Patents Assigned to Dr. Johannes Heidenhain GmbH
  • Patent number: 7876451
    Abstract: A position-measuring device includes a light source, a first grating, a second grating and photodetectors, light from the light source, which is split into partial beams of different directions at the first and second grating, being directed via a deflecting element to the detector. The deflecting element for incident partial beams having different directions has different regions, so that all partial beams directed from the deflecting element to the detector are approximately parallel.
    Type: Grant
    Filed: May 13, 2008
    Date of Patent: January 25, 2011
    Assignee: Dr, Johannes Heidenhain GmbH
    Inventor: Michael Hermann
  • Patent number: 7873484
    Abstract: A method for reliable position monitoring includes: (a) transmitting two measured position values from a position measuring device to a first processing unit; (b) transmitting a setpoint value from a setpoint value generator to a second processing unit; (c) transmitting one of the two measured position values to the second processing unit; (d) transmitting the setpoint value to the first processing unit; (e) performing mutually independent comparisons between the setpoint value and the measured position values by the first processing unit and the second processing unit; and (f) monitoring the measured position values for an electronic shaft break between the position measuring device and the first processing unit. The position values are different and have a defined relationship with respect to each other, and the transmitting (a) includes alternately transmitting the two measured position values to the first processing unit.
    Type: Grant
    Filed: June 17, 2005
    Date of Patent: January 18, 2011
    Assignee: Dr. Johannes Heidenhain GmbH
    Inventor: Andreas Balleisen
  • Patent number: 7872762
    Abstract: An arrangement for generating phase-shifted incremental signals characterizing relative positions of two objects moving with respect to each other along a measuring direction. The measuring arrangement includes a light source emitting bundles of beams, a measurement grating, a plurality of optional gratings and a scanning unit. The scanning unit includes a grating in a scanning plane, wherein the grating includes a plurality of blocks arranged periodically along the measuring direction with a grating periodicity equaling a fringe pattern periodicity, and each block includes n grating sections arranged along the measuring direction, each of the n grating sections having a periodic grating structure, deflecting the bundles of beams propagated through each of the n grating sections in several different spatial directions.
    Type: Grant
    Filed: January 23, 2009
    Date of Patent: January 18, 2011
    Assignee: Dr. Johannes Heidenhain GmbH
    Inventors: Michael Hermann, Karsten Sändig
  • Patent number: 7866023
    Abstract: An arrangement for fastening a support of a scale of a linear measuring device on a mounting surface of an object to be measured. The arrangement includes a clamping jaw and a force-exerting element urging the clamping jaw against the support. The clamping jaw acts together with the support in such a way that the clamping jaw urges said support with a clamping force that includes 1) a first force component against the mounting surface by the force-exerting element and 2) a second force component that urges the support against an attachment face extending transversely to the mounting surface. The attachment face is directly constituted by an attachment body, which can be fixed positively and free of play in a receptacle on the object to be measured.
    Type: Grant
    Filed: September 6, 2006
    Date of Patent: January 11, 2011
    Assignee: Dr. Johannes Heidenhain GmbH
    Inventors: Johannes Haunreiter, Alfred Affa
  • Patent number: 7858922
    Abstract: A position-measuring device includes a scanning unit and a measuring graduation that is displaceable thereto in at least one measuring direction. The measuring graduation includes two incremental-graduation tracks extending in parallel in the measuring direction, between which a reference-marking track having at least one reference marking at a reference position extends. The scanning unit includes a first scanning device for generating the reference-pulse signal and a second scanning device for generating the incremental signals. To generate the incremental signals, a scanning beam acts at least once upon each incremental graduation in an incremental-signal scanning field.
