Abstract: An electrical probe having a spring loaded moving contact in which a compression spring and the inner end of the contact are confined within a tubular member. Low resistance is maintained between the moving contact and the tubular member by applying a lubricant to the coil spring. The lubricant is a synthetic grease having a synthetic oil base and a lithium hydroxy stearate mixed in the oil base. Because of the high viscosity and high shear strength of the lubricant, it prevents the buildup of particulate matter which tends to increase the resistivity of the sliding interface between the contact and the tubular member.

Abstract: A video process control system for identifying, inspecting, or measuring machined parts or the like in which each part is placed in the viewing field of a video camera. A pixel scan of the camera image is converted to a set of binary bits, one bit for pixel, and the bits corresponding to one complete frame are stored in a frame memory. A plurality of digital control words stored in a memory each define a selected area or "window" in the field of view a predetermined number of bits of one value. Each word in memory is used to select a group of the stored pixel bits corresponding to the defined window. A counter counts the number of bits of one value in the select group, and their count is compared with desired number of bits defined by the same control word. The analysis is repeated for a plurality of the control words to get a complete measurement of a part.

Abstract: An actuable interface assembly for a connector to be mounted relative to an interface assembly. The connector comprises a first array of electrical interface contacts. The actuable interface assembly includes a second array of electrical interface contacts each for connection to a corresponding contact in the first array and carrier means for mounting the second array of contacts. The contacts in the first and second arrays are axially elongated to an exposed and free end. The first and second arrays of contacts are located, when the connector is mounted relative to the interface assembly, in mirror image to each other with each contact in the second array spaced apart from the corresponding contact in the first array in both axial and transverse directions by the same amount and in the same direction. Operable means is movable between a non actuated and an actuated condition.

Abstract: A vacuum test head has an easily changeable test pin programming plate for contacting a planar unit under test. A plurality of contact probes are mounted in a base. Each contact probe has a spring loaded first end located at, and urged away from, a first side of the base and a second end located at a second side of the base. A mounting member, mounted for reciprocal movement relative to the first side of the base, has an opening therethrough providing access to the first ends of the contact probes and a plate support facing away from the base. A programming plate has mounted therein a plurality of axially elongated and rigid test pins which are axially movable relative to the programming plate. The total number of test pins is less in number than the contact probes. Each test pin has a first end located on a first side of the programming plate and a second end located on a second side of the programming plate.

Abstract: An interchangeable test head for a vacuum fixture for testing a loaded planar test member. The test head includes support means comprising a planar support surface. A platform is in opposed relation to the planar support surface and has a planar test member surface. Resilient seal means is affixed to the platform and is flared outwardly around the perimeter of the platform to a free edge which engages and forms a vacuum seal with the planar support surface thereby providing a vacuum chamber between the platform and the support means. Stop means limits the deactuated position of the platform so that the entire free edge of the seal means remains in engagement with the planar support surface. Vacuum in the chamber causes the platform to move along the path from the deactuated position to the actuated position. A plurality of spaced spring probes is mounted on the support means. A plurality of openings is provided through the platform for drawing a test member against the spring probes.

Abstract: A straight through electrical spring probe has an elongated resilient thin wall tubular member slit along the entire length thereof and comprises, in the wall, a transversely enlarged portion and a transversely inwardly extending stop. An elongated plunger member is telescoped in the tubular member and comprises a probe head exposed at one end, a connector portion exposed at the other end of the tubular member and a stop therebetween. A compression spring urges the telescoped plunger member and tubular member in opposite directions until the stops in the tubular member and plunger member are in engagement.

