position-dependent, phase-shifted incremental signals are detectable via the detector elements.
    Type: Grant
    Filed: July 25, 2019
    Date of Patent: November 3, 2020
    Assignee: DR. JOHANNES HEIDENHAIN GMBH
    Inventors: Karsten Sändig, Walter Huber
  • Patent number: 10788807
    Abstract: A method for compensating for the deflection of a milling cutter during the machining of a workpiece by a numerically controlled machine tool having a plurality of axes includes: executing a learning cut on a test workpiece having a known geometry by the milling cutter mounted on a tool spindle in a climb milling mode, and in doing so, ascertaining a correlation between a quantity that is proportional to the torque of the drive of the tool spindle and the deflection of the milling cutter normal to a surface of the test workpiece, the deflection being determined by comparing the actual contour of the test workpiece to a setpoint contour. This is followed by storing of the correlation for the milling cutter and machining of the workpiece by the milling cutter in a climb milling mode, while utilizing the stored correlation for compensating for the deflection of the milling cutter by applying a positional correction that is proportional to the quantity to a setpoint position of the axes of the machine tool.
    Type: Grant
    Filed: April 23, 2018
    Date of Patent: September 29, 2020
    Assignee: DR. JOHANNES HEIDENHAIN GMBH
    Inventor: Tim Boye
  • Patent number: 10775202
    Abstract: An optical position-measuring device for determining the relative position of two objects includes two scanning units which are connected to one of the objects and each include a light source, one or more gratings and a detector assembly. A scale is connected to the other object and has two tracks each containing incremental graduations extending along a first one of the measurement directions. The incremental graduations each are composed of graduation regions which have different optical properties and are periodically arranged along an incremental graduation direction. The two incremental graduation directions form an angle of between 0° and 90° relative to each other. Each of the two incremental graduations has a reference mark integrated therein such that scanning of the reference mark allows a reference signal to be generated at a defined reference position along each of the measurement directions. The reference marks include both aperiodic and periodic portions.
    Type: Grant
    Filed: February 15, 2019
    Date of Patent: September 15, 2020
    Assignee: DR. JOHANNES HEIDENHAIN GMBH
    Inventor: Michael Hermann
  • Patent number: 10746532
    Abstract: An interferometric distance measurement device includes a multiple wavelength light source, supplying a light beam having at least three different wavelengths. An interferometer unit is provided, which splits the light beam into a measuring light beam and a reference light beam. The measuring and reference light beams reflected back by measuring and reference reflectors are superimposed in an interfering manner to form an interference light beam. The interference light beam is split via a detection unit such that, in each instance, a plurality of phase-shifted, partial interference signals result per wavelength. With the aid of a signal processing unit, an absolute position information item regarding the measuring reflector is determined from the partial interference signals of different wavelengths.
    Type: Grant
    Filed: July 27, 2018
    Date of Patent: August 18, 2020
    Assignee: DR. JOHANNES HEIDENHAIN GMBH
    Inventors: Markus Meissner, Wolfgang Holzapfel
  • Patent number: 10749412
    Abstract: A position-measuring device includes a graduation carrier which carries a measuring graduation and is non-rotatably connectable to a shaft. A scanner is configured to generate scanning signals by scanning the measuring graduation. Evaluation electronics are configured to process the scanning signals into a digital angle value of the shaft. An interface is configured to communicate with subsequent electronics. The scanner is mountable on a machine part that is supported so as to be movable in an axial direction of the shaft, so that the scanning signals are dependent on a position of the machine part in the axial direction of the shaft, and so that a measure of the position of the machine part in the axial direction of the shaft is determinable from the scanning signals by the evaluation electronics.
    Type: Grant
    Filed: November 28, 2017
    Date of Patent: August 18, 2020
    Assignee: DR. JOHANNES HEIDENHAIN GMBH
    Inventor: Erich Strasser
  • Patent number: 10708080
    Abstract: A bus system has a daisy-chain configuration. The bus system includes a master unit and a plurality of slave units that are serially connected to the master unit downstream thereof via a line system. A first one of the slave units first connected downstream of the master unit is configured to invert a request signal, which is provided by the master unit and received via a first line section of the line system, and to output the inverted request signal on a second line section of the line system leading to an adjacent, second one of the slave units.
    Type: Grant
    Filed: September 26, 2018
    Date of Patent: July 7, 2020
    Assignee: DR. JOHANNES HEIDENHAIN GMBH
    Inventors: Manfred Huber, Thomas Fleischmann
  • Patent number: 10684144
    Abstract: A position measuring device includes: a graduation carrier on which a measuring graduation is provided; a scanning unit for generating position-dependent scanning signals by scanning the measuring graduation; and a signal processing unit for processing the scanning signals into position signals. A monitoring unit is provided, to which at least one signal to be monitored is supplied, and by which a modification signal is able to be output to a modification unit based on the monitoring of the signal to be monitored. At least one position signal is supplied to the modification unit, and the position signal is able to be modified by the modification unit for the transmission of at least one status report and able to be output as output signal to subsequent electronics. The modification is implemented based on the modification signal by adding a disturbance variable to the at least one position signal.
