Abstract: A docking device for connecting a semiconductor probe to a semiconductor handler has in each case one probe-side and one handler-side connecting device, a handling device for handling a contact-making device and a coupling device for coupling the connecting devices. The coupling device has a first shifting device, which allows the translational and guided shifting of the probe-side connecting device relative to the handler-side connecting device towards and away from one another.

Abstract: A docking drive for a testing head comprising a plurality of locking mechanisms (10) each provided with an own locking drive (14, 21-28) comprises a synchronizing device (11, 12, 13) synchronizing the locking drives (14, 21-28) of the locking mechanisms (10). It may comprise a respective trapping device (15a, b) provided in a plurality of locking mechanisms (10) each retaining a locking element (50) to be locked in the respective locking mechanism (10) in a certain position. A locking element (50) of a docking system comprises a base (51), a locking section (55) and a connecting mechanism (52-54) provided between the base (51) and the locking section (55) and being manually releasable without tools. The locking section (55) may be resiliently supported opposite of the base (51). The locking element may comprise a first retaining section (56) for the trapping device (15) and a second retaining section (57) for a locking device (16).

Abstract: A manipulator for a load has a stand, an accommodation connected to the stand (2, 8) for the load, wherein the accommodation allows movement of the load with respect to the stand with respect to at least a first axis, a drive having a rope pull or a chain or belt drive which supports the movement of the load along the first axis, and an elasticity means acting along the first axis. The elasticity means has a frame translationally displaceable along the first axis with respect to the stand and elastically retained which supports a guiding element of the drive.

Abstract: A work-table for planar work pieces has a supporting plate for the work piece, which extends in two dimensions, a tool carrier for fixing at least one tool unit, the tool carrier being movable along the two dimensions of the supporting plate above the same, and a stand holding the supporting plate. The supporting plate has two or more sub-plates, at least one of which being foldable towards the other one.

Abstract: A docking drive for a testing head comprising a plurality of locking mechanisms (10) each provided with an own locking drive (14, 21-28) comprises a synchronising device (11, 12, 13) synchronising the locking drives (14, 21-28) of the locking mechanisms (10). It may comprise a respective trapping device (15a, b) provided in a plurality of locking mechanisms (10) each retaining a locking element (50) to be locked in the respective locking mechanism (10) in a certain position. A locking element (50) of a docking system comprises a base (51), a locking section (55) and a connecting mechanism (52-54) provided between the base (51) and the locking section (55) and being manually releasable without tools. The locking section (55) may be resiliently supported opposite of the base (51). The locking element may comprise a first retaining section (56) for the trapping device (15) and a second retaining section (57) for a locking device (16).

Abstract: A mounting plate (1) having one or more parts for indirectly or directly attaching a tester (2) for electronic components on the one side and a handler (3) for electronic components on the other side, include at least a single plate (4) on the side of the tester and a single plate (5) on the side of the handler or three or more single plates which are slidable in opposite directions in the x and/or y and/or z direction and lockable.