Abstract: An automated high speed test solution for Quad Flat Pack device packages that enables connectivity between test equipment and the integrated circuit under test is described. A test probe geometry that provides highly repeatable and reliable connections suitable for use with consumer grade QFP devices coupled with ease of maintenance is provided. In some embodiments, the probe tip ends are chisel-shaped. The probes can be slightly slanted with respect to a vertical axis of the probe retaining block.
Type:
Grant
Filed:
October 29, 2021
Date of Patent:
February 20, 2024
Assignee:
ESSAI, INC.
Inventors:
Nasser Barabi, Oksana Kryachek, Hin Lum Lee, Chee Wah Ho
Abstract: A test probe contactor includes an angled depressible probe configuration that causes the tips of the compressible probes to “swipe” the contact pads/solder balls of an IC device under test as the contacts are made. The angulation of the depressible probes permit penetration through foreign material layers on the pad/ball surfaces with less contact force. The contactor includes an upper block and a main block for housing the plurality of probes. The main block and the upper block include corresponding pluralities of slanted probe cavities. The upper bore axis of one or more of the upper probe cavities is laterally shifted relative to the main bore axis of a corresponding probe cavity of the main block, resulting in a lateral offset between the upper bore axis and the main bore axis.
Type:
Grant
Filed:
November 5, 2020
Date of Patent:
July 5, 2022
Assignee:
ESSAI, INC.
Inventors:
Nasser Barabi, Oksana Kryachek, Joven R. Tienzo, Chee Wah Ho
Abstract: A test probe assembly for testing packaged integrated circuit (IC) devices includes a plurality of probes, a pad and a PCB/interposer. The plurality of probes is configured to repeatedly maintain reliable electrical contact, for example, reliable grounding, with a corresponding plurality of DUT contacts when under a compliant force. Reliability and/or grounding can be accomplished by introducing a small angular differential between the bore axis of the upper block and the bore axis of the main block.
Type:
Grant
Filed:
November 5, 2020
Date of Patent:
April 5, 2022
Assignee:
ESSAI, INC.
Inventors:
Nasser Barabi, Oksana Kryachek, Joven R. Tienzo, Chee Wah Ho
Abstract: The present invention relates to systems and methods for preventing over pressurization in a fluid management system used in an integrated circuit (IC) device tester. The prevention of the over pressurization in the fluid management system is based on the use of a pressure relief valve coupled to the fluid management system.
Type:
Grant
Filed:
July 1, 2016
Date of Patent:
February 2, 2021
Assignee:
ESSAI, INC.
Inventors:
Nasser Barabi, Chee Wah Ho, Joven R Tienzo, Oksana Kryachek, Elena V. Nazarov
Abstract: A spring probe contactor includes an angled spring probe configuration that causes the tips of the spring probes to “swipe” the contact pads/solder balls of an IC device under test as the contacts are made. The angulation of the spring probes permit penetration through foreign material layers on the pad/ball surfaces with less contact force.
Type:
Grant
Filed:
September 18, 2017
Date of Patent:
November 19, 2019
Assignee:
ESSAI, INC.
Inventors:
Nasser Barabi, Oksana Kryachek, Chee-Wah Ho
Abstract: A thermal control unit used to maintain a set point temperature on an integrated circuit device under test, has at least one cooling plate configured to facilitate the testing of integrated circuits where the device under test requires efficient cooling.
Type:
Grant
Filed:
April 22, 2016
Date of Patent:
November 13, 2018
Assignee:
Essai, Inc.
Inventors:
Nasser Barabi, Chee Wah Ho, Joven R. Tienzo, Oksana Kryachek, Elena V. Nazarov
Abstract: In one embodiment of the present invention, a test probe assembly for testing packaged integrated circuit (IC) devices includes a plurality of probes, a pad and a PCB/interposer. The plurality of probes is configured to repeatedly maintain reliable electrical contact with a corresponding plurality of DUT contacts when under a compliant force. The pad provides mechanical support and/or electric coupling for the plurality of probes. In turn, the PCB/interposer supports the pad. In some embodiments, the plurality of probes includes a hard core material such as diamond. In other embodiments, the surface of the probes is hardened.
