Patents Assigned to Ecole de Techbologie Superieure
  • Patent number: 8983206
    Abstract: A visual quality assessment method and system are based on deriving a quality metric by comparing sub-band approximations of a distorted image and an undistorted version of the same image, providing a good compromise between computational complexity and accuracy. The sub-band approximations are derived from Discrete Wavelet (Haar) transforms of small image blocks of each image. Due to inherent symmetries, the wavelet transform is “blind” to certain types of distortions. But the accuracy of the method is enhanced, and the blindness of the transform is overcome, by computing quality metrics for the distorted image as well as computing quality metrics for a shifted version of the distorted image and combining the results.
    Type: Grant
    Filed: May 3, 2012
    Date of Patent: March 17, 2015
    Assignee: Ecole de Techbologie Superieure
    Inventors: Stephane Coulombe, Soroosh Rezazadeh