Abstract: A graduation carrier of plastics material with a graduation structure, particularly for a photoelectric position measuring device. The graduation structure is a specially prefabricated lamina which is integrated with the graduation carrier with positive engagement. The free surface of the graduation structure and the free surface of the graduation carrier are located in a plane.

Abstract: In an integrated optical arrangement, such as a photoelectric position measuring arrangement, a diffraction grid is scanned by light beam diffraction by a scanning unit having a laser. A light beam bundle emanating from the laser is split by the diffraction grid into two diffraction beam bundles, which are inserted into the top input waveguides of a waveguide coupler by two coupling elements. The two diffraction beam bundles interfere in the waveguide coupler and impinge on three detectors located at three output waveguides of the waveguide coupler for obtaining measured values. For readjustment of the optimal emission wavelength of the laser, an additional diffraction beam bundle emanating from the diffraction grid is entered into said integrated optical sensor arrangement by an additional coupling element. The additional beam bundle triggers a detector for generating a control signal to control the optimal emission wavelength of the laser.

Abstract: The angular graduation of a graduated disk is scanned in a measuring device by a scanning unit by the movement of light beams in two angular graduation areas located diametrically opposite each other. To compensate for wobble errors caused by the wobbling of the graduated disk, the light beam emanating from a light source impinges on the graduated disk at a point outside of the angular graduation and, following reflection and deflection by a triple prism, impinges parallel to itself in the form of a light beam on an impact point in a first the graduation area. The light beam is split into two diffraction beams by the graduation, and meet, after having passed through a deflection prism, at a meeting point in a second angular graduation area. Since the impact point and the meeting point are always located on the same radius, the wobbling of the disk does not have a disadvantageous effect on the accuracy of measurement.

Abstract: An apparatus is provided for inductive transfer of the scanning signal from a sensing head to a machine body. The apparatus includes cooperating inductive coupling elements between a receiving lug of the sensing head and the spindle of the machine. Cooperating coupling elements for inductive coupling are also provided between the spindle and the machine body. The coupling element of the receiving lug includes a coil with a ferromagnetic core. The spindle includes a second cooperating coil lying opposite to the receiving-lug coil which also includes a ferromagnetic core. The scanning signal is conducted from the detector to the coil in the receiving lug and is transferred inductively to the spindle. The scanning signal then passes over a transfer coil to a receiving coil. The transfer coil and receiving coil are configured such that the signal is transferred independently of rotation of the spindle relative to the machine body.

Abstract: An evaluating circuit for evaluating square wave signals is provided. A plurality of square wave signals are transmitted to a memory which has a number of bistable toggle stages which correspond to the number of square wave signals. The toggle stages are driven by an auxiliary clock signal. An up-down counter is also driven by the auxiliary clock. The circuit further includes a comparator which compares the square wave signals and the state of the up-down counter and generates a control signal over at least one control line to the up-down counter in response to the comparison. The state of the up-down counter is changed in an up or down direction or not changed in response to the control signal.

Abstract: A method and apparatus for simulating the processing of a workpiece by boring or milling by an internal computer model in which the workpiece is described by its corner points and surfaces and a bore or a milling process is described by its enveloping contour. The apparatus includes data memories in which information data about the corner points, the surfaces and the enveloping contour are stored. A control mechanism is connected to the data memories for allocating the information to geometric elements that are deposited in work memories and between which a computing mechanism determines intersection points and stores them in an intersection point memory. The control mechanism links the information data about the previous state of the model, the enveloping contour of the milling operation and the intersection points into a description of the workpiece after processing in the internal computer model and brings it into representation on a display unit.

Abstract: There is provided a measurement embodiment with a resulting thermal expansion which, despite different materials having different thermal expansion coefficients, agrees with the thermal expansion of the machine part so that temperature conditioned measurement inaccuracies are eliminated.

Abstract: A position measuring apparatus for measuring the position of a first object relatively movable with respect to a second object. The position measuring apparatus includes a first deflection element, a light source positioned to scan the first deflection element with a light beam, a second deflection element, and a reflection element. The second deflection element and the reflection element are adapted with respect to each other and with respect to the first deflection element so that partial beam bundles deflected from the first deflection element are deflected by the second deflection element and emerge converging from the second deflection element into the reflection element, are reflected by the reflection element, and emerge diverging from the reflection element, impinge again on a deflection element, are deflected again and are brought into interference.

Abstract: In a position measuring apparatus there is provided a subdivision circuit for the subdividing of sinusoidal scanning signals. The subdivision circuit includes rectifier circuits in which the scanning signals are reformed in such a way that over a total signal period one rectified signal always has a greater signal value than the other rectified signal. The rectified signal with the greater signal value lies on one reference input and the other rectified signal lies on the other reference input of an analog-to-digital converter. The analog-to-digital converter forms from these rectified signals a binary word which is fed to a correction arrangement. Together with code signals which define four equal sections of a single period, the correction arrangement generates a data word which represents intermediate values of a signal period of the scanning signals.