Type:
Grant
Filed:
July 27, 2015
Date of Patent:
October 9, 2018
Assignee:
ESSAI, INC.
Inventors:
Nasser Barabi, Hans Dieter Huber, Joven R. Tienzo, Chee Wah Ho
Abstract: A spring probe contactor includes an angled spring probe configuration that causes the tips of the spring probes to “swipe” the contact pads/solder balls of an IC device under test as the contacts are made. The angulation of the spring probes permit penetration through foreign material layers on the pad/ball surfaces with less contact force.
Type:
Application
Filed:
September 18, 2017
Publication date:
June 21, 2018
Applicant:
ESSAI, INC.
Inventors:
Nasser Barabi, Oksana Kryachek, Chee-Wah Ho
Abstract: A laminated heater socket useful in association with an integrated circuit (IC) device tester is having a socket with an embedded integrated heater. This laminated heater socket configuration allows for good thermal conductivity and better electrical signal transmission specially for testing high-speed integrated circuits.
Type:
Grant
Filed:
March 28, 2015
Date of Patent:
October 31, 2017
Assignee:
Essai, Inc.
Inventors:
Nasser Barabi, Chee Wah Ho, Joven R. Tienzo, Oksana Kryachek, Elena V. Nazarov
Abstract: A spring probe contactor includes an angled spring probe configuration that causes the tips of the spring probes to “swipe” the contact pads/solder balls of an IC device under test as the contacts are made. The angulation of the spring probes permit penetration through foreign material layers on the pad/ball surfaces with less contact force.
Type:
Grant
Filed:
December 21, 2007
Date of Patent:
September 19, 2017
Assignee:
Essai, Inc.
Inventors:
Nasser Barabi, Oksana Kryachek, Ho Chee-Wah
Abstract: A convex testing stack useful in association with a thermal control unit (TCU) that may be used to maintain a set point temperature for testing of a convex IC device under test (DUT) is configured to preserve the convex shape of the DUT.
Type:
Grant
Filed:
February 14, 2014
Date of Patent:
January 31, 2017
Assignee:
Essai, Inc.
Inventors:
Nasser Barabi, Chee Wah Ho, Joven R. Tienzo, Oksana Kryachek, Elena V. Nazarov
Abstract: A test pusher assembly, useful in association with a thermal control unit used to maintain a set point temperature on an integrated circuit device under test, is provided with ejection mechanisms configured to facilitate the disengagement of the DUT at the end of the test. One example of the ejection mechanisms is to provide the substrate pusher assembly with spring-loaded pins that can push the substrate of the DUT away from the pedestal at the end of the test. Another example of the ejection mechanisms is to use a pressurized fluid that can push the substrate of the DUT away from the pedestal at the end of the test.
Type:
Grant
Filed:
August 23, 2013
Date of Patent:
November 15, 2016
Assignee:
Essai, Inc.
Inventors:
Nasser Barabi, Chee Wah Ho, Joven R. Tienzo, Oksana Kryachek, Elena V. Nazarov
Abstract: The present invention relates to systems and methods for preventing over pressurization in a fluid management system used in an integrated circuit (IC) device tester. The prevention of the over pressurization in the fluid management system is based on the use of a pressure relief valve coupled to the fluid management system.
Type:
Grant
Filed:
October 28, 2014
Date of Patent:
July 5, 2016
Assignee:
Essai, Inc.
Inventors:
Nasser Barabi, Chee Wah Ho, Joven R. Tienzo, Oksana Kryachek, Elena V. Nazarov
Abstract: A test socket assembly, useful in association with a thermal control unit (TCU) used to maintain a set point temperature on an IC device under test, has alignment holes with bushings that are secured within the alignment holes by using retaining pins. The retaining pins can be easily screwed in and out of the socket. This provision allows the bushings to be replaced easily as they get worn out or deformed from repeated testing.
