Abstract: A near field microwave scanning system includes a switched array of antenna elements forming an array surface, a scan surface substantially parallel to the array surface and separated by a distance less than about 1 wavelength of the measured frequency, and a processing engine for obtaining and processing near field data, without the use of an absorber.
Type:
Grant
Filed:
October 10, 2007
Date of Patent:
August 6, 2013
Assignee:
Emscan Corporation
Inventors:
Adiseshu Nyshadham, Ruska Patton, Jason Jin
Abstract: A near field microwave scanning system includes a switched array of antenna elements forming an array surface, a scan surface substantially parallel to the array surface and separated by a distance less than about 1 wavelength of the measured frequency, and a processing engine for obtaining and processing near field data, without the use of an absorber.
Type:
Application
Filed:
October 10, 2007
Publication date:
August 11, 2011
Applicant:
EMSCAN Corporation
Inventors:
Adiseshu Nyshadham, Ruska Patton, Jason Jin
Abstract: A near field microwave scanning system includes a switched array of antenna elements forming an array surface, a scan surface substantially parallel to the array surface and separated by a distance less than about 1 wavelength of the measured frequency, and a processing engine for obtaining and processing near field data, without the use of an absorber.
Type:
Grant
Filed:
March 16, 2007
Date of Patent:
March 2, 2010
Assignee:
EMSCAN Corporation
Inventors:
Adiseshu Nyshadham, Ruska Patton, Jason Jin
Abstract: A method and apparatus for high-speed scanning of electromagnetic emission levels includes a synchronizer for synchronizing scanning of a device under test with digitizing a output video signal from a spectrum analyzer. The synchronizer can be responsive to a synchronization signal from the device under test or can generate a synchronization signal to the device under test. Methods for calibrating the level and frequency of the video output signal are provided. Once calibrated the high-speed scanning can be used to develop single probe multifrequency/time scans yielding amplitude versus frequency and time plots, and single frequency multiple probe/time scans yielding amplitude versus space and time plots.