Abstract: To analyse an electric component in depth, provision is made to submit said component to focused laser radiation. It is shown that by modifying the altitude of the focus in the component, some internal parts of said component can be characterized more easily.
Type:
Application
Filed:
April 18, 2007
Publication date:
June 17, 2010
Applicant:
Eurpoean Aeronautic Defence and Space Company EADA France