Type:
Grant
Filed:
July 12, 2013
Date of Patent:
March 8, 2016
Assignee:
Essai, Inc.
Inventors:
Nasser Barabi, Chee Wah Ho, Joven R. Tienzo, Oksana Kryachek, Elena V. Nazarov
Abstract: A test socket assembly, useful in association with a thermal control unit used to maintain a set point temperature on an IC device under test, has at least one compliant pedestal is configured to facilitate the testing of integrated circuits where the device under test comprises a substrate having multiple IC chips with different heights and testing requirements.
Type:
Grant
Filed:
July 3, 2013
Date of Patent:
January 5, 2016
Assignee:
Essai, Inc.
Inventors:
Nasser Barabi, Chee Wah Ho, Joven R. Tienzo, Oksana Kryachek, Elena V. Nazarov
Abstract: A universal spring contact pin for use in an IC test Socket includes a depressible probe member at one end and a fixed probe member at the other end. The fixed probe member preferably has a projection length chosen to allow z-axis loading of different surface mount package types within the same test socket. It also can have a relatively large tip angle which preferably terminates at a relatively sharp termination point. Preferably, the tip angle is about 90 degrees and the radius of the termination point of the tip is about 0.001 inches (0.0254 millimeters) or less.
Abstract: An integrated circuit (IC) device tester maintains a set point temperature on an IC device under test (DUT) having a die attached to a substrate. The tester includes a thermal control unit and a fluid management system configured to supply the thermal control unit with fluids for pneumatic actuation, cooling, and condensation abating. The tester can includes a box enclosing the thermal control unit thereby providing a substantially isolated dry environment during low humidity testing of the DUT. The heat exchange plate may include an inner structure for thermal conductivity enhancement.
Type:
Grant
Filed:
March 14, 2013
Date of Patent:
April 14, 2015
Assignee:
Essai, Inc.
Inventors:
Nasser Barabi, Chee Wah Ho, Joven R. Tienzo, Oksana Kryachek, Elena V. Nazarov
Abstract: A device tester for an IC device under test (DUT), the DUT having a substrate and an attached die. The device tester includes a thermal control unit and a test socket assembly which conforms to the DUT's profile. The thermal control unit includes a pedestal assembly, a heater having a fuse coupled to a heating element, a substrate pusher, and a force distributor for distributing force between the pedestal assembly and the substrate pusher. The test socket assembly includes a socket insert that supports and also conforms to the DUT's profile.
Type:
Grant
Filed:
July 30, 2012
Date of Patent:
March 17, 2015
Assignee:
Essai, Inc.
Inventors:
Nasser Barabi, Chee Wah Ho, Joven R. Tienzo, Oksana Kryachek, Elena V. Nazarov
Abstract: A convex testing stack useful in association with a thermal control unit (TCU) that may be used to maintain a set point temperature for testing of a convex IC device under test (DUT) is configured to preserve the convex shape of the DUT.
Type:
Application
Filed:
February 14, 2014
Publication date:
August 21, 2014
Applicant:
ESSAI, INC.
Inventors:
Nasser Barabi, Chee Wah Ho, Joven R. Tienzo, Oksana Kryachek, Elena V. Nazarov
Abstract: A test pusher assembly, useful in association with a thermal control unit used to maintain a set point temperature on an integrated circuit device under test, is provided with ejection mechanisms configured to facilitate the disengagement of the DUT at the end of the test. One example of the ejection mechanisms is to provide the substrate pusher assembly with spring-loaded pins that can push the substrate of the DUT away from the pedestal at the end of the test. Another example of the ejection mechanisms is to use a pressurized fluid that can push the substrate of the DUT away from the pedestal at the end of the test.
Type:
Application
Filed:
August 23, 2013
Publication date:
February 27, 2014
Applicant:
ESSAI, INC.
Inventors:
Nasser Barabi, Chee Wah Ho, Joven R. Tienzo, Oksana Kryachek, Elena V. Nazarov