Patents Assigned to EXFO Electro-Optical Engineering Inc.
  • Patent number: 7227645
    Abstract: Apparatus for measuring polarization mode dispersion (PMD) of a device, e.g. a waveguide, comprises a broadband light source (10,12) for passing polarized broadband light through the device (14), an interferometer (20) for dividing and recombining light that has passed through the device to form interferograms, a polarization separator (30) for receiving the light from the interferometer and separating such received light along first and second orthogonal Feb. 25, 2003 Feb.
    Type: Grant
    Filed: February 6, 2003
    Date of Patent: June 5, 2007
    Assignee: EXFO Electro-Optical Engineering Inc.
    Inventor: Normand Cyr
  • Patent number: 7187861
    Abstract: An instrument for measuring bidirectional optical signals propagating in an optical transmission path between elements one of which will not transmit if continuity of the transmission path is not maintained, for example a branch path between a central offices optical line terminal (OLT) and an end-user's optical network terminal (ONT), comprises first and second connector receptacles for connecting the instrument into the path, a 2×2 coupler (32) having first and second ports (28, 30) connected to the first and second connectors (22, 24), respectively, for completing the optical transmission path, a third port (36) for, outputting a portion of each optical signal received via the first port (28) and a fourth port (34) for outputting a portion of each optical signal received via the second port (30) Detectors (38, 42, 44) coupled to the third and fourth ports convert the optical signal portions into corresponding electrical signals, which are processed to provide the desired measurements.
    Type: Grant
    Filed: August 23, 2004
    Date of Patent: March 6, 2007
    Assignee: EXFO Electro-Optical Engineering Inc.
    Inventor: Bernard Ruchet
  • Patent number: 7167655
    Abstract: A measurement system for wide dynamic range operation in optical power measurement applications is disclosed. The system provides amplification over a wide dynamic range without glitch, signal loss or transient effect during range switch. This is achieved by combining first and second multi-gain photodiode amplifiers (10/1,10/2), with their input ports connected in common to receive the input signal from a photodiode, and by switching their gain settings to get continuous readings of a photodiode signal. More specifically, the gain setting of the first amplifier is changed only when the signal from the other amplifier is being output, and vice versa. Such an amplification system ensures a smooth transition within a wide dynamic range while monitoring various signal levels, e.g., monitoring processes with substantial variations of optical power from very high levels to very low levels.
    Type: Grant
    Filed: March 4, 2003
    Date of Patent: January 23, 2007
    Assignee: EXFO Electro-Optical Engineering Inc.
    Inventor: Christian Olivier
  • Patent number: 7116848
    Abstract: A polarization independent optical spectrum analyzer comprises a diffraction grating, input and output slit means and polarization-maintaining multi-pass optics for directing a light beam to and fro across the diffraction grating while maintaining its linear state of polarization. The optical spectrum analyzer further comprises a polarization control unit for decomposing a light beam for analysis into first and second beams having mutually orthogonal states of polarization (SOPs) and then adjusting one or both SOPs so that they are parallel to each other and to one of the dispersion plane of the diffraction grating which is rotated to select different wavelengths of the first and second light beams. The first and second light beams are passed across the diffraction grating repeatedly by multi-pass polarization-maintaining optics and are outputted and detected separately.
    Type: Grant
    Filed: November 15, 2004
    Date of Patent: October 3, 2006
    Assignee: EXFO Electro-Optical Engineering Inc.
    Inventors: Gang He, Daniel Gariépy, Gregory Walter Schinn
  • Patent number: 6992828
    Abstract: A uniform optical attenuation system for high power detection comprises a detector unit (11), a plurality of diffusing elements (14, 15, 16, 17) for receiving and diffusing input light and an apertured plate (18, 19) for limiting light received by the detection unit to a portion only of the light diffused by the diffusing arrangement. The plurality of diffusing elements comprise a first diffusing element (12) for receiving and diffusing an input light beam to provide a distributed light source for a subsequent one of the diffusing elements, and final one of the diffusing elements which directs diffused light towards the detection unit. The light detected by the detection unit (11, 18, 19) is substantially independent of variations in numerical aperture of the input light. Each diffusing element may be a diffusing surface, such as a ground glass or opal diffuser, which renders the system substantially independent of variations in optical properties due to heating effects caused by the high energy light.
    Type: Grant
    Filed: July 5, 2002
    Date of Patent: January 31, 2006
    Assignee: EXFO Electro-Optical Engineering Inc.
    Inventors: Gang He, Martin Lamonde
  • Patent number: 6930776
    Abstract: A dual-channel, double-filtering, multi-pass OSA having a narrow spectral linewidth response and high ORR comprises a diffraction grating (DG), two input ports (P1?, P1?) for directing first and second input light beams (LR, LT) onto the grating; a retroreflector (RAM1) for returning the dispersed light beams to the grating for dispersion again; two intermediate output ports (P2?, P2?) for receiving the twice-dispersed light beams; two secondary input ports (P3?, P3?) coupled to the intermediate output ports by polarization-maintaining waveguides (PMF2?, PMF2?) for directing the light beams onto the grating a third time, with their SOPs having a predetermined orientation relative to the SOPs of the first and second light beams when first incident upon the grating, the retroreflector (RAM1) returning the three-times-dispersed light beams to the grating for dispersion a fourth time; and two output ports (P4?, P4?) for receiving the light beams after dispersion the fourth time.
