Abstract: Disclosed herein is hot/cold test equipment for a Nand Flash Memory. The test equipment includes a mounting unit that contains the Nand Flash Memory together with a socket to test whether the memory is defective or not, a chamber provided above the mounting unit and moving up and down to come into contact with the socket and thereby provide a target temperature, and a temperature display displaying the target temperature. The chamber includes a block inserted into the socket, a thermoelectric element seated on an upper portion of the block, a water jacket seated on an upper portion of the thermoelectric element and circulating cooling water therein, and a cooling fan provided in the water jacket to blow air downwards, with a discharge hole being formed on a lower surface of the block to discharge nitrogen gas.