Abstract: The invention relates to a microscope in which a layer of the sample is illuminated by a plurality of thin strips of light (11) passed through a grid (34) and the sample is viewed (5) perpendicular to the plane of the strips of light. To record the image, the object (4) is displaced through the strips of light (11). At least three different images of the objects (4) are made at different phase angles. The images can be combined to form a single combined image.

Abstract: The invention relates to a microscope in which a layer of the sample is illuminated by a plurality of thin strips of light (11) passed through a grid (34) and the sample is viewed (5) perpendicular to the plane of the strips of light. To record the image, the object (4) is displaced through the strips of light (11). At least three different images of the objects (4) are made at different phase angles. The images can be combined to form a single combined image.

Abstract: The invention relates to a microscope in which a layer of the sample is illuminated by a plurality of thin strips of light (11) passed through a grid (34) and the sample is viewed (5) perpendicular to the plane of the strips of light. To record the image, the object (4) is displaced through the strips of light (11). At least three different images of the objects (4) are made at different phase angles. The images can be combined to form a single combined image.

Abstract: The invention relates to a microscope in which a layer of the sample is illuminated by a plurality of thin strips of light (11) passed through a grid (34) and the sample is viewed (5) perpendicular to the plane of the strips of light. To record the image, the object (4) is displaced through the strips of light (11). At least three different images of the objects (4) are made at different phase angles. The images can be combined to form a single combined image.

Abstract: The invention relates to a microscope, in which a layer of the sample is illuminated by a thin strip of light (11) and the sample is viewed (5) perpendicular to the plane of the strip of light. The depth of the strip of light (11) thus essentially determines the depth of focus of the system. To record the image, the object (4) is displaced through the strip of light (11), which remains fixed in relation to the detector (8), and fluorescent and/or diffused light is captured by a planar detector. Objects (4) that absorb or diffuse a large amount of light are viewed from several spatial directions. The three-dimensional images, which are captured from each direction can be combined retrospectively to form one image, in which the data is weighted according to its resolution. The resolution of the combined image is then dominated by the lateral resolution of the individual images.

Abstract: The invention relates to a microscope, in which a layer of the sample is illuminated by a thin strip of light (11) and the sample is viewed (5) perpendicular to the plane of the strip of light. The depth of the strip of light (11) thus essentially determines the depth of focus of the system. To record the image, the object (4) is displaced through the strip of light (11), which remains fixed in relation to the detector (8), and fluorescent and/or diffused light is captured by a planar detector. Objects (4) that absorb or diffuse a large amount of light are viewed from several spatial directions. The three-dimensional images, which are captured from each direction can be combined retrospectively to form one image, in which the data is weighted according to its resolution. The resolution of the combined image is then dominated by the lateral resolution of the individual images.

Abstract: The invention relates to a microscope in which a layer of the sample is illuminated by a plurality of thin strips of light (11) passed through a grid (34) and the sample is viewed (5) perpendicular to the plane of the strips of light. To record the image, the object (4) is displaced through the strips of light (11). At least three different images of the objects (4) are made at different phase angles. The images can be combined to form a single combined image.

Abstract: The present invention relates to a sample holder for a mass spectrometer onto which a mixture of silicone and graphite is applied.

Abstract: The invention provides a probe measuring device for effecting local measurements referring to a sample, having a first probe and a second probe, a measurement condition adjustment arrangement adapted to commonly adjust a first measurement condition of the first probe with respect to a sample or a reference surface and a second measurement condition of the second probe with respect to a sample or a reference surface, a detection arrangement having a first detection arrangement associated with the first probe adapted to independently detect first measurement data referring to local measurements effected by the first probe and a second detection arrangement associated with the second probe adapted to independently detect second measurement data referring to local measurements effected by the second probe. Also provided are methods for effecting local measurements and local manipulations using multiple probes.

Abstract: A device is proposed for the precision rotation of samples on a diffractometer, especially for X-ray or synchrotron radiation diffraction experiments, comprising: a centering element (26) which is held at one end of a motor-driven rotating shaft (22) and can be displaced in a plane orthogonal to the axis of rotation of the rotating shaft (22), a sample holder (30) which is fixed to the centering element (26) or integral with the latter for holding a sample (32) substantially centrally with respect to the axis of rotation in an X-ray or synchrotron radiation beam (S), at least one micrometer finger (36) which is arranged in the region of the centering element (26) and can be positioned orthogonally with respect to the axis of rotation of the rotating shaft (22) by means of a micrometer finger drive device.