Patents Assigned to Dr. Johannes Heidenhain GmbH
  • Patent number: 10260908
    Abstract: A position measuring device includes: a first graduation carrier having a measuring graduation; a scanning unit, which is arranged so as to allow movement in a measuring direction relative to the measuring graduation in order to generate position-dependent scanning signals by scanning the measuring graduation; a signal processing unit for processing the scanning signals into positional signals; and a signal interface via which the positional signals are able to be output to subsequent electronics. At least one correction unit is provided in the signal processing unit by which at least one signal error of at least one scanning signal is able to be corrected. A monitoring unit is arranged to detect the reaching of a limit value of the signal error, and a correction unit triggering the event is able to be deactivated subsequently.
    Type: Grant
    Filed: August 2, 2017
    Date of Patent: April 16, 2019
    Assignee: DR. JOHANNES HEIDENHAIN GMBH
    Inventors: Elmar Mayer, Andre Wiegand
  • Patent number: 10260909
    Abstract: A position measuring device includes a measuring standard and a scanning unit, which are arranged in a manner that allows them to move relative to each other in a measuring direction. The measuring standard includes a graduation, which is scannable by the scanning unit in order to generate positional signals. The scanning unit includes an illumination unit and a detector unit for generating positional signals, the illumination unit being able to emit light in the direction of the graduation and the detector unit being able to detect light modulated by the graduation. The detector unit includes a circuit board and a sensor unit, which is arranged as a semiconductor chip. At least two photodetectors are provided on a front side of the sensor unit facing the graduation, and the electrical connections of the sensor unit are routed to contact surfaces on its rear side by metallic vias. The sensor unit is connected via the contact surfaces to corresponding contact surfaces on the circuit board.
    Type: Grant
    Filed: July 18, 2016
    Date of Patent: April 16, 2019
    Assignee: DR. JOHANNES HEIDENHAIN GMBH
    Inventor: Elmar Mayer
  • Patent number: 10234277
    Abstract: A length-measuring device includes a scanning carriage for scanning a measuring graduation that is to be guided longitudinally in the measurement direction on a guide surface. A coupling couples the scanning carriage to a drive dog rigidly in the measurement direction and resiliently transversely to the measurement direction. A first spring is disposed between a connecting element of the coupling and the drive dog and exerts a pressure force on the scanning carriage at a first position so as to press the scanning carriage against the guide surface. A second spring is disposed between the connecting element and the scanning carriage. The second spring is spaced apart from the first spring in the measurement direction and exerts a pressure force on the scanning carriage at a second position spaced apart from the first position in the measurement direction so as to press the scanning carriage against the guide surface.
    Type: Grant
    Filed: April 4, 2017
    Date of Patent: March 19, 2019
    Assignee: DR. JOHANNES HEIDENHAIN GMBH
    Inventor: Andreas Peterlechner
  • Patent number: 10222192
    Abstract: A method for machining a scale of a position-measuring system is provided for such a scale having, on a first surface, a measuring graduation and, on a second surface, is attachable to a carrier body. The first and second surfaces are bounded respectively by first and second edges in a region of a lateral peripheral side edge. The scale is machined to produce a defined outer contour of the scale such that a raised ridge of material is formed at each of the first and second edges. The scale is machined differently at the first edge than at the second edge in such a manner that a dimension of the raised ridge of material at the first edge perpendicular to the first surface is smaller than a dimension of the raised ridge of material at the second edge perpendicular to the second surface.
    Type: Grant
    Filed: January 25, 2017
    Date of Patent: March 5, 2019
    Assignee: DR. JOHANNES HEIDENHAIN GMBH
    Inventors: Moritz Schwabe, Peter Speckbacher, Josef Weidmann
  • Patent number: 10215792
    Abstract: A position-measuring device for determining the position of two objects movable relative to each other, which during operation, generates data in the form of measured position values, and which is to be connected to a processing unit via a data-transmission channel in order to transmit data, the position-measuring device being able to be connected to the processing unit via a first pair of lines, or alternatively, via a first pair of lines and at least one further pair of lines. The position-measuring device is assigned a detection unit with which the presence or non-presence of at least one further pair of lines is detectable, when the position-measuring device is connected to the processing unit via the data-transmission channel.
