Patents Assigned to EDDYFI NDT INC.
  • Publication number: 20210033565
    Abstract: There is described an Eddy current probe for non-destructive testing, comprising: a first leg extending along a first longitudinal axis between a first proximal end and a first distal end; a second leg extending along a second longitudinal axis between a second proximal end and a second distal end; a high magnetic permeability body extending at least partially between the first and second longitudinal axes, the high magnetic permeability body being spaced apart from the first and second legs by a gap and the high magnetic permeability body and the first and second legs being each made of a high magnetic permeability material; and at least one excitation coil each secured to at least one of the first leg and the second leg.
    Type: Application
    Filed: February 8, 2019
    Publication date: February 4, 2021
    Applicant: EDDYFI NDT INC.
    Inventors: Vincent Demers-Carpentier, Marco Michèle Sisto
  • Patent number: 10794864
    Abstract: There is described an eddy current array probe for detection and depth sizing of a surface-breaking defect in a metallic material, said eddy current array probe comprising: a probe body comprising a plurality of probe elements arranged in a linear configuration, the probe elements each comprising at least one coil, the probe body being adapted to be displaced along a surface of the metallic material so that a longitudinal axis of the coil be parallel to the surface of the metallic material, the coil, when in use, being adapted to induce an eddy current within the metallic material detect the eddy current; and a set of active elements of the plurality of probe elements being adapted to be selectively operated at a plurality of time-spaced instances.
    Type: Grant
    Filed: April 14, 2015
    Date of Patent: October 6, 2020
    Assignee: EDDYFI NDT INC.
    Inventors: Michäel Sirois, Stèfan Parmentier, Marc Grenier, Nathan Decourcelle
  • Publication number: 20190041361
    Abstract: A Pulsed Eddy Current (PEC) probe for PEC testing of a ferromagnetic object covered with a ferromagnetic protective jacket, the PEC probe comprising: at least one coil for at least one of generating an inspection magnetic field and detecting an induced magnetic field; at least one permanent magnet for magnetically saturating the ferromagnetic protective jacket; and means for selectively reducing an attraction between the at least one magnet and the ferromagnetic protective jacket.
    Type: Application
    Filed: August 2, 2018
    Publication date: February 7, 2019
    Applicant: EDDYFI NDT INC.
    Inventors: Marco Michele SISTO, Maxime ROCHETTE, Florian HARDY, Louis-Philippe DION
  • Patent number: 9880130
    Abstract: A Pulsed Eddy Current device for inspecting an object made of an electrically conductive material comprising: at least one dual-purpose coil serving a dual purpose of producing a supplied magnetic field in the object and measuring a produced magnetic field emitted by the object, a transmitter circuit driving the dual-purpose coil(s) with an electrical signal, a shut-off current circuit for the transmitter circuit for cutting-off a current in the dual-purpose coil(s) during a cut-off phase of the electrical signal, the shut-off current circuit applying a voltage inversion on the dual-purpose coil(s) and a receiver circuit for reading the produced magnetic field from the dual-purpose coil(s). A method for inspecting an object comprising supplying a voltage on at least one dual-purpose coil, cutting-off a current in the dual-purpose coil(s) by applying a voltage inversion on the dual-purpose coil(s) and receiving, at the dual-purpose coil(s), a produced magnetic field.
    Type: Grant
    Filed: December 14, 2016
    Date of Patent: January 30, 2018
    Assignee: EDDYFI NDT INC.
    Inventors: Florian Hardy, Maxime Rochette, Marc Grenier, Vincent Demers-Carpentier
  • Publication number: 20170030862
    Abstract: There is described an eddy current array probe for detection and depth sizing of a surface- breaking defect in a metallic material, said eddy current array probe comprising: a probe body comprising a plurality of probe elements arranged in a linear configuration, the probe elements each comprising at least one coil, the probe body being adapted to be displaced along a surface of the metallic material so that a longitudinal axis of the coil be parallel to the surface of the metallic material, the coil, when in use, being adapted to induce an eddy current within the metallic material detect the eddy current; and a set of active elements of the plurality of probe elements being adapted to be selectively operated at a plurality of time-spaced instances.
    Type: Application
    Filed: April 14, 2015
    Publication date: February 2, 2017
    Applicant: EDDYFI NDT INC.
    Inventors: Michäel SIROIS, Stèfan PARMENTIER, Marc GRENIER, Nathan DECOURCELLE
  • Patent number: 9389201
    Abstract: An electromagnetic probe for non-destructive inspection of a twisted tube of a twisted tube heat exchanger comprising a probe body having a sensing section being configured to allow circulation of the probe body within the length of circular tube and the length of helical oval tube and to allow displacement of the electromagnetic sensor(s) from a radially inward contracted position to a radially outward expanded position in close proximity to an interior surface of a crest of the oval tube; a conduit attached to a proximal end of the probe body, the at least one conductor extending within the conduit to a remote end of the electromagnetic probe.
    Type: Grant
    Filed: June 10, 2014
    Date of Patent: July 12, 2016
    Assignee: EddyFi NDT inc.
    Inventors: Olivier Lavoie, Martin Bourgault, Marc Grenier, François Dion
  • Publication number: 20150143910
    Abstract: A transmitter circuit and method for an ultrasonic thickness measurement system having an ultrasonic transducer and a cable with known cable impedance, the cable connecting at least the transmitter circuit to the ultrasonic transducer, the transmitter circuit comprising: an electrical pulse voltage signal emitter for producing an electrical pulse voltage signal to be propagated over the cable to the ultrasonic transducer, the electrical pulse voltage signal having a pulse nominal voltage value; a matched impedance circuit for matching a cable impedance of the cable at the transmitter circuit for an electrical parasitic reflection signal of the electrical pulse voltage signal, the electrical parasitic reflection signal being caused by an impedance mismatch between the cable and the ultrasonic transducer, a parasitic nominal voltage value of the electrical parasitic reflection signal being at most the pulse nominal voltage value.
    Type: Application
    Filed: July 23, 2013
    Publication date: May 28, 2015
    Applicant: EDDYFI NDT INC.
    Inventors: Florian Hardy, Eric Morissette