Patents Assigned to EG&G Gamma Scientific Incorporated
  • Method and apparatus for measuring spatial profiles of energy beams
    Patent number: 4797619
    Abstract: An apparatus and method for measuring the spatial characteristics of color CRTs includes the scanning of an image of a white vertical line with a knife edge aperture and integrating the intensity values at each position of the knife edge. The centroids of the beams of the CRT are found by determining the X coordinants of the 50% points of the Y axis of the integral data, and the spatial line profiles are determined by differentiating the integral data. The integral data may be fitted to a Gaussian curve prior to analysis.
    Type: Grant
    Filed: March 13, 1987
    Date of Patent: January 10, 1989
    Assignee: EG&G Gamma Scientific Incorporated
    Inventors: Richard L. Austin, Herbert J. Otto, Frank L. Jones