Patents Assigned to Everlight Chemical Industrial Corporation
  • Patent number: 11639578
    Abstract: A pretreatment liquid for water-based pigment textile printing is disclosed, which includes: 1 wt % to 30 wt % of aqueous non-ionic polyurethane; 1 wt % to 20 wt % of a metal salt; 0.1 wt % to 10 wt % of a melamine resin; and the balance being a solvent. A method for forming a pattern on a textile using the aforesaid pretreatment liquid is also disclosed.
    Type: Grant
    Filed: April 10, 2020
    Date of Patent: May 2, 2023
    Assignee: EVERLIGHT CHEMICAL INDUSTRIAL CORPORATION
    Inventors: Ya-Huang Huang, Ko-Chou Chen, Hsiao-San Chen, Chien-Yi Liao, Chien-Ming Chen
  • Patent number: 10093816
    Abstract: The present invention is related to a novel high fixation ink composition for digital textile printing, which comprises: (A) at least one reactive dye compound with two reactive groups in an amount of 1% to 50% by weight; (B) an organic buffer in an amount of 0.05% to 10% by weight; (C) a humectant in an amount of 10% to 50% by weight; and (D) a solvent in remaining amount. When the aforesaid ink composition is applied in digital textile printing, fixation rate of dye on fabrics is high.
    Type: Grant
    Filed: April 26, 2016
    Date of Patent: October 9, 2018
    Assignee: EVERLIGHT CHEMICAL INDUSTRIAL CORPORATION
    Inventors: Hsiao-San Chen, Chuan-Hsi Lee, Chien-Yu Chen, Tz-Yi Wu, Hsuan Yang
  • Patent number: 10005958
    Abstract: A polyurethane-based UV absorber, obtained by reacting a UV absorber having a reactive hydrogen with a polyisocyanate and a diol or polyol; wherein the weight average molecular weight of the polyurethane-based UV absorber is in a range of 10,000 to 200,000.
    Type: Grant
    Filed: June 1, 2017
    Date of Patent: June 26, 2018
    Assignee: EVERLIGHT CHEMICAL INDUSTRIAL CORPORATION
    Inventors: Mei-Ting Lu, Huei-Jen Yang, Yuan-Pin Pan, Tzu-Heng Ko, Der-Gun Chou, Bao-Kun Lai
  • Patent number: 9683202
    Abstract: The present invention provides a softener composition, which attaches onto the fabric during the rinsing process, and thus enables the fabric to have the anti-ultraviolet function. The softener composition comprises (A) 0.05 to 50 wt % of polyurethane-based polymeric UV light absorber, (B) 2 to 15 wt % of cationic softener, and (C) 35 to 97 wt % of water.
    Type: Grant
    Filed: August 11, 2015
    Date of Patent: June 20, 2017
    Assignee: EVERLIGHT CHEMICAL INDUSTRIAL CORPORATION
    Inventors: Mei-Ting Lu, Tzu-Heng Ko, Yuan-Pin Pan, Der-Gun Chou, Shu-Chu Chou
  • Patent number: 9505704
    Abstract: The present invention relates to a method for treprostinil diethanolamine synthesis. The present invention also relates to a novel intermediate used in the method for treprostinil diethanolamine synthesis. The novel intermediate is shown in the following formula (II): wherein R1 and R2 are described in the description.
    Type: Grant
    Filed: November 6, 2015
    Date of Patent: November 29, 2016
    Assignee: EVERLIGHT CHEMICAL INDUSTRIAL CORPORATION
    Inventors: Shijay Gao, Chia-Chung Tsai, Tsai-Yung Chou, Yu-Min Chiang, Chi-Hsiang Yao
  • Patent number: 9170491
    Abstract: The present invention relates to a negative-type photoresist composition for thick film, comprising: (A) 20 to 50 wt % of an alkali-soluble resin which is polymerized from a plurality of kinds of monomers, wherein the monomers includes compounds represented by formulas (1A) and (1B), and based on the weight ratio of the monomers to the alkali-soluble resin, the sum of the formula (1A) compound and the formula (1B) compound are 20 to 60%, and X of the formula (1A) and (1B) may be independently H, methyl or ethyl. (B) 10 to 30 wt % of crosslinker which can be a bisphenol fluorene derivative monomer having at least one ethylenically unsaturated double bond; (C) 5 to 15 wt % of photo initiator; and (D) residual solvent. The present invention also relates to use of the above-mentioned negative-type photoresist compound for thick film.