    Type: Grant
    Filed: July 24, 2003
    Date of Patent: August 16, 2005
    Assignee: EXFO Electro-Optical Engineering Inc.
    Inventors: Gang He, Daniel Gariépy
  • Patent number: 6856398
    Abstract: Apparatus for making wavelength-resolved polarimetric measurements comprises an interferometric source (10,12), for example a broadband source (10) and an optical interferometer unit (12), and a polarization generator unit (16) for generating different states of polarization of light received from the interferometric source and applying same to a device-under-test (30). A polarimeter unit (20) receives and polarimetrically-analyzes light from the device-under-test, converts the polarimetrically-analyzed light into electrical signals, and, using Fast Fourier Transform numerical analysis, computes therefrom the wavelength-resolved polarimetric measurements. Placing the optical interferometer unit (10,12) “upstream” not only of the device-under-test (30), but also of the polarisation generator unit (16), means that the latter substantially eliminates polarization dependent effects introduced by the former.
    Type: Grant
    Filed: October 23, 2002
    Date of Patent: February 15, 2005
    Assignee: EXFO Electro-Optical Engineering Inc.
    Inventor: Bernard Ruchet
  • Patent number: 6819429
    Abstract: A polarization independent optical spectrum analyzer comprises an inherently polarization sensitive angle-tuned filter element and polarization-maintaining multi-pass optics for directing a light beam to and fro through the tunable filter element while maintaining its linear state of polarization. The optical spectrum analyzer comprises such a tunable optical filter in combination with a polarization control unit for decomposing a light beam for analysis into first and second beams having mutually orthogonal states of polarization (SOPs) and then adjusting one or both SOPs so that they are parallel to each other and to one of the principal axes of the angle-tuned filter which selects different wavelengths of the first and second light beams. The first and second light beams are passed through the filter repeatedly by multi-pass polarization-maintaining optics.
    Type: Grant
    Filed: April 6, 2001
    Date of Patent: November 16, 2004
    Assignee: EXFO Electro-Optical Engineering Inc.
    Inventors: Gang He, Daniel Gariépy, Gregory Walter Schinn, Martin Lamonde
  • Patent number: 6762829
    Abstract: A property of a device that is dependent upon both wavelength and state of polarization is measured by; passing through the device an optical signal having its wavelength and SOP varied, the wavelength over a spectral range of the device and the SOP between four Mueller SOPs; measuring the insertion loss of the device for each of the four SOPS and at each wavelength; using the four insertion loss measurements for each of the four different states of polarization for each wavelength to compute the four elements of the first line of the Mueller matrix for each wavelength; and using the Mueller matrix elements, computing insertion loss variations for the device for a multiplicity of input states of polarization in addition to the four states of polarization for which the actual attenuation measurements were made and using the insertion loss variations to compute the polarization and wavelength dependent property.
    Type: Grant
    Filed: February 27, 2003
    Date of Patent: July 13, 2004
    Assignee: EXFO Electro-Optical Engineering Inc.
    Inventors: François Babin, Normand Cyr
  • Patent number: 6724469
    Abstract: In a method of polarization optical time-domain reflectometer (P-OTDR) for measuring a parameter of an optical transmission path, for example an optical fiber, by transmitting pulses of light into the path and measuring the state of polarization of backscattered light against distance, statistical analysis of the degree of polarization (DOP) of the backscattered signal is used to detect sections of an optical transmission path for which mode-coupling behaviour (long h) leads to high PMD. Preferably, successive DOP measurement are taken with different state of polarization, SOP, for the P-OTDR light source.
    Type: Grant
    Filed: March 14, 2003
    Date of Patent: April 20, 2004
    Assignee: Exfo Electro-Optical Engineering Inc.
    Inventor: Michel Leblanc
  • Patent number: 6636306
    Abstract: An optical spectrum analyzer comprises a diffraction grating (DG), a polarization decomposing unit (PDM) for decomposing the input light beam into first and second light beams having mutually-perpendicular linear states of polarization, and two output ports (FP2/1, FP2/2) each for receiving from the grating, substantially exclusively, a respective one of the polarized light beams (LT, LR) after diffraction by the diffraction grating (DG).
    Type: Grant
    Filed: January 4, 2001
    Date of Patent: October 21, 2003
    Assignee: EXFO Electro-Optical Engineering Inc.
