Patents Assigned to Endress+Hauser Optical Analysis, Inc.
  • Patent number: 11953427
    Abstract: Frequency registration deviations occurring during a scan of a frequency or wavelength range by a spectroscopic analysis system can be corrected using passive and/or active approaches. A passive approach can include determining and applying mathematical conversions to a recorded field spectrum. An active approach can include modifying one or more operating parameters of the spectroscopic analysis system to reduce frequency registration deviation.
    Type: Grant
    Filed: August 3, 2016
    Date of Patent: April 9, 2024
    Assignee: Endress+Hauser Optical Analysis, Inc.
    Inventors: Alfred Feitisch, Xiang Liu, Kevin Ludlum, Mathias Schrempel
  • Patent number: 11953437
    Abstract: The present disclosure relates to a device for measuring a first analyte concentration and a second analyte concentration in a measuring medium, the device including: a sample cell; a first light source unit; a first detector unit; a functional element; a second light source unit; a second detector unit; and a control unit adapted to analyze a detected first light for determining a first value representing the concentration of the first analyte in the measuring medium and adapted to analyze a detected third light for determining a second value representing the concentration of the second analyte in the measuring medium. A method of using the device is also disclosed.
    Type: Grant
    Filed: August 25, 2021
    Date of Patent: April 9, 2024
    Assignee: Endress+Hauser Optical Analysis, Inc.
    Inventors: Marc Winter, Xiang Liu, Thomas Wilhelm
  • Patent number: 11940464
    Abstract: One aspect of the present disclosure discloses a probe, including a probe body having a center axis defining a proximal end and a distal end and including an aperture in the distal end; a window affixed in the aperture, wherein the window is substantially optically transparent; and a flange adjoining the proximal end of the probe body, the flange including a sealing surface and a sealing edge, wherein the flange separates an in-process portion of the probe from an ex-process portion of the probe, the in-process portion including at least the probe body, the sealing surface and the sealing edge, where at least the in-process portion of the probe consists essentially of an austenitic stainless steel material. Further aspects include a computer product configured to execute a method employing the probe.
    Type: Grant
    Filed: February 14, 2020
    Date of Patent: March 26, 2024
    Assignee: Endress+Hauser Optical Analysis, Inc.
    Inventors: Carsten Uerpmann, Michael Gordon Stidham
  • Patent number: 11913834
    Abstract: An optical measurement probe for capturing a spectral response through an intervening material emitting unwanted background radiation includes: a first lens configured to receive light and collimate the light into a collimated excitation beam defining a first aperture; an objective element for focusing the collimated excitation beam to a point or region in a sample through the intervening material, wherein the objective element also receives light scattered by the sample and the intervening material and collimates the scattered light into a collimated collection beam defining a second aperture; and a blocking element within the collimated collection beam for removing the light scattered by the intervening material from the collimated collection beam received from the sample, wherein the second aperture defined by the collimated collection beam is at least two times greater than the first aperture defined by the collimated excitation beam.
    Type: Grant
    Filed: August 16, 2021
    Date of Patent: February 27, 2024
    Assignee: Endress+Hauser Optical Analysis, Inc.
    Inventors: James M. Tedesco, Sean J. Gilliam
  • Patent number: 11874230
    Abstract: A method for determining an amount of a Raman-invisible gas in a multi-component gas stream includes performing a first and second absolute Raman analysis on the gas stream. A decrease in the absolute Raman bands from the first analysis to the second analysis is attributed to an increase of the Raman-invisible gas in the gas stream. The amount of the Raman-invisible gas is calculated from the difference between the first and second sets of Raman bands. The calculation of the Raman-invisible gas is verified via a measurement and a calculation of a secondary property of the gas stream such as the thermal conductivity of the gas stream or the density of the gas stream.
    Type: Grant
    Filed: June 9, 2022
    Date of Patent: January 16, 2024
    Assignee: Endress+Hauser Optical Analysis, Inc.
    Inventors: Joseph B. Slater, Marc Winter, Oliver Link
  • Patent number: 11852533
    Abstract: Raman analysis systems are partitioned to provide for cost-effective flame resistance and explosion resistance, including relatively small enclosures associated with particular subsystems. One or more of an excitation source, spectrograph and/or controller are disposed in separate, flame-resistant or explosion-resistant enclosures. A remote optical measurement probe may also be disposed in a separate flame-resistant or explosion-resistant enclosure. A grating and a detector of the spectrograph may be disposed in separate enclosures, with sealed windows therebetween to deliver a Raman spectral signal from the optical grating to the detector. The sealed window of the detector enclosure may serve the dual purpose of maintaining flame resistance or explosion resistance while maintaining cooling within the enclosure. Wireless interfaces may be used for communications between the enclosures where practical to reduce or eliminate physical electrical feedthroughs.
    Type: Grant
    Filed: December 15, 2021
    Date of Patent: December 26, 2023
    Assignee: Endress+Hauser Optical Analysis, Inc.
