Patents Assigned to Epion Corporation a Commonwealth of Massachusetts corporation
  • Publication number: 20030009233
    Abstract: Regardless of the materials used in an artificial joint component design, the present invention applies gas cluster ion beam (GCIB) technology in order to modify the component's surface(s) so as to increase lubrication between contact surfaces, thereby substantially reducing wear debris, osteolysis complications, and accelerated wear failure. The approach of the surface modification comprises an atomic level surface patterning utilizing GCIB to apply a predetermined pattern to the surface(s) of the joint implant to reduce frictional wear at the interface of the surfaces. A reduction in wear debris by GCIB patterning on any surface(s) of a joint prosthesis reduces accelerated failure due to wear and osteolysis and results in a substantial cost savings to the healthcare system, and reduces patient pain and suffering.
    Type: Application
    Filed: May 9, 2002
    Publication date: January 9, 2003
    Applicant: Epion Corporation a Commonwealth of Massachusetts corporation
    Inventors: Stephen M. Blinn, Barry M. Zide, Vincent DiFilippo