Patents Assigned to EM Locator Technology, LLC
  • Method of determining subsurface properties using multifrequency electromagnetic depth sounding
    Patent number: 10830915
    Abstract: The present disclosure relates to detecting subterranean formations using electromagnetic depth sounding. A method for detecting formation properties may comprise of disposing a transmitter at a surface, disposing a receiver at the surface, coupling a high frequency wave to a low frequency wave to form an electromagnetic pulse, transmitting the electromagnetic pulse into a formation from the transmitter, receiving a reflected electromagnetic wave from the formation with the receiver, and determining the depth and nature of the formation from the surface. A formation measuring system may comprise a transmitter, wherein the transmitter is configured to couple a high frequency wave to a low frequency wave to form an electromagnetic pulse. The formation measuring system may further comprise at least one receiver, a data acquisition system, and an analysis unit.
    Type: Grant
    Filed: February 1, 2018
    Date of Patent: November 10, 2020
    Assignee: EM Locator Technology, LLC
    Inventors: Franz Van de Kop, Bridget M. Van de Kop, Andrew R. Van de Kop, Juergen Zach, Alex C. Dumestre, III, David Ridyard, Robert A. Brook
  • METHOD OF DETERMINING SUBSURFACE PROPERTIES USING MULTIFREQUENCY ELECTROMAGNETIC DEPTH SOUNDING
    Publication number: 20190235102
    Abstract: The present disclosure relates to detecting subterranean formations using electromagnetic depth sounding. A method for detecting formation properties may comprise of disposing a transmitter at a surface, disposing a receiver at the surface, coupling a high frequency wave to a low frequency wave to form an electromagnetic pulse, transmitting the electromagnetic pulse into a formation from the transmitter, receiving a reflected electromagnetic wave from the formation with the receiver, and determining the depth and nature of the formation from the surface. A formation measuring system may comprise a transmitter, wherein the transmitter is configured to couple a high frequency wave to a low frequency wave to form an electromagnetic pulse. The formation measuring system may further comprise at least one receiver, a data acquisition system, and an analysis unit.
    Type: Application
    Filed: February 1, 2018
    Publication date: August 1, 2019
    Applicant: EM Locator Technology, LLC
    Inventors: Franz Van de Kop, Bridget M. Van de Kop, Andrew R. Van de Kop, Juergen Zach, Alex C. Dumestre, III, David Ridyard, Robert A. Brook