    Type: Grant
    Filed: November 19, 2007
    Date of Patent: December 28, 2010
    Assignee: Dr. Johannes Heidenhain GmbH
    Inventors: Wolfgang Holzapfel, Michael Hermann, Karsten Saendig
  • Patent number: 7856734
    Abstract: A linear measuring arrangement for measuring a relative position of two objects, the linear measuring arrangement including guide surfaces, a scale having a measuring graduation and a scanning carriage for scanning the measuring graduation, wherein the scanning carriage is linearly guided in a measuring direction on the guide surfaces. The linear measuring arrangement further including a carrier device which can be fastened to one of the two objects and a coupling, by which the scanning carriage is coupled to the carrier device rigidly in the measuring direction and transversely thereto resiliently. The coupling includes a first coupling element, having a first coupling face, arranged on the scanning carriage and a second coupling element, having a second coupling face, arranged on the carrier device, wherein the second coupling face contacts the first coupling face and wherein at least one of the first and second coupling elements is made of a ceramic material at least in an area of a contact.
    Type: Grant
    Filed: September 4, 2008
    Date of Patent: December 28, 2010
    Assignee: Dr. Johannes Heidenhain GmbH
    Inventor: Alfred Affa
  • Patent number: 7847704
    Abstract: A method for transmitting signals from a position measuring arrangement to an evaluation unit, the method including transmitting position signals, reference pulses, and warning signals indicating a malfunction state from a position measuring arrangement for determining the position of two elements of a machine which are movable relative to each other, to an evaluation unit. The method further includes logically interconnecting the reference pulses with the position signals in such a way that, in a malfunction-free state, a valid status combination for outputting the reference pulses and an invalid status combination for outputting the reference pulses appear in each period. The method including transmitting warning signals indicating a malfunction state during the invalid status combination of the position signals and the reference pulses which, in the malfunction-free state, is invalid for outputting the reference pulses.
    Type: Grant
    Filed: July 9, 2008
    Date of Patent: December 7, 2010
    Assignee: Dr. Johannes Heidenhain GmbH
    Inventors: Johannes Wagner, Elmar Mayer
  • Patent number: 7835014
    Abstract: A method for absolute position measuring that includes scanning a code having code elements arranged one behind the other in a measuring direction, wherein the code elements include sequential first and second code elements which define a code word containing absolute position information. The method including generating scanning signals within the first code elements and the second code elements. The method further including forming information regarding the sequential first and second code elements from the scanning signals via a reference value and determining the reference value as a function of at least one of the scanning signals within the first code elements and the scanning signals within the second code elements.
    Type: Grant
    Filed: September 18, 2008
    Date of Patent: November 16, 2010
    Assignee: Dr. Johannes Heidenhain GmbH
    Inventors: Elmar Mayer, Johann Oberhauser
  • Patent number: 7805541
    Abstract: A modular, numerical control having low-jitter synchronization includes a main computer and at least one controller unit which, starting from the main computer, are interconnected by serial data-transmission channels in the form of a series circuit. The at least one controller unit includes a first receiver unit for receiving a serial data stream arriving from the direction of the main computer, and a first transmitter unit for outputting a serial data stream. Also provided in the at least one controller unit is a clock recovery unit which derives a synchronous clock signal from the serial data stream arriving at the first receiver unit, and supplies it to the first transmitter unit which uses it as a transmission clock signal, so that the serial data stream arriving at the first receiver unit and the serial data stream output by the first transmitter unit are coupled to each other in phase-locked manner.
    Type: Grant
    Filed: October 25, 2005
    Date of Patent: September 28, 2010
    Assignee: Dr. Johannes Heidenhain GmbH
    Inventor: Georg Zehentner
  • Patent number: 7796272
    Abstract: A position-measuring device is used for measuring the position of an object relative to a tool, the tool having a tool center point. The position-measuring device includes at least two intersected scales displaceable relative to each other in at least one plane of movement, and an assigned optical scanning unit which generates position signals for at least one measuring direction parallel to the plane of movement. Each scale has a neutral pivot, about which a tilt of the respective scale causes no change of the detected position. The scanning optics ensure that the position of the neutral pivots of the two scales correspond. The positioning of the scales relative to the tool center point ensures that the neutral pivots of the two scales and the tool center point lie in a plane which is parallel to the plane of movement.
