Patents Assigned to Exsight Ltd.
  • Patent number: 5587664
    Abstract: An apparatus for testing an electrical part having a number of conductive paths. The apparatus includes a mechanism for directing a laser pulse to impinge upon a conductor of the part under test so as to form a metallic plasma and one or more pairs of probes which, along with the conductor and the plasma, form a part of an electrical circuit. Finally, the apparatus includes a detector which is responsive to the amount of conduction via the plasma between the conductor and the probes.
    Type: Grant
    Filed: July 12, 1995
    Date of Patent: December 24, 1996
    Assignee: Exsight Ltd.
    Inventors: David Banitt, Moshe B. Shlomo