Abstract: An electronic circuit tester according to the invention comprises: a connection board for connection with each of the terminals of the circuit to be tested; n boards (16), called electronic pins, comprising signal shaping means each of which is connected to an input of the connection board; a single test vector memory unit (17) containing all the test vectors for the circuit and from the circuit, those vectors transiting through said electronic pins; a central processing unit (10) for managing the system and the external links; in which the management of the vector memory is made alternatively by a memory management unit (22 ) connected independently from the other tester units to the central processing unit (10) or by an address processor (23) asynchronously operating with respect to the central processing unit.