Patents Assigned to EVENT CAPTURE SYSTEMS, INC.
  • Publication number: 20120147177
    Abstract: A method for identifying defects in a web of material is provided. The method may include monitoring one or more characteristics of a web translating along a travel path. The one or more characteristics may include one of position, speed of travel, and direction of travel. The method may include identifying a candidate for a defect by detecting one or more deviations in the web at a first time frame. The method may include monitoring one or more characteristics of the candidate for a defect at one or more subsequent time frames. The method may include determining whether the candidate is a defect by comparing the one or more characteristics of the candidate at one or more subsequent time frames to the one or more characteristics of the web. A related system is also provided.
    Type: Application
    Filed: December 12, 2011
    Publication date: June 14, 2012
    Applicant: EVENT CAPTURE SYSTEMS, INC.
    Inventor: Eddy C. Tam