    Type: Grant
    Filed: February 4, 2013
    Date of Patent: February 26, 2019
    Assignee: DR. JOHANNES HEIDENHAIN GMBH
    Inventor: Erich Strasser
  • Patent number: 10209103
    Abstract: A linear encoder includes a scale disposed within a housing and a scanning unit that is displaceable in a measuring direction relative to the scale. The scanning unit includes a scanning head disposed inside of the housing opposite to the scale such that the scale is scannable by the scanning head, as well as a mount to which the scanning head is fastened, and a driving component, via which the mount is coupled to a mounting base disposed outside of the housing. A vibration damper suppresses vibrations transversely to the measuring direction. The vibration damper is disposed on the mount or on the scanning head, and includes a damping mass and an elastic element. The damping mass is fastened by the elastic element to an attachment surface of the mount or of the scanning head.
    Type: Grant
    Filed: January 3, 2017
    Date of Patent: February 19, 2019
    Assignee: DR. JOHANNES HEIDENHAIN GMBH
    Inventors: Daisuke Shimoda, Katsumi Motoyuki, Yoshio Watanabe
  • Patent number: 10209099
    Abstract: In a device and a method for monitoring a clock signal of a position measuring device, which is connected to sequential electronics via a data transmission channel, and the data transmission channel has a data line, via which data signals are transmittable from an interface unit of the position measuring device to an interface unit of the sequential electronics, the interface unit of the position measuring device including a pulse generation unit, by which a test pulse is able to be generated based on the time pattern of the clock signal, and is transmittable via the data line to the interface unit of the sequential electronics. The interface unit of the sequential electronics includes a pulse measuring unit, by which a pulse duration of the test pulse in the time pattern of a clock signal of the sequential electronics is measurable in a functionally reliable manner and by which a measured value representing the pulse duration is able to be output to a control unit for analysis.
    Type: Grant
    Filed: December 10, 2015
    Date of Patent: February 19, 2019
    Assignee: DR. JOHANNES HEIDENHAIN GMBH
    Inventor: Martin von Berg
  • Patent number: 10203230
    Abstract: A multiturn rotary encoder includes: a measuring standard having at least one graduation track, with whose aid the angular position of a shaft is absolutely encoded; a first scanner, with which the at least one graduation track is able to be scanned in order to generate first position signals; a first single-turn evaluation unit for forming a first single-turn code word from the first position signals; a first multiturn evaluation unit for forming a first multiturn code word from the first position signals; a second scanner, with which the at least one graduation track is able to be scanned in order to generate second position signals; a second single-turn evaluation unit for forming a second single-turn code word from the second position signals; a second multiturn evaluation unit for forming a second multiturn code word from the second position signals; and a battery, with which at least the components necessary for forming the multiturn code words are able to be supplied with energy upon loss of a main pow
    Type: Grant
    Filed: November 28, 2014
    Date of Patent: February 12, 2019
    Assignee: DR. JOHANNES HEIDENHAIN GMBH
    Inventor: Martin Von Berg
  • Patent number: 10197388
    Abstract: A position-measuring device includes a measuring standard, a scanning unit, and a rotary bearing by which the measuring standard or the scanning unit is rotationally mounted. The measuring standard and the scanning unit are rotatable in relation to each other. The scanning unit generates output signals, on the basis of which a rotary angle associated with the relative motion of the measuring standard and the scanning unit is able to be determined. A monitoring device monitors the rotary bearing for the occurrence of bearing faults and is adapted to detect and analyze at least one measured variable for a plurality of different relative positions of the measuring standard in relation to the scanning unit, in order to determine deviations from a setpoint behavior of the measured variables on the basis of the measured variable detected for a plurality of relative positions.
    Type: Grant
    Filed: May 8, 2013
    Date of Patent: February 5, 2019
    Assignee: DR. JOHANNES HEIDENHAIN GMBH
    Inventors: Elmar Mayer, Daniel Frese
  • Patent number: 10120359
    Abstract: In a device and a method for the automated detection of an interface between a position-measuring device and sequential electronics that are interconnected via a data-transmission channel, the position-measuring device includes an interface unit and a position-measuring unit. The interface unit is connected first of all to the data-transmission channel, and secondly to the position-measuring unit for the purpose of an internal data exchange. The interface to the sequential electronics is selectable in the interface unit from at least two interfaces.
