Abstract: A semiconductor device test apparatus for improving a loss rate of a test signal in testing a device under test is provided. The semiconductor device test apparatus includes a probe interface board, a pogo block disposed on the probe interface board and electrically connected to a device under test, an equipment board disposed under the probe interface board, an alternating current (AC) controller, transferring and receiving an AC signal for performing an AC test on at least one of the device under test and the pogo block, being mounted on the equipment board, and a physical layer equalizing (PLE) board disposed between the probe interface board and the equipment board, a first equalizing circuit, decreasing loss of the AC signal, being mounted on the PLE board.

Abstract: Disclosed is a storage test apparatus having a storage protocol matching device including an integrated protocol software unit and an integrated protocol hardware unit, in which, when an insertion of a storage is detected, a protocol configuration that matches a protocol of the storage is automatically set through a protocol switching, thereby enhancing the test efficiency.

Abstract: Disclosed is a storage test apparatus having a storage protocol matching device including an integrated protocol software unit and an integrated protocol hardware unit, in which, when an insertion of a storage is detected, a protocol configuration that matches a protocol of the storage is automatically set through a protocol switching, thereby enhancing the test efficiency.