Patents Assigned to ETS-LINDGREN, INC.
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Patent number: 12025643Abstract: A method, system and apparatus for compensating for non-ideal isotropic behavior of a field probe are disclosed. A method includes, during a calibration procedure, for each of a plurality of positions of the field probe relative to a source, each position denoted by a set of angles (?,?), performing the following steps: measuring a field by the sensors of the probe, storing the measurements and the set of angles (?,?) for each measurement, computing a correction factor for the set of angles (?,?) based on the measurement, and storing the correction factors. During a measurement procedure, each sensor measures a component of the field. A set of angles is determined based on the sensor measurements, and a correction factor is determined based on the set of angles. The correction factor may then be multiplied by the sensor measurements to obtain the corrected field measurements.Type: GrantFiled: November 15, 2022Date of Patent: July 2, 2024Assignee: ETS Lindgren Inc.Inventor: Zhong Chen
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Patent number: 11678469Abstract: An ADA compliant shielded door is disclosed. According to one aspect, a door is configured to create a radio frequency (RF) seal when the door is sealed so that RF energy is restricting from passing through a gap between an outer periphery of the door and a door frame when the door is sealed. The door includes: at least one knife edge along at least part of the outer periphery of the door, each knife edge configured to project into a channel of a door frame in a direction parallel to a face of the door when the door is sealed. The door also includes at least one contact element along a length of a knife edge, the at least one contact element being configured to make electrical contact with a channel wall of a channel of the door frame when the knife edge projects into the channel.Type: GrantFiled: January 11, 2022Date of Patent: June 13, 2023Assignee: ETS-Lindgren Inc.Inventor: Brian Adair Rodgers
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Patent number: 11525852Abstract: A method, system and apparatus for compensating for non-ideal isotropic behavior of a field probe are disclosed. A method includes, during a calibration procedure, for each of a plurality of positions of the field probe relative to a source, each position denoted by a set of angles (?, ?), performing the following steps: measuring a field by the sensors of the probe, storing the measurements and the set of angles (?, ?) for each measurement, computing a correction factor for the set of angles (?, ?) based on the measurement, and storing the correction factors. During a measurement procedure, each sensor measures a component of the field. A set of angles is determined based on the sensor measurements, and a correction factor is determined based on the set of angles. The correction factor may then be multiplied by the sensor measurements to obtain the corrected field measurements.Type: GrantFiled: May 13, 2019Date of Patent: December 13, 2022Assignee: ETS-Lindgren, Inc.Inventor: Zhong Chen
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Patent number: 11362741Abstract: A method and system for measuring a device under test are disclosed. In some embodiments, a method of implementing a measurement system is provided. The method includes providing a plurality of nodes, each node including a combination of a communication tester configured to generate a communication signal and a channel emulator configured to emulate a channel, and providing a user interface configured to enable a user to control at least one of the plurality of nodes.Type: GrantFiled: October 8, 2020Date of Patent: June 14, 2022Assignee: ETS-Lindgren, Inc.Inventor: Michael David Foegelle
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Patent number: 11302316Abstract: A method, system and apparatus for implementation and use of voice activated laboratory environments (VALET) are disclosed. According to one aspect, a VALET controls a first instrument in a first location, and has, in acoustic proximity to the first location, an audio interface configured to receive voice commands, to enunciate responses to the voice commands, and to transmit a first signal responsive to a first voice command to an intermediary location. The VALET also includes a computer configured to receive a computer instruction from the intermediary location, the computer instruction configuring the computer to select and issue an instrument command to cause the first instrument to effectuate the voice command.Type: GrantFiled: July 30, 2018Date of Patent: April 12, 2022Assignee: ETS-Lindgren, Inc.Inventors: Michael Duane Christopher, Radhika Kozhikodakatha Menon
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Patent number: 11252850Abstract: Door sealing systems for providing an RF seal to a door to an enclosure such as an anechoic chamber are disclosed. According to one aspect, a door sealing system includes a door having an outer periphery and a plurality of extendable and retractable knife edges along at least a portion of the outer periphery. The door sealing system includes a door frame having a plurality of channels corresponding to the plurality of knife edges, each knife edge projecting outward in a direction parallel to a face of the door and into the corresponding channels when the door is in a sealed position. Further, the door sealing system may include channels in the door frame along which knife edges of the door frame move.Type: GrantFiled: September 4, 2020Date of Patent: February 15, 2022Assignee: ETS-Lindgren Inc.Inventor: Brian Adair Rodgers
