Patents Assigned to EOIR Technologies, Inc.
  • Systems and methods for comparative interferogram spectrometry
    Patent number: 7869050
    Abstract: A method for determining a background noise level includes receiving interferogram data; determining at least one measure of interferogram quality; accumulating said received interferogram data; and generating a background noise level based on said interferogram data and at least one measure of interferogram quality.
    Type: Grant
    Filed: August 13, 2009
    Date of Patent: January 11, 2011
    Assignee: Eoir Technologies, Inc.
    Inventors: George G. He, Diane E. Deterline
  • Systems and methods for comparative interferogram spectrometry
    Patent number: 7593112
    Abstract: A system for comparative interferogram spectrometry includes an interferometer configured to generate interferograms from incident radiation from a target region, an interferogram database containing stored interferograms, and a processing subsystem configured to receive the generated interferograms and compare the received interferograms to the stored interferograms.
    Type: Grant
    Filed: October 2, 2006
    Date of Patent: September 22, 2009
    Assignee: EOIR Technologies, Inc.
    Inventors: George G. He, Diane E. Deterline