Abstract: An optical probe for measuring the intensity and/or intensity distribution in a light beam is provided. The optical probe (10) includes a substrate formed of nonlight-absorbing material and a light-scattering element (12) included in the substrate. The light-scattering element has an index of refraction different from that of the substrate. The optical probe further includes an aperture stop (14) for receiving the light (16′) scattered by, refracted by, and/or reflected from the light-scattering element. The optical probe still further includes a light-measuring device (15) for measuring the intensity of the light received by the aperture stop. The light-scattering element and the aperture stop are arranged in fixed relationship with respect to each other. In operation, as an incident light beam (16) enters the substrate, some of the light strikes and is scattered by, refracted by, and/or reflected from the light-scattering element.