    Type: Grant
    Filed: March 24, 2014
    Date of Patent: October 27, 2015
    Assignee: EVERLIGHT CHEMICAL INDUSTRIAL CORPORATION
    Inventors: Yi Jing Chen, Nai Tien Chou, Hsin Yi Huang, Yen-Cheng Li
  • Publication number: 20150118617
    Abstract: The present invention relates to a negative-type photoresist composition for thick film, comprising: (A) 20 to 50 wt % of an alkali-soluble resin which is polymerized from a plurality of kinds of monomers, wherein the monomers includes compounds represented by formulas (1A) and (1B), and based on the weight ratio of the monomers to the alkali-soluble resin, the sum of the formula (1A) compound and the formula (1B) compound are 20 to 60%, and X of the formula (1A) and (1B) may be independently H, methyl or ethyl. (B) 10 to 30 wt % of crosslinker which can be a bisphenol fluorene derivative monomer having at least one ethylenically unsaturated double bond; (C) 5 to 15 wt % of photo initiator; and (D) residual solvent. The present invention also relates to use of the above-mentioned negative-type photoresist compound for thick film.
    Type: Application
    Filed: March 24, 2014
    Publication date: April 30, 2015
    Applicant: Everlight Chemical Industrial Corporation
    Inventors: Yi Jing CHEN, Nai Tien CHOU, Hsin Yi HUANG
  • Patent number: 8816084
    Abstract: The present invention relates to a X-form crystal of 17-cyclopropylmethyl-3,14?-dihydroxy-4,5?-epoxy-6?-[N-methyl-trans-3-(3-furyl)acrylamido]morphinan hydrochloride and the manufacturing method thereof, wherein the X-form crystal of the compound has characteristic diffraction peaks at positions of 2? of 13.6°(±0.2°), 17.2°(±0.2°), 19.1°(±0.2°), 23.2°(±0.2°), and 23.8°(±0.2°) in a powder X-ray diffraction pattern thereof. The present invention also relates to a pharmaceutical composition comprising the above-mentioned X-form crystal of morphinan derivative hydrochloride.
    Type: Grant
    Filed: January 28, 2014
    Date of Patent: August 26, 2014
    Assignee: Everlight Chemical Industrial Corporation
    Inventors: Yuan-Yi Wang, Yu-Kai Li, Yu-Ting Su, Chia-Chen Hung, Chi-Hsiang Yao
  • Patent number: 8647807
    Abstract: A photosensitive resin composition comprising: a vinyl-based polymer (I) obtained by polymerizing a monomer mixture containing a monomer (a) having a phenolic hydroxyl group; a vinyl-based polymer (II) obtained by polymerizing a monomer mixture containing a carboxyl group-containing vinyl monomer (b), and having a weight average molecular weight of 20,000 to 100,000, provided that the vinyl-based polymer (I) is excluded; a quinonediazide compound (III); and a compound (IV) represented by following formula (5). [In the formula, Y is a hydrocarbon group of 1 to 6 carbon atoms; l and m are each independently an integer of 1 to 3; n is 1 or 2; p and q are each independently 0 or 1.].
    Type: Grant
    Filed: December 27, 2010
    Date of Patent: February 11, 2014
    Assignees: Micro Process Inc., Everlight Chemical Industrial Corporation, Mitsubishi Rayon Co., Ltd.
    Inventors: Akifumi Ueda, Hidetaka Nakagawara, Kazuo Watanabe, Shigeki Watanabe, Wei Jen Lan, Chao Wen Lin
  • Patent number: 8647806
    Abstract: The present invention is related to a photosensitive resin composition containing: a vinyl-based copolymer (I) obtained by polymerizing a monomer mixture containing a monomer (a) having a phenolic hydroxyl group and a carboxyl group-containing vinyl monomer (b); a quinonediazide compound (II) and a compound (III) represented by the following formula (5), and to a photosensitive dry film and a method for forming a patter by using the photosensitive resin composition.
    Type: Grant
    Filed: December 27, 2010
    Date of Patent: February 11, 2014
    Assignees: Micro Process Inc, Everlight Chemical Industrial Corporation, Mitsubishi Rayon Co., Ltd.
