Abstract: Various devices and methods for non-destructive testing (NDT) are provided. For example, an NDT testing system may include a sensor for acquiring measurement data, a user interface, and a control circuit. The control circuit may obtain the measurement data and generate a measurement result and a measurement uncertainty contemporaneously with the acquisition. The user interface may display the measurement result and the measurement uncertainty.

Abstract: A full matrix capture (FMC) acoustic acquisition technique can be modified in a manner to compensate for one or more of variation from a nominal distance between an acoustic transducer array and the structure being scanned, or a variation from a nominal angle (e.g., inclination or declination) of the array surface with respect to the structure being scanned. Such modification can include determining incremental delay factors to be added or removed from nominal delay values in A-Scan data based on offset values corresponding to the transmit and receive transducer elements (or apertures) used for acquiring a particular A-Scan instance. The compensated A-Scan data in the FMC acquisition can then be used TFM imaging, for example.

Abstract: Disclosed is a system and method for ultrasonic measurement of the average diameter and surface profile of a tube. A calibration block is used to calibrate the average tube diameter, and a correction is applied to account for any temperature difference of the couplant between calibration and test measurements. By using a linear probe, or a single probe with a finely pitched helicoidal scan, errors in diameter measurement due to presence of surface pits may be compensated.

Abstract: A system comprises a server including a port, memory and processing circuitry. The port is configured to receive (i) a drawing file associated with an isometric drawing of an asset at an inspection site including indications of condition monitoring locations (CMLs) for the asset, and (ii) inspection measurement data for the asset, the inspection measurement data including inspection measurements associated with the CMLs. The memory is configured to store the drawing file and the inspection measurement data. The processing circuitry is configured to use the inspection data and the drawing file to generate, using the inspection measurement data and the drawing file, (i) survey image data for display and (ii) metadata for the survey image data, the metadata including survey image coordinates for the CMLs and the inspection measurements associated with the CMLs.

Abstract: An X-ray analyzer comprises at least one detector configured to detect a secondary X-ray from a test object irradiated by an X-ray source, and provide a corresponding energy signal; a temperature sensor configured to sense a temperature related to the detector; and a signal processor configured to process the energy signal and provide a temperature compensated output for an X-ray event.