Patents Assigned to Entela, Inc.
  • Control system for a failure mode testing system
    Patent number: 7136769
    Abstract: A control system for a failure mode testing system is described. The control system employs at least one control algorithm that enables the testing system to be operated at optimal pressure and frequency levels in order to generate a desired system response, such as a desired energy level and desired slope of the fast Fourier transform of the system response. Also described are a pressure dither system and a frequency ringing system for enhancing the operation of the actuator cylinders of the failure mode testing system. All three of the systems can be incorporated, either singularly or in combination, into a computer software program that can be employed to operate and control the failure mode testing system.
    Type: Grant
    Filed: March 23, 2006
    Date of Patent: November 14, 2006
    Assignee: Entela, Inc.
    Inventors: Alexander J Porter, Mark A Smith
  • Control system for a failure mode testing system
    Patent number: 7024323
    Abstract: A control system for a failure mode testing system is described. The control system employs at least one control algorithm that enables the testing system to be operated at optimal pressure and frequency levels in order to generate a desired system response, such as a desired energy level and desired slope of the fast Fourier transform of the system response. Also described are a pressure dither system and a frequency ringing system for enhancing the operation of the actuator cylinders of the failure mode testing system. All three of the systems can be incorporated, either singularly or in combination, into a computer software program that can be employed to operate and control the failure mode testing system.
    Type: Grant
    Filed: February 3, 2004
    Date of Patent: April 4, 2006
    Assignee: Entela, Inc.
    Inventors: Alexander J. Porter, Mark Allen Smith
  • Control system for a failure mode testing system
    Patent number: 6697746
    Abstract: A control system for a failure mode testing system is described. The control system employs at least one control algorithm that enables the testing system to be operated at optimal pressure and frequency levels in order to generate a desired system response, such as a desired energy level and desired slope of the fast Fourier transform of the system response. Also described are a pressure dither system and a frequency ringing system for enhancing the operation of the actuator cylinders of the failure mode testing system. All three of the systems can be incorporated, either singularly or in combination, into a computer software program that can be employed to operate and control the failure mode testing system.
    Type: Grant
    Filed: April 17, 2001
    Date of Patent: February 24, 2004
    Assignee: Entela, Inc.
    Inventors: Alexander J. Porter, Mark Allen Smith
  • Control system for a failure mode testing system
    Patent number: 6233530
    Abstract: A control system for a failure mode testing system is described. The control system employs at least one control algorithm that enables the testing system to be operated at optimal pressure and frequency levels in order to generate a desired system response, such as a desired energy level and desired slope of the fast Fourier transform of the system response. Also described are a pressure dither system and a frequency ringing system for enhancing the operation of the actuator cylinders of the failure mode testing system. All three of the systems can be incorporated, either singularly or in combination, into a computer software program that can be employed to operate and control the failure mode testing system.
    Type: Grant
    Filed: October 26, 1999
    Date of Patent: May 15, 2001
    Assignee: Entela, Inc.
    Inventors: Alexander J. Porter, Mark Allen Smith
  • Method and apparatus for optimizing the design of a product
    Patent number: 6035715
    Abstract: A method and apparatus is described for optimizing the design of products, such as but not limited to mechanical products, by simultaneously subjecting the products to multiple stimuli, such as but not limited to temperature, vibration, pressure, ultraviolet radiation, chemical exposure, humidity, mechanical cycling, and mechanical loading.
    Type: Grant
    Filed: September 15, 1997
    Date of Patent: March 14, 2000
    Assignee: Entela, Inc,
    Inventor: Alexander J. Porter