    Inventors: Akifumi Ueda, Hidetaka Nakagawara, Kazuo Watanabe, Shigeki Watanabe, Wei Jen Lan, Chao Wen Lin
  • Patent number: 8512421
    Abstract: A polyurethane derivative and a composition thereof are disclosed. The polyurethane derivative of the present invention has a structure of formula (I). The polyurethane derivative and the composition thereof can be used for increasing light fastness.
    Type: Grant
    Filed: September 18, 2012
    Date of Patent: August 20, 2013
    Assignee: Everlight Chemical Industrial Corporation
    Inventors: Hsin-Ying Lu, Sheue-Rong Lee, Tzu-Heng Ko, Hsiang-Lin Chiang, Der-Gun Chou
  • Publication number: 20130067664
    Abstract: A polyurethane derivative and a composition thereof are disclosed. The polyurethane derivative of the present invention has a structure of formula (I). The polyurethane derivative and the composition thereof can be used for increasing light fastness.
    Type: Application
    Filed: September 18, 2012
    Publication date: March 21, 2013
    Applicant: EVERLIGHT CHEMICAL INDUSTRIAL CORPORATION
    Inventor: Everlight Chemical Industrial Corporation
  • Publication number: 20130004895
    Abstract: A photosensitive resin composition comprising: a vinyl-based polymer (I) obtained by polymerizing a monomer mixture containing a monomer (a) having a phenolic hydroxyl group; a vinyl-based polymer (II) obtained by polymerizing a monomer mixture containing a carboxyl group-containing vinyl monomer (b), and having a weight average molecular weight of 20,000 to 100,000, provided that the vinyl-based polymer (I) is excluded; a quinonediazide compound (III); and a compound (IV) represented by following formula (5). [In the formula, Y is a hydrocarbon group of 1 to 6 carbon atoms; 1 and m are each independently an integer of 1 to 3; n is 1 or 2; p and q are each independently 0 or 1.
    Type: Application
    Filed: December 27, 2010
    Publication date: January 3, 2013
    Applicants: MICRO PROCESS INC., Mitsubishi Rayon Co., Ltd., EVERLIGHT CHEMICAL INDUSTRIAL CORPORATION
    Inventors: Akifumi Ueda, Hidetaka Nakagawara, Kazuo Watanabe, Shigeki Watanabe, Weiren Lan, Zhaowen Lin
  • Publication number: 20120301830
    Abstract: The present invention is related to a photosensitive resin composition containing: a vinyl-based copolymer (I) obtained by polymerizing a monomer mixture containing a monomer (a) having a phenolic hydroxyl group and a carboxyl group-containing vinyl monomer (b); a quinonediazide compound (II) and a compound (III) represented by the following formula (5), and to a photosensitive dry film and a method for forming a patter by using the photosensitive resin composition.
    Type: Application
    Filed: December 27, 2010
    Publication date: November 29, 2012
    Applicants: MICRO PROCESS INC., Mitsubishi Rayon Co., Ltd., EVERLIGHT CHEMICAL INDUSTRIAL CORPORATION
    Inventors: Akifumi Ueda, Hidetaka Nakagawara, Kazuo Watanabe, Shigeki Watanabe, Weiren Lan, Zhaowen Lin
  • Patent number: 6573024
    Abstract: The present invention provides a novel ammonium salt of an organic acid. When the salt is used as a base additive for a chemically amplified resist, the environmental stability of the resist can be enhanced, and the T-top phenomenon can be effectively prevented. In addition, the line width change caused by acid diffusion can be prevented, and the E0 value of the resist can be decreased.
    Type: Grant
    Filed: March 9, 2001
    Date of Patent: June 3, 2003
    Assignees: Industrial Technology Research Institute, Everlight Chemical Industrial Corporation
    Inventors: Sheng-Yueh Chang, Jian-Hong Chen, Ting-Chun Liu, Tzu-Yu Lin, Wen-Yuang Tsai
  • Patent number: 6538086
    Abstract: The present invention relates to a polymer with at least one pericyclic protective group such as 2-methyl-2-bicyclo[2,2,1]heptanyl. The resist composition containing the polymer can be used as a chemically amplified resist and exhibits strong etch resistance. In addition, a line-and-space pattern of 0.1 &mgr;m pitch can be resolved successfully using the resist composition.