    Type: Grant
    Filed: November 3, 2009
    Date of Patent: November 6, 2018
    Assignee: DR. JOHANNES HEIDENHAIN GMBH
    Inventors: Elmar Mayer, Alexander Kobler
  • Patent number: 10119802
    Abstract: An optical position-measuring device includes a scale and a scanning reticle, whose relative position is determinable in three linearly independent spatial directions using interfering light beams. A splitter grating is disposed on the scanning reticle and adapted to split light into sub-beams of different diffraction orders. An optical grating is disposed on the scale and adapted to further split the sub-beams and to recombine them after they have been reflected back from the scanning reticle. Grating fields configured as phase gratings are disposed on a side of the scanning reticle that faces the scale. The grating fields act as diffractive optics that influence the further split sub-beams. The grating fields have different step heights. An output grating is disposed on the scanning reticle and adapted to output, as interfering sub-beams, light that has been multiply reflected between the scale and the scanning reticle.
    Type: Grant
    Filed: January 20, 2017
    Date of Patent: November 6, 2018
    Assignee: DR. JOHANNES HEIDENHAIN GmbH
    Inventors: Peter Speckbacher, Tobias Gruendl, Christian Baeuml, Josef Weidmann
  • Patent number: 10094961
    Abstract: An optical layer system for a position-measuring device includes at least first, second and third functional surfaces disposed on a surface of a transparent substrate. Each of the functional surfaces have a different optical function. The functional surfaces are composed of a first layer stack and a second layer stack.
    Type: Grant
    Filed: September 29, 2016
    Date of Patent: October 9, 2018
    Assignee: DR. JOHANNES HEIDENHAIN GmbH
    Inventors: Peter Speckbacher, Stefan Funk, Christian Baeuml
  • Patent number: 10082410
    Abstract: An optical position-measuring device includes a scanning unit and a material measure that is movable relative thereto in a measuring direction. The scanning unit includes a splitting device and an optoelectronic detector arrangement. The splitting device is configured to separate sub-beams incident thereon as a function of wavelength. The splitting device is configured as an asymmetrical interferometer that includes two interferometer arms having different optical path lengths, within which the sub-beams propagate between splitting and recombination until the recombined sub-beams arrive at the detector arrangement. The optical position-measuring device is configured to generate a plurality of phase-shifted scanning signals indicative of a relative position of the scanning unit and of the material measure, wherein phase relations of the generated phase-shifted scanning signals are wavelength-dependent.
    Type: Grant
    Filed: September 30, 2015
    Date of Patent: September 25, 2018
    Assignee: DR. JOHANNES HEIDENHAIN GMBH
    Inventor: Karsten Saendig
  • Patent number: 10060765
    Abstract: An optical position-measuring device for determining the position of a first object relative to a second object movable relative to the first object along a measurement direction includes a scale with a measuring graduation connected to the first object and extending along the measurement direction. A scanner is connected to the second object and includes a fiber-optic array including optical fibers. The fiber-optic array is configured as a fiber-optic plate having an image-input face facing the scale and an image-output face facing the detector array. The fiber-optic array transmits a light pattern into a detection plane of the detector array. An interstitial medium is disposed between the image-output face of the fiber-optic plate and the detector array to ensure that an amount of deflection that the beams exiting the image-output face undergo on a path to the detector array is smaller than in a case without the interstitial medium.
    Type: Grant
    Filed: June 7, 2017
    Date of Patent: August 28, 2018
    Assignee: DR. JOHANNES HEIDENHAIN GmbH
    Inventors: Wolfgang Holzapfel, Christoph Lingk, Ulrich Benner, Johannes Trautner
  • Patent number: 10060772
    Abstract: A method corrects errors in position-measuring devices having material measures which are scanned by at least one scanning unit. Correction values are obtained in a calibration performed prior to a measurement operation. The correction values from the calibration are compressed for the measurement operation. The correction values are kept available for a defined number of correction points on the material measure and used during the measurement operation to correct acquired position values.
