Patents Assigned to Etani Electronics Co., Ltd.
  • Patent number: 7787635
    Abstract: Resonant frequencies f2 and f3 detected in a resonant space are determined as center frequencies of a dip. Based on measurement values at a speaker and a microphone in the resonant space, a basic amplitude frequency characteristic Ca and a target amplitude frequency characteristic Cd are found. A smoothness degree on a frequency axis is larger in the target amplitude frequency characteristic Cd than the basic amplitude frequency characteristic Ca. A damping level and quality factor of the dip are determined based on a difference between the basic amplitude frequency characteristic Ca and the target amplitude frequency characteristic Cd in the center frequencies f2 and f3 of the dip and frequencies near the center frequencies.
    Type: Grant
    Filed: February 24, 2004
    Date of Patent: August 31, 2010
    Assignees: Toa Corporation, Etani Electronics Co., Ltd.
    Inventors: Daisuke Higashihara, Shokichiro Hino, Koichi Tsuchiya, Tomohiko Endo
  • Patent number: 7260227
    Abstract: A device 1 for measuring a propagation time of a sound wave comprises a sound source means 11 and a calculation means 12. The sound source means 11 outputs a time stretched pulse as a sound source signal input to a speaker 3. The calculation means 12 calculates a cross-correlation function of the time stretched pulse and the sound signal which is output from the speaker 3 and is received in a microphone 4. Based on the cross-correlation function, the propagation time of the sound wave between the speaker 3 and the microphone 4 is found.
    Type: Grant
    Filed: December 9, 2003
    Date of Patent: August 21, 2007
    Assignees: Etani Electronics Co., Ltd., TOA Corporation
    Inventors: Daisuke Higashihara, Shokichiro Hino, Koichi Tsuchiya, Tomohiko Endo
  • Publication number: 20060251264
    Abstract: Resonant frequencies f2 and f3 detected in a resonant space are determined as center frequencies of a dip. Based on measurement values at a speaker and a microphone in the resonant space, a basic amplitude frequency characteristic Ca and a target amplitude frequency characteristic Cd are found. A smoothness degree on a frequency axis is larger in the target amplitude frequency characteristic Cd than the basic amplitude frequency characteristic Ca. A damping level and quality factor of the dip are determined based on a difference between the basic amplitude frequency characteristic Ca and the target amplitude frequency characteristic Cd in the center frequencies f2 and f3 of the dip and frequencies near the center frequencies.
    Type: Application
    Filed: February 24, 2004
    Publication date: November 9, 2006
    Applicants: TOA CORPORATION, ETANI ELECTRONICS CO., LTD.
    Inventors: Daisuke Higashihara, Shokichiro Hino, Koichi Tsuchiya, Tomohiko Endo
  • Publication number: 20060140414
    Abstract: A device 1 for measuring a propagation time of a sound wave comprises a sound source means 11 and a calculation means 12. The sound source means 11 outputs a time stretched pulse as a sound source signal input to a speaker 3. The calculation means 12 calculates a cross-correlation function of the time stretched pulse and the sound signal which is output from the speaker 3 and is received in a microphone 4. Based on the cross-correlation function, the propagation time of the sound wave between the speaker 3 and the microphone 4 is found.
    Type: Application
    Filed: December 9, 2003
    Publication date: June 29, 2006
    Applicants: TOA CORPORATION, ETANI ELECTRONICS CO., LTD.
    Inventors: Daisuke Higashihara, Shokichiro Hino, Koichi Tsuchiya, Tomohiko Endo