Patents Assigned to Educational Testing System
  • Patent number: 8639176
    Abstract: Disclosed herein is a method of analyzing examinee item response data comprising constructing a diagnosis model for reporting skill profiles of examinees, wherein the diagnosis model comprises at least a variable representing unobserved subpopulations, creating an item design matrix, distributing examinees across the unobserved subpopulations, iteratively estimating values for a plurality of variables within the diagnosis model, and reporting the estimated values to a user.
    Type: Grant
    Filed: September 7, 2007
    Date of Patent: January 28, 2014
    Assignee: Educational Testing System
    Inventors: Matthias Von Davier, Kentaro Yamamoto, Xueli Xu