    Type: Grant
    Filed: April 28, 2008
    Date of Patent: September 14, 2010
    Assignee: Dr. Johannes Heidenhain GmbH
    Inventor: Wolfgang Holzapfel
  • Patent number: 7788821
    Abstract: A linear measuring arrangement for measuring a relative position of two objects. The linear measuring arrangement includes a unit having a housing and a scale in the housing and a scanning unit, which can be shifted relative to the unit in a measuring direction, wherein the scanning unit is arranged inside the housing and includes a heat-generating electrical component. The arrangement further includes a mounting piece, which is fastened to the scanning unit by a coupling, which is rigid in the measuring direction and resilient transversely thereto, and which extends to a mounting area arranged outside of the housing. The arrangement further includes a heat-conducting element, which is designed for transferring heat generated by the heat generating electrical component to the mounting piece and permits relative movements between the mounting piece and the scanning unit at least transversely to the measuring direction.
    Type: Grant
    Filed: June 27, 2008
    Date of Patent: September 7, 2010
    Assignee: Dr. Johannes Heidenhain GmbH
    Inventors: Alfred Affa, Johannes Haunreiter
  • Patent number: 7787970
    Abstract: A position-measuring device having integrated function testing includes a position-recording unit, a processing unit, and a control-word generator. In a positional-data request, a positional-data word is first generated in the position-recording unit and output to the processing unit. There, the position data word is processed into a position value. Subsequently, a control-data word is generated in the position-recording unit according to the specification of the control-word generator and output to the processing unit. The processing unit processes the control-data word into a control value which has a defined mathematical relationship to the position value.
    Type: Grant
    Filed: July 11, 2005
    Date of Patent: August 31, 2010
    Assignee: Dr. Johannes Heidenhain GmbH
    Inventors: Erich Strasser, Elmar Mayer
  • Patent number: 7770304
    Abstract: A position-measuring device includes a code and a scanning unit. The code includes a sequence of code elements arranged one after the other in a measuring direction, at least two successive code elements in each case forming one code word having position information. The scanning unit includes a lighting unit for emitting directed light in the direction of the code for imaging at least the code elements forming code word onto a detector unit, the detector unit having in measuring direction at least two detector elements per code element forming code word, as well as an evaluation unit in which the code word having the instantaneous position information is ascertainable from the detector signals of the detector elements. The scanning unit and the code are arranged in a manner allowing movement relative to each other in measuring direction.
    Type: Grant
    Filed: December 9, 2008
    Date of Patent: August 10, 2010
    Assignee: Dr. Johannes Heidenhain GmbH
    Inventors: Johann Oberhauser, Thomas Schuermann
  • Patent number: 7760471
    Abstract: A positioning device includes a housing and a shaft that is able to be swiveled about a centrical position relative to the housing, at whose one end an element that is to be positioned is attachable. Furthermore, the positioning device has a swivel drive and a position measuring device. A cable, for the electrical connection of swivelable parts in the positioning device to a stationary unit, has a spiral-shaped course leading radially outwardly, starting from the shaft that is located in the centrical position.
    Type: Grant
    Filed: October 13, 2006
    Date of Patent: July 20, 2010
    Assignee: Dr. Johannes Heidenhain GmbH
    Inventors: Volker Hoefer, Gerhard Scheglmann
  • Patent number: 7752761
    Abstract: An angle measuring arrangement for determining a relative angular position of two components, which are rotatably arranged around an axis of rotation. The angle measuring arrangement including a cap, a connecting cable, including a fixation area having a longitudinal axis and a receptacle device arranged on the cap for receiving the fixation area of the connecting cable. The receptacle device includes an undercut for maintaining the fixation area in a direction with a directional component extending orthogonally with respect to the longitudinal axis. In a position in which the fixation area is fixed in place on the receptacle device, the longitudinal axis of the fixation area lies along a first axis. The longitudinal axis of the fixation area can be introduced into the undercut of the receptacle device by movement along a second axis that is oriented inclined in relation to the first axis.
