Patents Assigned to Ecole De Technologies Superieur
  • Patent number: 8660363
    Abstract: Method and system for determining a measure of quality for images are presented. Multi-level decomposition of images in the wavelet domain using a variable number of levels of decomposition and aggregation of selected subbands is performed to obtain an accurate measure of quality. The processing time is reduced in comparison to that required by other methods for generating measures of quality.
    Type: Grant
    Filed: July 9, 2013
    Date of Patent: February 25, 2014
    Assignee: Ecole De Technologies Superieur
    Inventors: Soroosh Rezazadeh, Stephane Coulombe