Patents Assigned to Elixir Flash Technology Co., Ltd.
  • Power loss test device and method for nonvolatile memory device
    Patent number: 10008288
    Abstract: A power loss test apparatus for a non-volatile memory device includes a test-board including at least one socket into which at least one test target non-volatile memory device is inserted, a micro controller that determines whether to supply power to the test target non-volatile memory device based on current consumption information or operating state information of the test target non-volatile memory device, and a tester that performs a power loss test for the test target non-volatile memory device based on whether the power is supplied to the test target non-volatile memory device.
    Type: Grant
    Filed: July 24, 2013
    Date of Patent: June 26, 2018
    Assignee: Elixir Flash Technology Co., Ltd.
    Inventor: Sung-woo Lee
  • Power Loss Test Device And Method For Nonvolatile Memory Device
    Publication number: 20160078967
    Abstract: A power loss test apparatus for a non-volatile memory device includes a test-board including at least one socket into which at least one test target non-volatile memory device is inserted, a micro controller that determines whether to supply power to the test target non-volatile memory device based on current consumption information or operating state information of the test target non-volatile memory device, and a tester that performs a power loss test for the test target non-volatile memory device based on whether the power is supplied to the test target non-volatile memory device.
    Type: Application
    Filed: July 24, 2013
    Publication date: March 17, 2016
    Applicant: Elixir Flash Technology Co., Ltd.
    Inventor: Sung-woo Lee