Patents Assigned to EO Vista, LLC
  • Patent number: 9746376
    Abstract: An apparatus and corresponding method for line-scan imaging includes a 2D array of light-sensitive detector elements divided into a plurality of sub-arrays. An electrical circuit can be configured to determine a correction for parallax based on detector element values from at least two rows of parallax detecting elements to enable images captured by the sub-arrays to be co-aligned with each other. The 2D array and parallax detecting elements can be located on the same substrate chip. Image data from sub-arrays can be co-aligned with each other based on parallax data from the parallax detecting elements and used to produce hyperspectral images corrected for parallax.
    Type: Grant
    Filed: November 12, 2014
    Date of Patent: August 29, 2017
    Assignee: EO Vista, LLC
    Inventor: Steven J. Wein
  • Patent number: 9426397
    Abstract: An apparatus and corresponding method for line-scan imaging can include a 2D array of light-sensitive detector elements that detect light from a target scene. The 2D array can be divided into a plurality of sub-arrays and supported by an analog amplification and signal conditioning module portion of a read-out integrated circuit (ROIC), the analog module having one or more replicated amplification and signal conditioning circuits in communication with the 2D array detector elements. An analog-to-digital (A/D) conversion electrical circuit module and one or more digital time-delay and integration (TDI) modules can be situated in a portion of the ROIC not supporting the 2D array. The TDI modules can perform TDI of the detector sub-arrays. Embodiments enable hyperspectral images to be obtained with greater imaging range and higher signal-to-noise ratios.
    Type: Grant
    Filed: November 12, 2014
    Date of Patent: August 23, 2016
    Assignee: EO Vista, LLC
    Inventor: Steven J. Wein