Patents Assigned to EVERFINE PHOTO-E-INFORMATION CO., LTD
  • Patent number: 10495511
    Abstract: The present invitation relates to an optical radiation measurement method based on light filter units, comprising the steps of: 1) providing characteristic filter units and correction light filter units in front of detection units to obtain multiple measured response values of an object to be detected; and, 2) selecting one or more sampling regions within a waveband to be detected, and calculating, according to a corresponding simultaneous expression/equation system of the measured response values, a spectral power distribution within the waveband to be detected. In this method, by introducing a small number of correction light filter units, the spectral power distribution within the entire waveband to be detected can be obtained without using a large number of narrow waveband color filters. In addition, a light radiation measurement apparatus is disclosed.
    Type: Grant
    Filed: April 15, 2015
    Date of Patent: December 3, 2019
    Assignee: EVERFINE PHOTO-E-INFORMATION CO., LTD.
    Inventor: Jiangen Pan
  • Patent number: 10393655
    Abstract: This invention relates to an apparatus for retro-reflection measurement. By using the one or more sampling devices each consists of a holed mirror and an circular aperture, and corresponding one or more measuring devices, it realize the retro-reflection measurement in one or more observation angles at one time. By flexibly selecting the size of the circular apertures and holed mirrors, it can accurately adjust the measuring annular bands and corresponding observation angles. Without any other intermediate devices, it can realize complete annular band of light measurement which ensures the measurement accuracy. At the same time, filters and monitor device can be set flexibly to realize various measurement functions. It has the advantages of speed measurement, high accuracy, small volume, wide application, comprehensive functions, and can be widely applied in laboratory, industrial production line and field measurement etc.
    Type: Grant
    Filed: April 8, 2015
    Date of Patent: August 27, 2019
    Assignee: EVERFINE PHOTO-E-INFORMATION CO., LTD.
    Inventor: Jiangen Pan
  • Publication number: 20170261429
    Abstract: This invention relates to an apparatus for retro-reflection measurement. By using the one or more sampling devices each consists of a holed mirror and an circular aperture, and corresponding one or more measuring devices, it realize the retro-reflection measurement in one or more observation angles at one time. By flexibly selecting the size of the circular apertures and holed mirrors, it can accurately adjust the measuring annular bands and corresponding observation angles. Without any other intermediate devices, it can realize complete annular band of light measurement which ensures the measurement accuracy. At the same time, filters and monitor device can be set flexibly to realize various measurement functions. It has the advantages of speed measurement, high accuracy, small volume, wide application, comprehensive functions, and can be widely applied in laboratory, industrial production line and field measurement etc.
    Type: Application
    Filed: April 8, 2015
    Publication date: September 14, 2017
    Applicant: EVERFINE PHOTO-E-INFORMATION CO., LTD.
    Inventor: Jiangen PAN
  • Publication number: 20170241833
    Abstract: The present invitation relates to an optical radiation measurement method based on light filter units, comprising the steps of: 1) providing characteristic filter units and correction light filter units in front of detection units to obtain multiple measured response values of an object to be detected; and, 2) selecting one or more sampling regions within a waveband to be detected, and calculating, according to a corresponding simultaneous expression/equation system of the measured response values, a spectral power distribution within the waveband to be detected. In this method, by introducing a small number of correction light filter units, the spectral power distribution within the entire waveband to be detected can be obtained without using a large number of narrow waveband color filters. In addition, a light radiation measurement apparatus is disclosed.
    Type: Application
    Filed: April 15, 2015
    Publication date: August 24, 2017
    Applicant: EVERFINE PHOTO-E-INFORMATION CO., LTD
    Inventors: Jiangen PAN, Jing YANG, Chao ZHOU