Patents Assigned to Eun Jin Sohn Patent & Law Office
  • Patent number: 7324273
    Abstract: The present invention relates to confocal self-interference microscopy. The confocal self-interference microscopy further includes a first polarizer for polarizing reflected or fluorescent light from a specimen, a first birefringence wave plate for separating the light from the first polarizer into two beams along a polarizing direction, a second polarizer for polarizing the two beams from the first birefringence wave plate, a second birefringence wave plate for separating the two beams from the second polarizer into four beams along the polarizing direction, and a third polarizer for polarizing the four beams from the second birefringence wave plate, in the existing confocal microscopy.
    Type: Grant
    Filed: June 1, 2006
    Date of Patent: January 29, 2008
    Assignee: Eun Jin Sohn Patent & Law Office
    Inventors: Dae Gab Gweon, Dong Kyun Kang