Patents Assigned to Emscan Corporation
  • Patent number: 8502546
    Abstract: A near field microwave scanning system includes a switched array of antenna elements forming an array surface, a scan surface substantially parallel to the array surface and separated by a distance less than about 1 wavelength of the measured frequency, and a processing engine for obtaining and processing near field data, without the use of an absorber.
    Type: Grant
    Filed: October 10, 2007
    Date of Patent: August 6, 2013
    Assignee: Emscan Corporation
    Inventors: Adiseshu Nyshadham, Ruska Patton, Jason Jin
  • Publication number: 20110193566
    Abstract: A near field microwave scanning system includes a switched array of antenna elements forming an array surface, a scan surface substantially parallel to the array surface and separated by a distance less than about 1 wavelength of the measured frequency, and a processing engine for obtaining and processing near field data, without the use of an absorber.
    Type: Application
    Filed: October 10, 2007
    Publication date: August 11, 2011
    Applicant: EMSCAN Corporation
    Inventors: Adiseshu Nyshadham, Ruska Patton, Jason Jin
  • Patent number: 7672640
    Abstract: A near field microwave scanning system includes a switched array of antenna elements forming an array surface, a scan surface substantially parallel to the array surface and separated by a distance less than about 1 wavelength of the measured frequency, and a processing engine for obtaining and processing near field data, without the use of an absorber.
    Type: Grant
    Filed: March 16, 2007
    Date of Patent: March 2, 2010
    Assignee: EMSCAN Corporation
    Inventors: Adiseshu Nyshadham, Ruska Patton, Jason Jin
  • Patent number: 6268738
    Abstract: A method and apparatus for high-speed scanning of electromagnetic emission levels includes a synchronizer for synchronizing scanning of a device under test with digitizing a output video signal from a spectrum analyzer. The synchronizer can be responsive to a synchronization signal from the device under test or can generate a synchronization signal to the device under test. Methods for calibrating the level and frequency of the video output signal are provided. Once calibrated the high-speed scanning can be used to develop single probe multifrequency/time scans yielding amplitude versus frequency and time plots, and single frequency multiple probe/time scans yielding amplitude versus space and time plots.
    Type: Grant
    Filed: May 6, 1998
    Date of Patent: July 31, 2001
    Assignee: Emscan Corporation
    Inventors: Gary E. Gunthorpe, Don E. James