Abstract: A method for manipulating a cryogenic specimen for subsequent examination includes mounting a cryogenic specimen on a work surface of a specimen holder and placing the specimen holder within a pumped cryostat chamber having a layer of cryogenic liquid therein. The cryostat chamber is vented and kept at low humidity in order to generate a cryogenic vapor layer above the cryogenic liquid so that the work surface of the specimen holder is within the cryogenic vapor layer and low humidity and inert environment. The cryogenic specimen in then manipulated to a specimen carrier contained on a different portion of the work surface while keeping the cryogenic specimen within the cryogenic vapor layer.

Abstract: A probe includes a solid elongate body disposed along a long axis of the probe and terminating in a probe tip, and a solid planar beveled surface at or adjacent an end of the probe tip formed at a non-zero beveled angle relative to a normal of the long axis of the probe, The solid planar beveled surface is configured to impart Van der Waals attractive force to a sample surface positioned immediately adjacent the solid beveled surface of the probe so that the sample can be detached from and lifted from the bulk material and transported to a grid for investigation. Various embodiments of the beveled surface are described, including an elliptical probe tip surface beveled between 10 and 45 degrees to the normal to the probe long axis and planar surfaces formed in the sides of the probe body that are parallel to the probe long axis.

Abstract: A method for creating a low-cost specimen used for training users in lift out techniques is prepared using additive manufacturing. This replaces the more expensive and time-intensive subtractive manufacturing methods traditionally used that operate by milling or ablation with charged particle focused ion beam (FIB) instruments or lasers. The method comprises building up a sample from a substrate surface using additive manufacturing, building up trench walls within the sample that frame a trench using additive manufacturing, and building up a specimen between the trench walls using additive manufacturing. In a preferred form, the specimen has a shape taken from the group consisting of a lamella, a rectangular cuboid, a triangular prism, and a regular prism. Tabs and other support structures may be eliminated using subtractive milling or chemical dissolving methods to create a freestanding specimen separate from the trench.

Abstract: A method for mounting a specimen on a specimen carrier for milling in an ex-situ lift-out (EXLO) milling process is described where “cross-section” specimens, plan view specimens, or bulk specimens may be lifted-out for analysis. The method comprising positioning the specimen on a recessed surface within a specimen carrier top surface so that a region to be milled is centered about a carrier opening formed through the specimen carrier. Peripheral edges of the specimen are then wedged against inwardly sloping side walls framing the recessed surface. Finally, the specimen is mounted to the specimen carrier so that a path of a milling beam intersects the region to be milled and carrier opening.

Abstract: A specimen carrier for use with an ex-situ lift-out (EXLO) milling process includes a carrier top surface having at least one specimen support area and at least one aperture formed through the specimen carrier top surface. The aperture includes a first opening having an open wider upper end and a narrower lower end. The first opening is bounded by opposed sidewalls in spaced-apart orientation that are inwardly inclined from the wider upper end to the narrower lower end. The aperture is configured to enable a specimen to sit over the opening and can be wedged between the first opening opposed sidewalls so that a region of interest to be milled is centered about the open end of the opening. Specimens so mounted can then be re-thinned via charged particle instruments such as focused ion beam (FIB) milling, broad beam ion milling, or via laser ablation.

Abstract: A method for mounting a specimen on a specimen carrier for milling in an ex-situ lift-out (EXLO) milling process is described where “cross-section” specimens, plan view specimens, or bulk specimens may be lifted-out for analysis. The method comprising positioning the specimen on a recessed surface within a specimen carrier top surface so that a region to be milled is centered about a carrier opening formed through the specimen carrier. Peripheral edges of the specimen are then wedged against inwardly sloping side walls framing the recessed surface. Finally, the specimen is mounted to the specimen carrier so that a path of a milling beam intersects the region to be milled and carrier opening.