Patents Assigned to ETS-LINDGREN, INC.
  • Patent number: 10841017
    Abstract: A method and system for measuring a device under test are disclosed. In some embodiments, a method of implementing a measurement system is provided. The method includes providing a plurality of nodes, each node including a combination of a communication tester configured to generate a communication signal and a channel emulator configured to emulate a channel, and providing a user interface configured to enable a user to control at least one of the plurality of nodes.
    Type: Grant
    Filed: February 18, 2020
    Date of Patent: November 17, 2020
    Assignee: ETS-Lindgren, Inc.
    Inventor: Michael David Foegelle
  • Patent number: 10816584
    Abstract: A method and system for processing finite frequency domain data to which a time gating process is to be applied to improve performance of signal processing equipment and to facilitate complex time gating while suppressing edge effects. According to one aspect, a method for improved processing of a finite frequency signal by signal processing equipment to suppress edge effects arising from a time gating process is provided. The method includes padding the finite frequency signal outside a frequency range with samples derived from an extrapolation process to produce an extended signal having samples inside and outside the frequency range of the finite signal. The method further includes applying a time gating process to the extended signal to exclude signals occurring outside a time interval and to produce a time gated signal with suppressed edge effects.
    Type: Grant
    Filed: December 4, 2017
    Date of Patent: October 27, 2020
    Assignee: ETS-Lindgren, Inc.
    Inventors: Zhong Chen, Zubiao Xiong
  • Patent number: 10725081
    Abstract: According to some embodiments, a system is provided for simulating a cluster of reflections. The system includes an array of antenna elements distributed in space over a solid angle having an angular spread. The solid angle is substantially less than a full sphere and each antenna element has a spatial orientation. The system also includes a variable path simulator connected to the antenna elements and configured to apply one of excitations to the antenna elements and weights to signals from the antenna elements. The variable path simulator enables simulation of a near field arising from a cluster of reflections of a multipath environment.
    Type: Grant
    Filed: April 8, 2016
    Date of Patent: July 28, 2020
    Assignee: ETS-Lindgren, Inc.
    Inventor: Michael Foegelle
  • Patent number: 10594411
    Abstract: A method and system for measuring a device under test are disclosed. In some embodiments, a method of implementing a measurement system is provided. The method includes providing a plurality of nodes, each node including a combination of a communication tester configured to generate a communication signal and a channel emulator configured to emulate a channel, and providing a user interface configured to enable a user to control at least one of the plurality of nodes.
    Type: Grant
    Filed: June 15, 2018
    Date of Patent: March 17, 2020
    Assignee: ETS-Lindgren, Inc.
    Inventor: Michael David Foegelle
  • Patent number: 10581538
    Abstract: In some embodiments, an electromagnetic measurement system to test a device under test, DUT, in a chamber is provided. Within the chamber, for each of at least one emulated channel, a first emulator core is configured to introduce an impairment in each of at least one transmit signal to produce an impaired signal, and a transmitter is configured to convert the impaired signal to a radio frequency, RF, signal to be transmitted by an antenna.
    Type: Grant
    Filed: July 28, 2016
    Date of Patent: March 3, 2020
    Assignee: ETS-Lindgren, Inc.
    Inventor: Michael David Foegelle
  • Patent number: 10542498
    Abstract: Methods, tests systems and computers for controlling power delivered to a test volume are provided. According to one aspect, an electromagnetic test system has at least one operational path having a channel emulator output, an amplifier, an attenuator and an antenna. A method includes, for a given desired output power level, C, setting a channel emulator output power to a power level B, and setting the attenuator to a setting A, such that C is a function of B and A. In such embodiments, the attenuation A is calculated based on an upper limit output power of the channel emulator and the desired output power C.
    Type: Grant
    Filed: April 11, 2018
    Date of Patent: January 21, 2020
    Assignee: ETS-Lindgren, Inc.
    Inventor: Michael David Foegelle
  • Patent number: 10484110
    Abstract: In some embodiments, a positioning system is configured to position a plurality of antennas about a device under test (DUT). According to one embodiment, a positioning system includes a first positioner configured to hold a DUT and to provide motion of the DUT about a first axis, and a second positioner configured to hold a first antenna and to provide motion of the first antenna about a second axis.