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Patent number: 10841017Abstract: A method and system for measuring a device under test are disclosed. In some embodiments, a method of implementing a measurement system is provided. The method includes providing a plurality of nodes, each node including a combination of a communication tester configured to generate a communication signal and a channel emulator configured to emulate a channel, and providing a user interface configured to enable a user to control at least one of the plurality of nodes.Type: GrantFiled: February 18, 2020Date of Patent: November 17, 2020Assignee: ETS-Lindgren, Inc.Inventor: Michael David Foegelle
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Patent number: 10816584Abstract: A method and system for processing finite frequency domain data to which a time gating process is to be applied to improve performance of signal processing equipment and to facilitate complex time gating while suppressing edge effects. According to one aspect, a method for improved processing of a finite frequency signal by signal processing equipment to suppress edge effects arising from a time gating process is provided. The method includes padding the finite frequency signal outside a frequency range with samples derived from an extrapolation process to produce an extended signal having samples inside and outside the frequency range of the finite signal. The method further includes applying a time gating process to the extended signal to exclude signals occurring outside a time interval and to produce a time gated signal with suppressed edge effects.Type: GrantFiled: December 4, 2017Date of Patent: October 27, 2020Assignee: ETS-Lindgren, Inc.Inventors: Zhong Chen, Zubiao Xiong
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Patent number: 10725081Abstract: According to some embodiments, a system is provided for simulating a cluster of reflections. The system includes an array of antenna elements distributed in space over a solid angle having an angular spread. The solid angle is substantially less than a full sphere and each antenna element has a spatial orientation. The system also includes a variable path simulator connected to the antenna elements and configured to apply one of excitations to the antenna elements and weights to signals from the antenna elements. The variable path simulator enables simulation of a near field arising from a cluster of reflections of a multipath environment.Type: GrantFiled: April 8, 2016Date of Patent: July 28, 2020Assignee: ETS-Lindgren, Inc.Inventor: Michael Foegelle
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Patent number: 10594411Abstract: A method and system for measuring a device under test are disclosed. In some embodiments, a method of implementing a measurement system is provided. The method includes providing a plurality of nodes, each node including a combination of a communication tester configured to generate a communication signal and a channel emulator configured to emulate a channel, and providing a user interface configured to enable a user to control at least one of the plurality of nodes.Type: GrantFiled: June 15, 2018Date of Patent: March 17, 2020Assignee: ETS-Lindgren, Inc.Inventor: Michael David Foegelle
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Patent number: 10581538Abstract: In some embodiments, an electromagnetic measurement system to test a device under test, DUT, in a chamber is provided. Within the chamber, for each of at least one emulated channel, a first emulator core is configured to introduce an impairment in each of at least one transmit signal to produce an impaired signal, and a transmitter is configured to convert the impaired signal to a radio frequency, RF, signal to be transmitted by an antenna.Type: GrantFiled: July 28, 2016Date of Patent: March 3, 2020Assignee: ETS-Lindgren, Inc.Inventor: Michael David Foegelle
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Patent number: 10542498Abstract: Methods, tests systems and computers for controlling power delivered to a test volume are provided. According to one aspect, an electromagnetic test system has at least one operational path having a channel emulator output, an amplifier, an attenuator and an antenna. A method includes, for a given desired output power level, C, setting a channel emulator output power to a power level B, and setting the attenuator to a setting A, such that C is a function of B and A. In such embodiments, the attenuation A is calculated based on an upper limit output power of the channel emulator and the desired output power C.Type: GrantFiled: April 11, 2018Date of Patent: January 21, 2020Assignee: ETS-Lindgren, Inc.Inventor: Michael David Foegelle
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Patent number: 10484110Abstract: In some embodiments, a positioning system is configured to position a plurality of antennas about a device under test (DUT). According to one embodiment, a positioning system includes a first positioner configured to hold a DUT and to provide motion of the DUT about a first axis, and a second positioner configured to hold a first antenna and to provide motion of the first antenna about a second axis.Type: GrantFiled: May 16, 2019Date of Patent: November 19, 2019Assignee: ETS-Lindgren, Inc.Inventors: Jari Vikstedt, Michael David Foegelle
