Patents Assigned to e.SIC GmbH
  • Patent number: 12437531
    Abstract: For determining one or more material properties of an object (10), radiation of different wavelength ranges from at least one radiation source (2) is projected onto the object (10), in a temporal sequence, one wavelength at a time. The different wavelength ranges of radiation projected onto the object (10) and the temporal sequence are pre-set by an Artificial Intelligence (AI) model engine (8) provided by a data acquisition and evaluation system (7). Radiation reflected by the object (10) is captured by one or more multi-spectral image acquisition devices (12), and multiple images, and corresponding image data, are generated according to the reflected radiation of multiple wavelengths respectively. A set of raw data is formed to output to the data acquisition and evaluation system (7) for data analysis to determine one or more material properties of the object (10), wherein the set of raw data comprises the image data.
    Type: Grant
    Filed: October 17, 2024
    Date of Patent: October 7, 2025
    Assignee: e.SIC GmbH
    Inventors: Josef Johann Valentin Müllner, Martin Markert, Sebastian Johannes Brehme