Patents Assigned to Earthnix-M, Inc.
  • Publication number: 20190285559
    Abstract: An object is to provide a measurement device using X-ray reflection that can reduce space required for measurement, simplify the setting procedure, and improve measurement accuracy. The measurement device using X-ray reflection includes an X-ray tube 1 configured to emit an X-ray beam, a detector 7 configured to detect a reflected beam of the X-ray beam, a rotational driving unit configured to rotate the X-ray tube 1 and the detector 7, a calibration plate 22 configured to reflect the X-ray beam emitted from the X-ray tube 1 toward the detector 7, and a control unit configured to perform a predetermined computation.
    Type: Application
    Filed: March 14, 2019
    Publication date: September 19, 2019
    Applicant: Earthnix-M, Inc.
    Inventors: Hiroshi UCHIDA, Takashi Emura, Junichi Ogawa, Ryusuke Nakanishi
  • Publication number: 20190285561
    Abstract: There is provided an X-ray utilized compound measuring apparatus in which troublesome tasks required to dispose a measurement object are reduced and the accuracy or the validity of measurements on multiple kinds of measurement can be improved.
    Type: Application
    Filed: March 14, 2019
    Publication date: September 19, 2019
    Applicant: Earthnix-M, Inc.
    Inventors: Hiroshi UCHIDA, Takashi EMURA, Junichi OGAWA, Ryusuke NAKANISHI
  • Patent number: 10359373
    Abstract: A measuring device that makes it possible to improve precision and stability is provided. In a measuring device 50, a microwave receiving unit 52 is disposed behind a microwave transmitting unit 51 with respect to a powder object 2, and the microwave transmitting unit 51 and the microwave receiving unit 52 are each enclosed by a waveguide box. A waveguide box 6 for the transmitting unit is smaller than a waveguide box 8 for the receiving unit, and is enclosed by the waveguide box 8 for the receiving unit. An opening portion 7 of the waveguide box 6 and an opening portion 9 of the waveguide box 8 are mounted on a flat window material 5, and are aligned. The window material 5 is in contact with the powder object 2. Microwaves 3 transmitted from the microwave transmitting unit 51 are reflected by the powder object 2, are received, as scattered microwaves 4, by the microwave receiving unit 52, and are measured.
    Type: Grant
    Filed: June 23, 2017
    Date of Patent: July 23, 2019
    Assignee: Earthnix-M, Inc.
    Inventor: Hiroshi Uchida
  • Publication number: 20180003650
    Abstract: In a measuring device 50, a microwave receiving unit 52 is disposed behind a microwave transmitting unit 51 with respect to a powder object 2, and the microwave transmitting unit 51 and the microwave receiving unit 52 are each enclosed by a waveguide box. A waveguide box 6 for the transmitting unit is smaller than a waveguide box 8 for the receiving unit, and is enclosed by the waveguide box 8 for the receiving unit. An opening portion 7 of the waveguide box 6 and an opening portion 9 of the waveguide box 8 are mounted on a flat window material 5, and are aligned. The window material 5 is in contact with the powder object 2. Microwaves 3 transmitted from the microwave transmitting unit 51 are reflected by the powder object 2, are received, as scattered microwaves 4, by the microwave receiving unit 52, and are measured.
    Type: Application
    Filed: June 23, 2017
    Publication date: January 4, 2018
    Applicant: Earthnix-M, Inc.
    Inventor: Hiroshi UCHIDA