    Inventors: Gang He, Daniel Gariépy, Gregory Walter Schinn
  • Patent number: 6621067
    Abstract: A photodetector device comprising a photosensitive detector (12; 96) and one or more interfaces (20′, 20″, 28, 98) between dissimilar media is configured so that a light beam (LB) for detection will pass through the interface(s) along a beam axis that is not normal to the interface(s). The deviation (&thgr;) from the normal will be such that polarization dependent transmission introduced at the interface(s) will compensate for inherent polarization dependency of the detector (12; 96). The deviation may be achieved by inclining the interface(s) relative to a predetermined direction along which the light beam will be incident. Where the photosensitive detector is in a housing (84) with a window (20) through which the light beam enters the housing, the housing can be tilted. In such as case, there are three interfaces, one (28; 98) at the surface of the detector (12; 96), and one at each surface (20′, 20″) of the window (20).
    Type: Grant
    Filed: March 2, 2001
    Date of Patent: September 16, 2003
    Assignee: EXFO Electro-Optical Engineering Inc.
    Inventors: Gang He, François Babin, Martin Tremblay, Marc Breton, Steeve Potvin, Gregory Walter Schinn
  • Patent number: 6612750
    Abstract: An adapter for receiving optical fiber connectors, of the type having an inner part suitable for receiving an internal connector carrying an internal optical fiber having an end ferrule, and having an outer part suitable for receiving an external connector having an external optical fiber with an end ferrule, is made suitable for use with different external connectors by having the outer part readily separable from the inner part. The parts have complementary engaging surfaces and cooperating engaging means which lock the two parts together upon relative rotation of one of the parts relative to the other through about a right angle. The usual alignment sleeve is carried by the outer part, and when this part has been separated from the inner part the internal fiber ferrule is accessible for cleaning.
    Type: Grant
    Filed: August 24, 1998
    Date of Patent: September 2, 2003
    Assignee: EXFO Electro-Optical Engineering Inc.
    Inventors: Stephen Vincent Bull, Steeve Potvin
  • Publication number: 20010030745
    Abstract: An optical spectrum analyzer comprises a diffraction grating (DG), a polarization decomposing unit (PDM) for decomposing the input light beam into first and second light beams having mutually-perpendicular linear states of polarization, and two output ports (FP2/1, FP2/2) each for receiving from the grating, substantially exclusively, a respective one of the polarized light beams (LT, LR) after diffraction by the diffraction grating (DG).
    Type: Application
    Filed: January 4, 2001
    Publication date: October 18, 2001
    Applicant: EXFO Electro-Optical Engineering Inc.
    Inventors: Gang He, Daniel Gariepy, Gregory Walter Schinn
  • Patent number: 6204924
    Abstract: Apparatus for measuring very low levels of polarization mode dispersion of optical devices, that is inexpensive, robust and portable, comprises a broadband source and a polarizer for directing substantially completely polarized broadband light into the device under test with the polarization in a plane substantially perpendicular to the propagation direction of the light. Light leaving the device is analyzed spectrally to produce a spectrum of intensity in dependence upon wavelength or frequency of such light for each of at least two mutually orthogonal polarization axes in a plane perpendicular to the propagation axis of the light leaving the device. The spectra are used to compute Stokes parameters s1, s2 and |s3| for each of a plurality of wavelengths within the bandwidth of the broadband light.
    Type: Grant
    Filed: February 23, 1999
    Date of Patent: March 20, 2001
    Assignee: EXFO Electro-Optical Engineering Inc.
    Inventor: Normand Cyr
  • Patent number: 5754284
    Abstract: An optical time domain reflectometer suitable for determining its front panel insertion loss comprises a four-port coupler having first and second ports connected to a light source and an optical detector, respectively, and third and fourth ports connected to a front panel connector and a reference reflector, respectively. In use, a fiber-under-test is connected to the front panel connector. The coupler splits light from the light source between the front panel connector and the reference reflector and couples light returning from the front panel connector and reflector to the detector. The optical path between the front panel connector and the coupler is longer than the optical path between the reference reflector and the coupler by such a distance that a Fresnel reflection pulse from the reference reflector, produced by a pulse emitted by the light source, will be received by the detector before a corresponding reflection pulse returned from the front panel connector.
    Type: Grant
    Filed: October 9, 1996
    Date of Patent: May 19, 1998
    Assignee: EXFO Electro-optical Engineering Inc.
    Inventors: Michel Leblanc, Robert Larose, Robert Tremblay
  • Patent number: 5305078
    Abstract: Attenuation of an optical fiber is measured by transmitting an optical signal having a predetermined wavelength to the fiber, and FSK modulating the optical signal with information identifying the wavelength and transmitted power of the optical signal. At a receiver, the optical signal is detected and the information is recovered by demodulation. Wavelength-dependent sensitivity information for the detector is read from a store in dependence upon the wavelength information and used to control the gain of an amplifier for amplifying a subsequently transmitted continuous wave optical signal used for attenuation measurement. The received power level of this optical signal is converted into a digital value and used with the transmitted power information to determine the fiber attenuation at the predetermined wavelength.
    Type: Grant
    Filed: January 21, 1992
    Date of Patent: April 19, 1994
    Assignee: EXFO Electro-optical Engineering Inc.
    Inventor: Joseph E. G. Lamonde