Abstract: A probe for an electrical testing device has an independently powered integrated light source. The probe has a plurality of lights oriented in a cross-like configuration and housed in a recessed surface of the probe. The plurality of lights projects light beams that extend toward the tip of the probe and illuminate the area directly in front of the tip from 360 degrees. The integrated light source is connected to a power source that is housed in the probe but is independent from the power source used for the electrical testing device.
Abstract: A probe for an electrical testing device has an independently powered integrated light source. The probe has a plurality of lights oriented in a cross-like configuration and housed in a recessed surface of the probe. The plurality of lights projects light beams that extend toward the tip of the probe and illuminate the area directly in front of the tip from 360 degrees. The integrated light source is connected to a power source that is housed in the probe but is independent from the power source used for the electrical testing device.