    Type: Grant
    Filed: February 28, 2000
    Date of Patent: March 25, 2003
    Assignees: Industrial Technology Research Institute, Everlight Chemical Industrial Corporation
    Inventors: Sheng-Yueh Chang, Bang-Chein Ho, Jui-Fa Chang, Jian-Hong Chen, Ming-Chia Tai
  • Patent number: 6303725
    Abstract: The present invention provides a cyclic dione polymer, which is a homopolymer or a copolymer of a cyclic dione monomer selected from those represented by formulae (I) and (II) wherein A and B may be the same or different and are independently selected from the group consisting of halogen, hydrogen, C3-20 cyclic or pericyclic alkyl, C1-20 linear and branched alkyl, C6-20 aryl, C7-20 arylalkyl, C7-20 alkylaryl, silyl, alkylsilyl, germyl, alkylgermyl, alkoxycarbonyl, acyl, and a heterocylic group; or, A and B are linked together to form a C3-20 saturated or unsaturated cyclic hydrocarbon group or a substituted or unsubstituted heterocyclic group; C is selected from the group consisting of oxygen, sulfur, —CH2—, and —SiH2—, wherein each R1 is independently selected from C1-20 alkyl and phenyl.
    Type: Grant
    Filed: September 29, 2000
    Date of Patent: October 16, 2001
    Assignees: Industrial Technology Research Institute, Everlight Chemical Industrial Corporation
    Inventors: Sheng-Yueh Chang, Bang-Chein Ho, Jian-Hong Chen, Ting-Chun Liu, Tzu-Yu Lin
  • Patent number: 6207779
    Abstract: The present invention provides a ring-opened polymer, which is prepared by reacting at least one pericyclic olefin elected from those represented by formulae (I) and (II) through ring-opening metathesis polymerization wherein A and B may be the same or different and are independently selected from the group consisting of halogen, hydrogen, C3-20 cyclic or pericyclic alkyl, C1-20 linear and branched alkyl, C6-20 aryl, C7-20 arylalkyl, C7-20 alkylaryl, silyl, alkylsilyl, germyl, alkylgermyl, alkoxycarbonyl, acyl, and a heterocylic group; or, A and B are linked together to form a C3-20 saturated or unsaturated cyclic hydrocarbon group or a substituted or unsubstituted heterocyclic group; C is selected from the group consisting of oxygen, sulfur,  —CH2—, and —SiH2—, wherein each R1 is independently selected from C1-20 alkyl and phenyl; each R is independently selected from hydrogen, halogen, and C1-20 alkyl; and each n is an integer from 1 to 6
    Type: Grant
    Filed: December 17, 1998
    Date of Patent: March 27, 2001
    Assignees: Industrial Technology Research Institute, Everlight Chemical Industrial Corporation
    Inventors: Sheng-Yueh Chang, Bang-Chein Ho, Jian-Hong Chen, Tai-Sheng Yeh, Jui-Fa Chang
  • Patent number: 6197476
    Abstract: The present invention provides a cyclic dione polymer, which is a homopolymer or a copolymer of a cyclic dione monomer selected from those represented by formulae (I) and (II) wherein A and B may be the same or different and are independently selected from the group consisting of halogen, hydrogen, C3-20 cyclic or pericyclic alkyl, C1-20 linear and branched alkyl, C6-20 aryl, C7-20 arylalkyl, C7-20 alkylaryl, silyl, alkylsilyl, germyl, alkylgermyl, alkoxycarbonyl, acyl, and a heterocylic group; or, A and B are linked together to form a C3-20 saturated or unsaturated cyclic hydrocarbon group or a substituted or unsubstituted heterocyclic group; C is selected from the group consisting of oxygen, sulfur, wherein each R1 is independently selected from C1-20 alkyl and phenyl.
    Type: Grant
    Filed: December 17, 1998
    Date of Patent: March 6, 2001
    Assignee: Industrial Technology Research Institute Everlight Chemical Industrial Corporation
    Inventors: Sheng-Yueh Chang, Bang-Chein Ho, Jian-Hong Chen, Ting-Chun Liu, Tzu-Yu Lin