    Inventors: Scott Sutherland, Manfred Jagiella, Joseph Slater
  • Patent number: 11754539
    Abstract: The present disclosure relates to a computer-implemented method for forecasting calibration spectra including a step of providing a machine learning model trained using historical calibration data corresponding to different gas species at different pressures. The computer-implemented method also includes steps of performing a calibration scan of one gas species at one pressure using an analyzer and generating calibration curves for the analyzer corresponding to one or multiple gas species at multiple pressures using the machine learning model and the calibration scan. Thereafter, a spectrum is obtained using the analyzer, and a concentration measurement is generated using the spectrum and at least one of the calibration curves.
    Type: Grant
    Filed: April 8, 2020
    Date of Patent: September 12, 2023
    Assignee: Endress+Hauser Optical Analysis, Inc.
    Inventors: Kevin Ludlum, Marc Winter, Benjamin Scherer, Xiang Liu
  • Patent number: 11598726
    Abstract: A method of characterizing and monitoring a pressing process includes acquiring online Raman spectra of a juice pressing process within a vessel at different times during the pressing process to generate a training data set; acquiring physical samples from pressing process near in time to the acquired Raman spectra; performing offline measurements of the target analyte properties and/or compositions using an assay measurement technique; generating a correlative model of the target analyte such that spectral changes in the training data set correlate with the offline measurements of the target analyte properties and/or compositions; acquiring online Raman spectra of a subsequent run of the pressing process within the vessel at different times during the run to generate a process data set; and applying the correlative model to the process data set to qualitatively and/or quantitatively predict a value of a property and/or composition of the target analyte.
    Type: Grant
    Filed: August 18, 2021
    Date of Patent: March 7, 2023
    Assignee: Endress+Hauser Optical Analysis, Inc.
    Inventor: Sean J. Gilliam
  • Patent number: 11592398
    Abstract: The present disclosure includes discloses a method for analyzing a multi-component gas sample using spectroscopy in combination with the measurement of extrinsic or intrinsic properties of the gas sample. The results of the spectroscopic analysis and the measurement are combined to quantify a gas component unseen by the spectroscopic analysis.
    Type: Grant
    Filed: August 4, 2020
    Date of Patent: February 28, 2023
    Assignee: Endress+Hauser Optical Analysis, Inc.
    Inventors: Joseph B. Slater, James M. Tedesco, Francis Esmonde-White
  • Patent number: 11466228
    Abstract: An improved method of sealing a window into an aperture in a body uses a lubricant comprising polymer particles suspended in a volatile, low viscosity, low surface tension carrier fluid. The carrier fluid is applied to one or both of the sidewalls of the window and aperture, and the window is pressed into the aperture such that the carrier fluid evaporates, leaving the polymer particles to fill interstitial surface voids, while enabling the sidewall of the window to make intimate mechanical contact with the sidewall of the aperture. While having broader application, the present disclosure finds particular utility in optical characterization techniques based upon the Raman effect and fluorescence probes used in process monitoring and control.
    Type: Grant
    Filed: October 23, 2020
    Date of Patent: October 11, 2022
    Assignee: Endress+Hauser Optical Analysis, Inc.
    Inventors: Jeremy David Preister, Joseph B. Slater, Michael G. Stidham
  • Patent number: 11346715
    Abstract: A standard reference material interface for a Raman probe includes a locator including a housing having a first end and a second end, the first end including an attachment portion configured to mate with an attachment portion of the Raman probe. The locator defines a central axis that intersects the first end and the second end. The standard reference material interface also includes a hermetically sealed standard reference material enclosure positioned at the second end of the housing and enclosing a standard reference material. An optical port is positioned within the housing between the Raman probe and the standard reference material relative to the central axis. The optical port includes a window.
    Type: Grant
    Filed: May 1, 2020
    Date of Patent: May 31, 2022
    Assignee: Endress+Hauser Optical Analysis, Inc.
    Inventors: Timothy Norwood, Joseph B. Slater
  • Patent number: 11287384
    Abstract: A method for harmonizing the responses of a plurality of Raman analyzers includes steps of calibrating an intensity axis response of a spectrometer to a reference light source and measuring a laser wavelength of a laser using the spectrometer. The method also includes steps of measuring a fluorescence spectrum induced by the laser at the laser wavelength of a plurality of standard reference material samples using the spectrometer, measuring a temperature of each standard reference material sample while measuring the fluorescence spectrum, and correcting the fluorescence spectrum of each standard reference material sample based on the respective temperature. The method further includes steps of deploying each standard reference material sample in one of a plurality of field calibrator devices and calibrating the intensity axis of one of the Raman analyzers using one of the field calibrator devices and the corrected fluorescence spectrum of the respective standard reference material sample.
    Type: Grant
    Filed: July 17, 2020
    Date of Patent: March 29, 2022
    Assignee: Endress+Hauser Optical Analysis, Inc.
    Inventors: Timothy Norwood, Joseph B. Slater, James M. Tedesco