Abstract: A position measuring arrangement is provided which presents a graduation carrier with graduation and reference mark fields to a scanning plate. A prism is allocated to one of the measuring graduation fields and reference mark fields. The prism provides an optical separation of the measuring graduation and reference mark fields transversely to the measuring direction.

Abstract: A length or angle measuring apparatus which measures the relative position of two objects comprises a scale attached to a first object to be measured and a scanning unit which has at least one scanning element connected to the second object to be measured, wherein the second object and the scanning unit have different thermal expansion coefficients. The graduation of the scale is scanning by a scanning element of the scanning unit at a scanning point. Fastening means are provided which fasten the scanning unit to the second object to be measured, such that the scanning point of the scanning element of the scanning unit has no zero point displacement with temperature changes.

Abstract: A securing device composed of a plurality of components for a measuring apparatus used for determining the positions of two structural members which are movable relative to each other. The measuring apparatus includes a graduation, a carrier member carrying the graduation and a scanning device for scanning the graduation. The scanning device is guided at a constant distance from the graduation. The scanning device is fastened to one of the movable structural members by means of an assembly base. Spacer members are used for maintaining the securing device in an intended position relative to the carrier member. Each component of the securing device is a unit which can be separately attached to the carrier member. The components include interacting elements for connecting the components in a securing position.

Abstract: A position measuring arrangement is disclosed which comprises a three-grid measuring system. A first grid is illuminated under an angle .alpha.. Two partial beams result from diffraction on the first grid. the two partial beams impinge on a second grid, which may be the scale of the position-measuring arrangement. Diffraction of the partial-beams on the second grid result in four partial-beams of which the two partial-beams lying closest to the grid normal impinge upon a third grid. The third grid again diffracts the partial-beams and brings them into interference. The partial-beams which are intensity-modulated by interference by the third grid impinge upon photodetectors, by which they are transformed into phase-shifted electric signals and fed to and evaluated arrangement.

Abstract: An interferometric type photoelectric measuring device is disclosed. The photoelectric angle measuring device includes a graduation carrier having a circular graduation and a scanning arrangement for the diametral scanning of the circular graduation. The scanning arrangement is constructed as an integrated optical circuit.

Abstract: A position measuring apparatus of the type that includes a measuring scale and a scanning unit is provided. The measuring scale includes a measuring graduation track and a reference mark track associated with the measuring graduation track. The reference mark track includes a plurality of reference marks, a predetermined number of which are further designated as marked or unmarked. The scanning unit provides for scanning the measuring scale and evaluating the signal produced by such scanning. The apparatus also includes an operating switch associated with the scanning unit. The operating switch provides for selection of at least two modes of operation of the scanning unit: a first mode in which all the reference marks on the reference mark track are evaluated, and a second mode in which marked or unmarked reference marks on the reference track are evaluated.

Abstract: A measuring device is provided in which a graduated plate is scanned in at least two scanning locations. The scanning signals from the different scanning locations are transmitted to a testing circuit which determines whether the phase displacement between the scanning signals exceeds a limit value. If the limit value is exceeded, one of the scanning locations is weighted higher than the other. The weighting is implemented by increasing the components of the signals from one scanning location while decreasing the components from the signals from the other scanning location.

Abstract: A photoelectric measuring device for measuring the position of two objects which can be rotated relative to each other. The measuring device includes a grid graduation located on a graduation support to which the first object can be attached. The second object is attached to a scanning unit scan that scans the grid by means of light diffraction. A beam from the light source is diffracted into partial beam bundles in a first graduation zone of the grid graduation and brought into interference in a second graduation zone which is diametrically opposite of the first graduation zone on the grid graduation for measurement. In order to eliminate or compensate for eccentricity and to produce signals that are phase-displaced and interfere with sinusoidal intensity changes between interference fringes, only partial beam bundles of adjacent orders of diffraction are brought into interference in the second graduation zone.

Abstract: A photoelectric angle measuring apparatus for measuring relative angular positions of two objects which are rotatable relative to each other. The apparatus includes a scanning unit with a scanning scale connected to one of the objects. The scanning unit scans an angle scale of a scale carrier which is connected to the other object. Corresponding graduations of the scanning scale and the angle scale extend parallel to each other. The scanning unit includes an optically projecting element for the light ray path. The optically projecting element has a focal point which is located on the axis of rotation of the scale carrier or a focal line which coincides with the axis of rotation of the scale carrier.

Abstract: A position measuring device including a scale carrier member and a scanning device for scanning the scale. A temperature difference is generated between the scale carrier member and/or the scanning device, on the one hand, and a housing surrounding the scale carrier member and the scanning device, on the other hand. The temperature difference ensures that condensate is always precipitated on the colder housing.

Abstract: A position measuring device including an adjusting device for a sensing device of a graduation. The sensing device is adjustable relative to the graduation by the adjusting device. For the adjustment, the sensing device has three oblong holes whose longitudinal axes extend perpendicularly to each other. A cylindrical pin fixed in the adjusting device engages in one of the oblong holes. Two adjusting screws which have eccentric portions and engage in the oblong holes are used for adjusting the adjusting device in radial and tangential directions, so that the sensing device can be adjusted exactly relative to the graduation of the position measuring device.