    Type: Grant
    Filed: May 16, 2019
    Date of Patent: November 19, 2019
    Assignee: ETS-Lindgren, Inc.
    Inventors: Jari Vikstedt, Michael David Foegelle
  • Patent number: 10470135
    Abstract: Methods, tests systems and computers for controlling power delivered to a test volume are provided. According to one aspect, an electromagnetic test system has at least one operational path having a channel emulator output, an amplifier, an attenuator and an antenna. A method includes, for a given desired output power level, C, setting a channel emulator output power to a power level B, and setting the attenuator to a setting A, such that C is a function of B and A. In such embodiments, the attenuation A may be calculated based on an upper limit output power of the channel emulator and the desired output power C.
    Type: Grant
    Filed: February 28, 2019
    Date of Patent: November 5, 2019
    Assignee: ETS-Lindgren, Inc.
    Inventor: Michael David Foegelle
  • Patent number: 10382148
    Abstract: Some embodiments include a system for simulating electromagnetic environments that includes a channel emulator having a plurality of outputs, each output associated with a different operational path. Each operational path has a power amplifier, an antenna and a first coupling mechanism. The power amplifier is coupled to an output of the channel emulator. The antenna is in communication with a test region of the apparatus. The first coupling mechanism simultaneously couples power to the antenna and to a first measurement path when the operational path is coupled to the test region, so that a calibration state of the operational path can be determined and adjusted without interruption of a signal coupled to the antenna in the operational path.
    Type: Grant
    Filed: April 30, 2018
    Date of Patent: August 13, 2019
    Assignee: ETS-Lindgren, Inc.
    Inventor: Michael David Foegelle
  • Patent number: 10333632
    Abstract: In some embodiments, a positioning system is configured to position a plurality of antennas about a device under test (DUT). According to one embodiment, a positioning system includes a first positioner configured to hold a DUT and to provide motion of the DUT about a first axis, and a second positioner configured to hold a first antenna and to provide motion of the first antenna about a second axis.
    Type: Grant
    Filed: February 8, 2018
    Date of Patent: June 25, 2019
    Assignee: ETS-Lindgren, Inc.
    Inventors: Jari Vikstedt, Michael David Foegelle
  • Patent number: 10306494
    Abstract: A method and system for measurement of a device under test (DUT) are provided. According to one aspect, a system includes a first positioner having a first antenna and a second positioner having a second antenna. The system also includes circuitry configured to cause the first antenna to radiate a test signal to the DUT and to implement one of a probing mode and an interference mode. The probing mode causes, for each of at least one position of the first antenna, the second antenna to receive a signal from the DUT at each of the second set of positions of the second antenna. The interfering mode causes, for each of at least one position of the first antenna, the second antenna to transmit an interfering signal to the DUT at each of the second set of positions of the second antenna.
    Type: Grant
    Filed: August 29, 2018
    Date of Patent: May 28, 2019
    Assignee: ETS-Lindgren, Inc.
    Inventor: Michael Foegelle
  • Patent number: 10230479
    Abstract: A method and system for measuring a device under test are disclosed. In some embodiments, an electromagnetic measurement system to test a device under test, DUT is provided. The system includes, at a central location, an emulator core configured to introduce an impairment in each of at least one transmit signal to produce a digital impaired signal; and at a remote location, a transmitter configured to convert the digital impaired signal to an analog RF signal.
    Type: Grant
    Filed: July 28, 2016
    Date of Patent: March 12, 2019
    Assignee: ETS-Lindgren Inc.
    Inventor: Michael David Foegelle
  • Patent number: 10145804
    Abstract: A method and system for selectively varying the performance of a test chamber are disclosed. According to one aspect, the performance is affected by a variable absorbing structure of the test chamber. The absorbing structure enables selective exposure of absorbing material to achieve a specific performance.
    Type: Grant
    Filed: July 21, 2017
    Date of Patent: December 4, 2018
    Assignee: ETS-Lindgren Inc.
