Abstract: Disclosed herein is a method of analyzing examinee item response data comprising constructing a diagnosis model for reporting skill profiles of examinees, wherein the diagnosis model comprises at least a variable representing unobserved subpopulations, creating an item design matrix, distributing examinees across the unobserved subpopulations, iteratively estimating values for a plurality of variables within the diagnosis model, and reporting the estimated values to a user.
Type:
Grant
Filed:
September 7, 2007
Date of Patent:
January 28, 2014
Assignee:
Educational Testing System
Inventors:
Matthias Von Davier, Kentaro Yamamoto, Xueli Xu