    Type: Grant
    Filed: September 14, 2015
    Date of Patent: August 28, 2018
    Assignee: DR. JOHANNES HEIDENHAIN GmbH
    Inventors: Joerg Drescher, Ulrich Bichlmeier
  • Patent number: 10048114
    Abstract: In a device for measuring the vibrational amplitude of a capillary tube of a wire bonder, the capillary tube is placed between a light source and a detector system, so that the vibrational amplitude is able to be ascertained from the shading of a beam of light by the capillary tube. The beam of light emitted by the light source is split into a measuring beam of light and a reference beam of light, an edge of the capillary tube at least partially shading the measuring beam of light in the vibrating state, while the reference beam of light is not shaded. The detector system includes a measuring detector assigned to the measuring beam of light as well as at least one reference detector assigned to the reference beam of light, and the vibrational amplitude of the capillary tube is ascertainable from the interconnected output signals of the measuring detector and the reference detector.
    Type: Grant
    Filed: December 10, 2014
    Date of Patent: August 14, 2018
    Assignee: DR. JOHANNES HEIDENHAIN GMBH
    Inventors: Walter Huber, Wolfgang Holzapfel
  • Patent number: 10018485
    Abstract: A scale for an optically scanning position-measuring device includes a carrier and a reflective layer disposed on the carrier. A transparent spacer layer is disposed on the reflective layer. The spacer layer has a patterned, partially transparent layer thereon which defines a bright/dark pattern in which regions having the partially transparent layer appear dark and regions without the partially transparent layer appear bright. A sealing layer is disposed on the patterned, partially transparent layer. Products of refractive index and layer thickness are the same for the spacer layer and the sealing layer, or differ by an odd multiple.
    Type: Grant
    Filed: January 26, 2017
    Date of Patent: July 10, 2018
    Assignee: DR. JOHANNES HEIDENHAIN GmbH
    Inventors: Stefan Funk, Peter Speckbacher
  • Patent number: 9958296
    Abstract: An inductive position-measuring device for absolute position determination includes a scale having a first measuring graduation extending in a measurement direction and a second measuring graduation disposed opposite to the first measuring graduation and extending parallel thereto. A scanner is disposed in a gap between the first measuring graduation and the second measuring graduation. The scanner is displaceable relative to the scale in the measurement direction for purposes of position measurement. The scanner includes a first coil arrangement for scanning the first measuring graduation and generating a first position-dependent scanning signal, and a second coil arrangement, disposed opposite to the first coil arrangement, for scanning the second measuring graduation and generating a second position-dependent scanning signal. At least one intermediate layer of soft magnetic material disposed between the first coil arrangement and the second coil arrangement.
    Type: Grant
    Filed: November 21, 2016
    Date of Patent: May 1, 2018
    Assignee: DR. JOHANNES HEIDENHAIN GmbH
    Inventors: Martin Heumann, Marc Oliver Tiemann, Alexander Frank
  • Patent number: 9942524
    Abstract: A device for detecting the position of an object in a machine tool includes a camera configured to provide an image of the object and an object carrier to which the object is connected and whose position within the machine tool is known. A first processing unit is configured to identify a position of the object relative to the camera based on geometric features of the object which are obtained from the image. A second processing unit is configured to identify a position of the object carrier relative to the camera based on geometric features of the object carrier which are obtained from the image. A third processing unit is configured to determine a position of the object relative to the object carrier from the identified positions of the object and the object carrier relative to the camera.
    Type: Grant
    Filed: November 10, 2011
    Date of Patent: April 10, 2018
    Assignee: DR. JOHANNES HEIDENHAIN GmbH
    Inventors: Walter Kranitzky, Martin Schilcher, Gerhard Muehlbauer
  • Patent number: 9927234
    Abstract: A position-measuring device includes a module configured to vary a signal period of a position-dependent sinusoidal analog scanning signal. A conversion unit is configured to receive the sinusoidal analog scanning signal and to generate therefrom a sinusoidal digital output signal having a varied signal period compared to the sinusoidal analog scanning signal. A digital-to-analog converter is configured to generate, from the sinusoidal digital output signal, a sinusoidal analog output signal having a varied signal period. The conversion unit is configured to change an operating mode in dependence upon a frequency of the sinusoidal analog scanning signal in such a way that in a case of higher frequencies of the sinusoidal analog scanning signal, the sinusoidal digital output signal is fed to the digital-to-analog converter at a higher output rate and with a smaller word width than in a case of lower frequencies of the sinusoidal analog scanning signal.
    Type: Grant
    Filed: July 25, 2016
    Date of Patent: March 27, 2018
    Assignee: DR. JOHANNES HEIDENHAIN GmbH
    Inventors: Costica Caba, Andreas Pommer, Paul Andrei Tutzu, Victor Vasiloiu