    Inventors: Bryan Howard Sayler, Michael David Foegelle, Garth Anthony D'Abreu
  • Patent number: 10085162
    Abstract: A method and system for measurement of a device under test (DUT) are provided. According to one aspect, a system includes a first positioner having a first antenna and a second positioner having a second antenna. The system also includes circuitry configured to cause the first antenna to radiate a test signal to the DUT and to implement one of a probing mode and an interference mode. The probing mode causes, for each of at least one position of the first antenna, the second antenna to receive a signal from the DUT at each of the second set of positions of the second antenna. The interfering mode causes, for each of at least one position of the first antenna, the second antenna to transmit an interfering signal to the DUT at each of the second set of positions of the second antenna.
    Type: Grant
    Filed: March 7, 2017
    Date of Patent: September 25, 2018
    Assignee: ETS-Lindgren, Inc.
    Inventor: Michael Foegelle
  • Patent number: 10014962
    Abstract: A method and system for measuring a device under test are disclosed. Some embodiments include a distributed channel emulation system implementing a downlink channel, including at a central location, an emulator core configured to introduce an impairment in each of at least one transmit signal to produce at least one impaired signal for each of at least one emulated channel. The system includes, at a remote location, for each of at the least one emulated channel, an up-converter configured to up-convert an impaired signal of the emulated channel to produce a radio frequency, RF, signal.
    Type: Grant
    Filed: July 28, 2016
    Date of Patent: July 3, 2018
    Assignee: ETS-Lindgren, Inc.
    Inventor: Michael David Foegelle
  • Patent number: 10009122
    Abstract: A method and system for measuring a device under test are disclosed. In some embodiments, a method of implementing a measurement system is provided. The method includes providing a plurality of nodes, each node including a combination of a communication tester configured to generate a communication signal and a channel emulator configured to emulate a channel, and providing a user interface configured to enable a user to control at least one of the plurality of nodes.
    Type: Grant
    Filed: July 28, 2016
    Date of Patent: June 26, 2018
    Assignee: ETS-Lindgren Inc.
    Inventor: Michael David Foegelle
  • Patent number: 9979496
    Abstract: Some embodiments include a system for simulating electromagnetic environments that includes a channel emulator having a plurality of outputs, each output associated with a different operational path. Each operational path has a power amplifier, an antenna and a first coupling mechanism. The power amplifier is coupled to an output of the channel emulator. The antenna is in communication with a test region of the apparatus. The first coupling mechanism simultaneously couples power to the antenna and to a first measurement path when the operational path is coupled to the test region, so that a calibration state of the operational path can be determined and adjusted without interruption of a signal coupled to the antenna in the operational path.
    Type: Grant
    Filed: December 8, 2015
    Date of Patent: May 22, 2018
    Assignee: ETS- Lindgren Inc.
    Inventor: Michael David Foegelle
  • Patent number: 9912418
    Abstract: In some embodiments, an electromagnetic measurement system to perform radio frequency, RF, downlink testing of a device under test, DUT, in a chamber is provided. Exterior to the chamber is an emulator core configured to introduce an impairment in each of at least one transmit signal to produce at least one impaired signal for each of at least one emulated channel. Within the chamber, for each of the at least one emulated channel, an up-converter is configured to up-convert an impaired signal of the emulated channel to produce a radio frequency, RF, signal.
    Type: Grant
    Filed: July 28, 2016
    Date of Patent: March 6, 2018
    Assignee: ETS-Lindgren Inc.
    Inventor: Michael David Foegelle
  • Patent number: 9799317
    Abstract: An acoustic chamber with low frequency outer wall transmissivity is provided. According to one aspect, an acoustic chamber has an inner wall encompassing an interior of the acoustic chamber and configured to allow acoustic energy to penetrate the inner wall. The acoustic chamber also has an outer wall configured to allow low frequency acoustic energy that penetrates the inner wall to penetrate the outer wall and leave the acoustic chamber.
    Type: Grant
    Filed: April 7, 2016
    Date of Patent: October 24, 2017
    Assignee: ETS-Lindgren Inc.
    Inventor: Douglas Winker
  • Patent number: 9746423
    Abstract: A method and system for selectively varying the performance of a test chamber are disclosed. According to one aspect, the performance is affected by a variable absorbing structure of the test chamber. The absorbing structure enables selective exposure of absorbing material to achieve a specific performance.
    Type: Grant
    Filed: May 15, 2014
    Date of Patent: August 29, 2017
    Assignee: ETS-LINDGREN INC.
    Inventors: Bryan Howard Sayler, Michael David Foegelle, Garth Anthony D'Abreu