Abstract: To analyze an electric component in depth, provision is made to submit the aforementioned component to focused laser radiation. It is shown that by modifying the altitude of the focus in the component, some internal parts of the aforementioned component can be characterized more easily.
Type:
Grant
Filed:
April 18, 2007
Date of Patent:
October 16, 2012
Assignee:
European Aeronautic Defence and Space Compai