Abstract: An integral electrical contact pin for electrically connecting a test terminal of tester load board with an IC terminal of an IC device, adapted for short test height. The integral electrical contact pin comprises an upper cantilever arm and lower cantilever arm connected at a back portion. The upper cantilever arm is movable between a first default position to a second and third position, where the upper cantilever arm is in contact with the lower cantilever arm in the second position. A bracket arm is provided, extending in the opposite direction from the two cantilever arms for engagement with the corresponding socket housing.

Abstract: An integral electrical contact pin for electrically connecting a test terminal of tester load board with an IC terminal of an IC device, adapted for short test height. The integral electrical contact pin comprises an upper cantilever arm and lower cantilever arm connected at a back portion. The upper cantilever arm is movable between a first default position to a second and third position, where the upper cantilever arm is in contact with the lower cantilever arm in the second position. A bracket arm is provided, extending in the opposite direction from the two cantilever arms for engagement with the corresponding socket housing.