Patents Assigned to Eagle Test Systems, Inc.
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Patent number: 7561083Abstract: Methods and apparatus, including computer program products, to test analog to digital converters, are disclosed. In general, data is received that characterizes a first digital code from a device under test at a first analog voltage of an analog signal generator and a second digital code being a digital code threshold, and a step size is generated for another test of the device by performing a calculation by a processor. The calculation may include multiplying a least significant bit size of the device with a difference of the first and second digital codes to generate a product, and dividing the product by a least significant bit size of the analog signal generator. The first digital code may be calculated from results from multiple subtests in the test, where each of the subtests includes multiple analog to digital conversions by the device at the first analog voltage.Type: GrantFiled: October 31, 2007Date of Patent: July 14, 2009Assignee: Eagle Test Systems, Inc.Inventors: David Anderson, Jack Weimer
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Patent number: 6759842Abstract: A removable interface adapter includes a frame, a first set of contacts configured for connection to a first set of test head contacts in a test system, and a second set of contacts configured for connection to a test board having at least one device to be tested. The first and second adapter contacts are interconnected so that electronic devices placed in the test board can be tested by the test system. With this adapter, test boards made for one test system can be used on other test systems.Type: GrantFiled: April 17, 2002Date of Patent: July 6, 2004Assignee: Eagle Test Systems, Inc.Inventor: Jack Edward Weimer
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Patent number: 6697753Abstract: Apparatus for testing an electronic device under a plurality of test conditions created during a test sequence includes an arbitrary waveform generator that sequentially generates the plurality of test conditions. The test conditions include selectively forcing voltage or forcing current over a wide range of amplitudes, measuring a plurality of results with various resolutions and at selected times during the test sequence, changing filter settings, gains and other parameters. The test conditions are selected and set under the control of a system clock using data stored in memory. A controller initiates the test sequence of the apparatus and determines whether measured results are within predetermined specifications. The controller uses processor-driven software, but the settings of the test apparatus are changed at predetermined times during the test sequence, without controller intervention. Several test apparatus are typically managed by one controller.Type: GrantFiled: January 15, 2002Date of Patent: February 24, 2004Assignee: Eagle Test Systems, Inc.Inventors: Gordon M. Samuelson, Jack Edward Weimer
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Publication number: 20030197521Abstract: A removable interface adapter includes a frame, a first set of contacts configured for connection to a first set of test head contacts in a test system, and a second set of contacts configured for connection to a test board having at least one device to be tested. The first and second adapter contacts are interconnected so that electronic devices placed in the test board can be tested by the test system. With this adapter, test boards made for one test system can be used on other test systems.Type: ApplicationFiled: April 17, 2002Publication date: October 23, 2003Applicant: EAGLE TEST SYSTEMS INC.Inventor: Jack Edward Weimer
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Publication number: 20030135343Abstract: Apparatus for testing an electronic device under a plurality of test conditions created during a test sequence includes an arbitrary waveform generator that sequentially generates the plurality of test conditions. The test conditions include selectively forcing voltage or forcing current over a wide range of amplitudes, measuring a plurality of results with various resolutions and at selected times during the test sequence, changing filter settings, gains and other parameters. The test conditions are selected and set under the control of a system clock using data stored in memory. A controller initiates the test sequence of the apparatus and determines whether measured results are within predetermined specifications. The controller uses processor-driven software, but the settings of the test apparatus are changed at predetermined times during the test sequence, without controller intervention. Several test apparatus are typically managed by one controller.Type: ApplicationFiled: January 15, 2002Publication date: July 17, 2003Applicant: EAGLE TEST SYSTEMS, INC.Inventors: Gordon M. Samuelson, Jack Edward Weimer