    Type: Grant
    Filed: January 29, 2009
    Date of Patent: July 13, 2010
    Assignee: Dr. Johannes Heidenhain GmbH
    Inventor: Sebastian Riepertinger
  • Patent number: 7748251
    Abstract: In a circuit configuration for ascertaining tilt errors in connection with a position-measuring device, the position-measuring device includes at least one incremental track on a measuring graduation that is able to be read by a scanner, which is movable relative to the measuring graduation in a measuring direction, and the scanner is guided along the measuring graduation and the scanner is rotated with respect to the measuring graduation by an angle of misalignment that is changeable during the relative movement. Perpendicular to the measuring direction, the scanner has a first scanning region and a second scanning region, whereby upon reading the at least one incremental track, at least one first position signal is able to be generated by the first scanning region and at least one second position signal is able to be generated by the second scanning region.
    Type: Grant
    Filed: June 22, 2007
    Date of Patent: July 6, 2010
    Assignee: Dr. Johannes Heidenhain GmbH
    Inventor: Robert Bernhard
  • Patent number: 7719075
    Abstract: A scanning head for an optical position-measuring system includes a receiver grating, formed of photosensitive areas, for the scanning of locally intensity-modulated light of differing wavelengths. The receiver grating is formed from a semiconductor layer stack of a doped p-layer, an intrinsic i-layer and a doped n-layer. The individual photosensitive areas have a first doped layer and at least a part of the intrinsic layer in common and are electrically separated from one another by interruptions in the second doped layer.
    Type: Grant
    Filed: July 29, 2004
    Date of Patent: May 18, 2010
    Assignee: Dr. Johannes Heidenhain GmbH
    Inventors: Peter Speckbacher, Josef Weidmann, Christopher Eisele, Elmar Mayer, Reiner Burgschat
  • Patent number: 7716847
    Abstract: A probe system includes a probe head and a transceiver element. Due to contact of a stylus, a sensor signal is able to be generated by a sensor element. The probe head and the transceiver element are configured such that a wireless data transfer is able to be produced between them, so that readiness information is transmittable from the probe head to the transceiver element. The readiness information is transmittable by two bit strings including high bits and low bits, the bit strings being transmittable following defined time intervals, and the second bit string having fewer high bits than the first bit string.
    Type: Grant
    Filed: October 29, 2008
    Date of Patent: May 18, 2010
    Assignee: Dr. Johannes Heidenhain GmbH
    Inventors: Christian Eisenberger, Klaus Groell
  • Patent number: 7714273
    Abstract: A position-measuring device for generating a reference-pulse signal at at least one reference position includes a scanning unit and also a reflection-measuring graduation displaceable relative thereto in at least one measuring direction. The scanning unit for generating the reference-pulse signal includes a plurality of optical elements, including at least one imaging optics as well as at least two diaphragm structures, which are disposed in a diaphragm plane and have a plurality of diaphragm openings in each case. Furthermore, a light source as well as at least two detector elements are assigned to the scanning unit. The reflection-measuring graduation has a reference marking at the at least one reference position. It includes at least one set of first structure elements, which is arranged in the plane of the reflection-measuring graduation, perpendicular to the measuring direction, periodically at a first transversal periodicity.
    Type: Grant
    Filed: November 19, 2007
    Date of Patent: May 11, 2010
    Assignee: Dr. Johannes Heidenhain GmbH
    Inventor: Karsten Saendig
  • Patent number: 7707739
    Abstract: A scale is attached to a carrier by optically contacting. The optically contacting bonds are formed by raised surface regions of the scale set apart from each other. Additional measures, such as the provision of adhesive surfaces, provide a rigid and vibration-resistant joint.
    Type: Grant
    Filed: November 6, 2006
    Date of Patent: May 4, 2010
    Assignee: Dr. Johannes Heidenhain GmbH
    Inventors: Wolfgang Holzapfel, Joerg Drescher, Peter Speckbacher, Josef Weidmann, Wolfgang Pucher, Kilian Bauer