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Patent number: 10470135Abstract: Methods, tests systems and computers for controlling power delivered to a test volume are provided. According to one aspect, an electromagnetic test system has at least one operational path having a channel emulator output, an amplifier, an attenuator and an antenna. A method includes, for a given desired output power level, C, setting a channel emulator output power to a power level B, and setting the attenuator to a setting A, such that C is a function of B and A. In such embodiments, the attenuation A may be calculated based on an upper limit output power of the channel emulator and the desired output power C.Type: GrantFiled: February 28, 2019Date of Patent: November 5, 2019Assignee: ETS-Lindgren, Inc.Inventor: Michael David Foegelle
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Patent number: 10382148Abstract: Some embodiments include a system for simulating electromagnetic environments that includes a channel emulator having a plurality of outputs, each output associated with a different operational path. Each operational path has a power amplifier, an antenna and a first coupling mechanism. The power amplifier is coupled to an output of the channel emulator. The antenna is in communication with a test region of the apparatus. The first coupling mechanism simultaneously couples power to the antenna and to a first measurement path when the operational path is coupled to the test region, so that a calibration state of the operational path can be determined and adjusted without interruption of a signal coupled to the antenna in the operational path.Type: GrantFiled: April 30, 2018Date of Patent: August 13, 2019Assignee: ETS-Lindgren, Inc.Inventor: Michael David Foegelle
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Patent number: 10333632Abstract: In some embodiments, a positioning system is configured to position a plurality of antennas about a device under test (DUT). According to one embodiment, a positioning system includes a first positioner configured to hold a DUT and to provide motion of the DUT about a first axis, and a second positioner configured to hold a first antenna and to provide motion of the first antenna about a second axis.Type: GrantFiled: February 8, 2018Date of Patent: June 25, 2019Assignee: ETS-Lindgren, Inc.Inventors: Jari Vikstedt, Michael David Foegelle
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Patent number: 10306494Abstract: A method and system for measurement of a device under test (DUT) are provided. According to one aspect, a system includes a first positioner having a first antenna and a second positioner having a second antenna. The system also includes circuitry configured to cause the first antenna to radiate a test signal to the DUT and to implement one of a probing mode and an interference mode. The probing mode causes, for each of at least one position of the first antenna, the second antenna to receive a signal from the DUT at each of the second set of positions of the second antenna. The interfering mode causes, for each of at least one position of the first antenna, the second antenna to transmit an interfering signal to the DUT at each of the second set of positions of the second antenna.Type: GrantFiled: August 29, 2018Date of Patent: May 28, 2019Assignee: ETS-Lindgren, Inc.Inventor: Michael Foegelle
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Patent number: 10230479Abstract: A method and system for measuring a device under test are disclosed. In some embodiments, an electromagnetic measurement system to test a device under test, DUT is provided. The system includes, at a central location, an emulator core configured to introduce an impairment in each of at least one transmit signal to produce a digital impaired signal; and at a remote location, a transmitter configured to convert the digital impaired signal to an analog RF signal.Type: GrantFiled: July 28, 2016Date of Patent: March 12, 2019Assignee: ETS-Lindgren Inc.Inventor: Michael David Foegelle
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Patent number: 10145804Abstract: A method and system for selectively varying the performance of a test chamber are disclosed. According to one aspect, the performance is affected by a variable absorbing structure of the test chamber. The absorbing structure enables selective exposure of absorbing material to achieve a specific performance.Type: GrantFiled: July 21, 2017Date of Patent: December 4, 2018Assignee: ETS-Lindgren Inc.Inventors: Bryan Howard Sayler, Michael David Foegelle, Garth Anthony D'Abreu
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Patent number: 10085162Abstract: A method and system for measurement of a device under test (DUT) are provided. According to one aspect, a system includes a first positioner having a first antenna and a second positioner having a second antenna. The system also includes circuitry configured to cause the first antenna to radiate a test signal to the DUT and to implement one of a probing mode and an interference mode. The probing mode causes, for each of at least one position of the first antenna, the second antenna to receive a signal from the DUT at each of the second set of positions of the second antenna. The interfering mode causes, for each of at least one position of the first antenna, the second antenna to transmit an interfering signal to the DUT at each of the second set of positions of the second antenna.Type: GrantFiled: March 7, 2017Date of Patent: September 25, 2018Assignee: ETS-Lindgren, Inc.Inventor: Michael Foegelle