    Type: Grant
    Filed: November 9, 2017
    Date of Patent: June 16, 2020
    Assignee: DR. JOHANNES HEIDENHAIN GMBH
    Inventor: Martin von Berg
  • Patent number: 10645810
    Abstract: A sensor for measuring the position of a component that is displaceable relative to the sensor, includes a circuit board and a metal body. The circuit board includes a first region in which a detector is located, and a second region in which electronic components are located, which are electrically connected to the detector. The metal body includes a first layer having a first area as well as a second layer having a second area. The first region of the circuit board is fixed in place in the first area and the second region of the circuit board is fixed in place in the second area. The first layer and the second layer of the metal body are situated between the first region and the second region of the circuit board so that the first region is located in a first plane and the second region is located in a second plane.
    Type: Grant
    Filed: December 6, 2017
    Date of Patent: May 5, 2020
    Assignee: DR. JOHANNES HEIDENHAIN GmbH
    Inventors: Lutz Rissing, Marc Oliver Tiemann, Alexander Frank
  • Patent number: 10627262
    Abstract: A sensor unit for measuring the position of a component that is movable relative to the sensor unit includes a metal body, which has a first opening. An electronic component is arranged in the first opening such that a gap is provided between the electronic component and the metal body, the gap being filled with an electrically insulating molding compound. In addition, an electrically insulating first layer is applied on the electronic component and on the molding compound. The electronic component is electrically contacted with a circuit trace, and the circuit trace is routed through the first layer in a first section and extends on the first layer in a second section.
    Type: Grant
    Filed: May 1, 2018
    Date of Patent: April 21, 2020
    Assignee: DR. JOHANNES HEIDENHAIN GMBH
    Inventors: Lutz Rissing, Martin Sterkel
  • Patent number: 10612945
    Abstract: An angle measurement system includes a first component group, a second component group, and bearing elements arranged between the component groups. A gap extends at an axial extension between a first component and a second component so that the components are disposed along both sides of the gap relative to each other without coming into contact. An annular first body is mounted on the first component, which is disposed without contact in relation to the second component group. The second component includes a section, which is separated by a radial gap and is located radially outside and across from a region of the first body that extends in the axial direction, and the first body is situated radially outside and circumferentially about the axis in relation to the bearing elements. The first body is able to hold lubricant. Alternatively or additionally, a corresponding annular second body is fixed in place on the second component.
    Type: Grant
    Filed: March 28, 2018
    Date of Patent: April 7, 2020
    Assignee: DR. JOHANNES HEIDENHAIN GMBH
    Inventors: Johann Mitterreiter, Sonja Niemeyer, Jürgen Hertenberger, Georg Kaffl
  • Patent number: 10571310
    Abstract: In a position-measuring device for determining the position of a first object with respect to a second object that is displaceable relative to the first object, a measuring standard is connected to the first object and includes at least one periodic scale grating, which is arranged as a transmission grating and has a first periodicity. A scanning unit is connected to the second object and includes at least one light source, at least one periodic scanning grating, which has a second periodicity, and a detector system, which includes detector regions that are sensitive to radiation and are periodically disposed at a third periodicity in a detection plane. The bundles of rays emitted by the light source first impinge upon the scale grating and then pass through the scanning grating.
    Type: Grant
    Filed: December 4, 2017
    Date of Patent: February 25, 2020
    Assignee: DR. JOHANNES HEIDENHAIN GMBH
    Inventors: Wolfgang Holzapfel, Christoph Lingk, Johannes Trautner
  • Patent number: 10527405
    Abstract: An optical position-measuring device for sensing a position of two relatively movable objects includes a scale connected to one object and having a measuring graduation. A scanning unit is disposed on the other object and has optical elements. An arrangement and design of the optical elements of the scanning unit results in a scanning beam path in which split and subsequently interfered sub-beams propagate mirror-symmetrically with respect to a plane of symmetry and either impinge on and/or are reflected back from the scale in a V-shape. The plane of symmetry is tilted by a defined tilt angle relative to the scale about an axis of rotation that is oriented parallel to a surface of the scale and extends perpendicular to the graduation direction. The sub-beams that are interfered are deflected at the measuring graduation into symmetric diffraction orders. The sub-beams travel identical optical path lengths between splitting and recombination.
    Type: Grant
    Filed: October 9, 2018
    Date of Patent: January 7, 2020
    Assignee: DR. JOHANNES HEIDENHAIN GMBH
    Inventors: Wolfgang Holzapfel, Karsten Saendig