Abstract: A low insertion force connector assembly comprising a number of contact modules. Each contact module includes a nonconductive contact carrier housing having oppositely facing sides and comprising, extending between the oppositely facing sides, a pair of cam openings and a notch. Included in each contact carrier housing is at least one electrical spring contact cantilevered in the contact carrier housing and extending adjacent one of the openings and along a side of the notch. The contact modules are aligned with the notches in a common row and the openings in first and second aligned rows. Also included in the connector assembly are first and second cam actuating means extending through, respectively, the first and second rows of openings. Each cam actuating means is adapted for actuating all of the cantilevered contacts adjacent the openings in the corresponding row into contact with a member inserted into the aligned notches.

Abstract: An apparatus for making electrical contact with plural test points on one of two oppositely facing sides of a planar test member. A test member support has a test member test location. A door is provided for opening and closing access to the test location. The door and support form, when the door is closed, a substantially closed cavity therebetween encompassing the test location. The door and the support each comprise one of two opposing walls of the cavity. An array of relatively spaced electrically conductive probes are mounted in and extend through the wall of the support. Each of the probes has an end exposed exterior to the cavity and a probe head electrically connected on the opposite end which is exposed in the cavity. The probe heads are each resiliently biased away from the wall of the support to a substantially common plane and are movable under pressure towards the wall of the support.

Abstract: The present invention provides method and apparatus for testing a network, such as a printed circuit board, to check whether it conforms to its design as to having a plurality of network nodes and a predetermined node-connection pattern defining a division of the network nodes into a plurality of groups. In a conforming network, each network node is connected in common to all other network nodes in its group, and is isolated from the network nodes in each other group. In accordance with the invention, one of the network nodes is selected to serve initially as a present FROM node. There is thereafter selected repeatedly, from the network nodes that have not previously served as a present FROM node, a network node to serve temporarily as a present FROM node.

Abstract: Apparatus is disclosed for making electrical contact with test points, such as in a printed circuit, on a test member. A mounting is provided for the test member at a location for test. A plurality of spaced conductive probe heads each have, oppositely facing, a contact side and a bearing side and are arranged in an array corresponding to the test points on the test member. The contact sides are adjacent the test member location. At least one resilient member has one side adjacent the bearing sides of the probe heads. A backup plate has a bearing side adjacent the opposite side of the resilient member from the probe heads. Pressure is applied through the backup plate and the resilient member to the bearing side of the probe heads forcing the contact sides of the probe heads in the direction of the test member location.

Abstract: A miniature low resistance telescoping spring probe includes telescoping tubular housing and inner plunger. Both the housing and plunger are elongated and of an electrically conductive material. The plunger has a probe head external to the housing. The inner wall of the housing and the outer wall of the plunger are engaged and concentric, providing a sliding electrical connection and a bearing therebetween. A coil compression spring urges the housing and plunger in longitudinally opposite directions. A separate low electrical resistance wiper spring member is affixed to the plunger. A substantially constant low resistance electrical connection is provided between the wiper spring member and the plunger. The wiper spring member has at least one longitudinally extending leg spring loaded outwardly into engagement with the inside wall of the housing.

Abstract: A body is provided including opposite ends, opposite sides and a top and a bottom. A pair of upstanding levers are pivotally secured, intermediate their upper and lower end portions, to opposite end portions of the body for limited oscillation about axes transverse to the levers and the body. Spring structure is provided for yieldingly biasing the upper ends of the levers apart and the body includes opposite side rows of elongated longitudinally spaced relatively insulated contacts projecting endwise outwardly and downwardly from opposite side portions of the bottom of the body. The lower ends of the levers include coacting opposite side depending conductive hooks opening longitudinally of the body toward the remote levers and corresponding side hooks of the levers are spaced apart in planes spaced slightly inwardly of the corresponding side contacts.

Abstract: Suction pressure is applied to a desirable location by a valve assembly having a flat gate element elastically deformed by a selectively controlled cam actuator to unblock a flow passage between inlet and manifold portions of the valve body. A sealing gasket is peripherally mounted on the manifold portion in enclosing relation to an area larger than the flow area of the inlet portion. A vent passage to the manifold portion is unblocked when the gate element is closed, to re-pressurize the manifold chamber.