Abstract: A system for electron pattern imaging includes: a device for converting electron patterns into visible light provided to receive an electron backscatter diffraction (EBSD) pattern from a sample and convert the EBSD pattern to a corresponding light pattern; a first optical system positioned downstream from the device for converting electron patterns into visible light for focusing the light pattern produced by the device for converting electron patterns into visible light; a camera positioned downstream from the first optical system for obtaining an image of the light pattern; an image intensifier positioned between the device for converting electron patterns into visible light and the camera for amplifying the light pattern produced by the device for converting electron patterns into visible light; and a device positioned within the system for protecting the image intensifier from harmful light.

Abstract: Various embodiments of the present invention provide systems and methods for determining an characteristic of a material. The characteristics may include, but are not limited to, crystallographic and chemical composition characteristics of a material.

Abstract: An X-ray analyzer includes a sample stage for holding and positioning a sample and an optical positioner assembly configured above the sample stage. The optical positioner assembly includes a body member having an opening; an optical positioner located within the opening; and at least one X-ray optic and an optical viewing lens coupled to a first camera. The at least one X-ray optic and the optical viewing lens are secured to the optical positioner. The optical positioner is configured to align one of the at least one X-ray optic and the optic viewing lens normal to the sample on the sample stage such that the sample is irradiated with X-rays through the X-ray optic along a path which is normal to the sample and coaxial with the optic viewing lens receiving light reflected from the sample when the optic viewing lens is positioned normal to the sample.

Abstract: An X-ray analyzer includes a sample stage for holding and positioning a sample and an optical positioner assembly configured above the sample stage. The optical positioner assembly includes a body member having an opening; an optical positioner located within the opening; and at least one X-ray optic and an optical viewing lens coupled to a first camera. The at least one X-ray optic and the optical viewing lens are secured to the optical positioner. The optical positioner is configured to align one of the at least one X-ray optic and the optic viewing lens normal to the sample on the sample stage such that the sample is irradiated with X-rays through the X-ray optic along a path which is normal to the sample and coaxial with the optic viewing lens receiving light reflected from the sample when the optic viewing lens is positioned normal to the sample.

Abstract: A method of measuring the transfer function of an X-ray optical component over a wide range of X-ray energies, which includes the steps of: using an X-ray optical component between an X-ray source and a scattering target to obtain a first scatter spectrum; obtaining a second scatter spectrum from the same or a similar target without the X-ray optical component between the X-ray source and the scattering target; and calculating the transfer function by the ratio of the first scatter spectrum to the second scatter spectrum. The method can be used to improve the accuracy of X-ray quantitative methods in an apparatus where an X-ray optical component is used between the X-ray source and the specimen to be investigated by utilizing the method described above.

Abstract: An analytical method for combining chemical information with crystallographic information to obtain a map of the crystal orientation, the nature of grain boundaries, and distinguishing crystalline phases in a polycrystalline sample, including the steps of providing a sample with a prescribed grid of points thereon, selecting a point, applying a collimated electron beam to the point to obtain an electron backscatter diffraction (EBSD) pattern and the elemental composition of the sample at the point. Recording the information and repeating for each point in the grid and determining the crystalline phases in the sample. An instrument capable of performing the method includes an SEM having means for applying an electron beam to a sample, means for obtaining an EBSD pattern (EBSP), and means for determining the composition of the sample, as well as means for recording EBSD band locations and characteristics and the elemental composition of the sample.

Abstract: A solid state x-ray detector crystal has a body having a front face for receiving incident x-rays. The front face is oblong. A housing about the detector crystal is also oblong. The resulting detector unit fits farther into the gap between the pole pieces of an electron microscope.

Abstract: A mounting system includes a port cover, a mounting interface, and a damping system. The port cover is attached to a microscope and secures the mounting interface to the microscope. The mounting interface provides a mounting surface for an X-ray detector unit to attach to the microscope and a surface to which the damping system is attached. The damping system includes a plurality of collets, a collet clamp, and damping material. The damping system secures the X-ray detector unit to the microscope while damping vibrations caused by the detector unit.

Abstract: A porous material inserted into a fluid-containing vessel reduces turbulence, heat transfer, and mass transfer in the fluid. The material may be used in a cryostat to reduce turbulence in a boiling cryogenic fluid. The cryostat may be used in an energy dispersive x-ray analysis unit to cool an x-ray detector.