Patents Assigned to EDAX, Incorporated
  • Devices and systems for improved collection efficiency and resolution of wavelength dispersive spectrometry
    Patent number: 11035806
    Abstract: A device for the collection of X-rays includes at least one multi-reflection reflector cone. The multi-reflection reflector cone has a focal axis. A first portion of the multi-reflection reflector cone is oriented at a first angle to the focal axis, and a second portion of the multi-reflection reflector cone is oriented at a second angle to the focal axis.
    Type: Grant
    Filed: December 20, 2019
    Date of Patent: June 15, 2021
    Assignee: EDAX, Incorporated
    Inventor: Patrick Paul Camus
  • Systems and methods for in situ high temperature X-ray spectroscopy in electron microscopes
    Patent number: 10656106
    Abstract: In some embodiments, a system for collecting information from a sample includes a sample stage and one or more signal detectors. The sample stage includes a heating element, and the heating element is capable of heating at least a portion of the sample stage to at least 100 Celsius. The one or more signal detectors has a detection material with a silicon nitride window positioned between the detection material and the sample stage.
    Type: Grant
    Filed: February 5, 2019
    Date of Patent: May 19, 2020
    Assignee: EDAX, Incorporated
    Inventor: Patrick Paul Camus
  • Systems and methods for high energy X-ray detection in electron microscopes
    Patent number: 10614997
    Abstract: A system for collecting information from a sample, the system includes an X-ray detector configured to mount to an electron microscope, the X-ray detector including a detection tip with a detection material positioned in the detection tip. The detection material includes a compound semiconductor material.
    Type: Grant
    Filed: August 3, 2018
    Date of Patent: April 7, 2020
    Assignee: EDAX, Incorporated
    Inventor: Patrick Paul Camus
  • Devices and systems for spatial aggregation of spectral analysis from electron microscopes
    Patent number: 10139356
    Abstract: An x-ray spectrum collected from a sample via excitation of the sample by an electron beam includes artifacts due to interaction volume, surface effects, contamination, or other interferences with the desired collection of representative x-rays from the sample. Inline spectral correlation, summation, averaging, other aggregation, or combinations thereof provides more precise collection of x-ray spectrum from multi-phase, unprepared, particle, or complex samples.
    Type: Grant
    Filed: September 15, 2017
    Date of Patent: November 27, 2018
    Assignee: EDAX, Incorporated
    Inventors: Divyesh I. Patel, Tara Lyn Nylese, Jens Rafaelsen, Stuart Ian Wright
  • Devices and systems for spatial averaging of electron backscatter diffraction patterns
    Patent number: 9791390
    Abstract: A diffraction pattern is averaged with adjacent diffraction patterns to increase a signal to noise ratio thereof and improve indexing accuracy. The pixels of a diffraction pattern image are averaged with a correlated pixel from one or more adjacent diffraction patterns. Noise artifacts are reduced in intensity, while signals present in each of the patterns reinforce one another to produce an averaged diffraction pattern which is then indexed.
    Type: Grant
    Filed: January 22, 2016
    Date of Patent: October 17, 2017
    Assignee: EDAX, Incorporated
    Inventors: Stuart Ian Wright, Matthew McBride Nowell, Scott Perry Lindeman, Patrick Paul Camus