Abstract: Systems and methods for sample analysis include applying, using a first laser source, a first beam to a sample to desorb organic material from a location of the sample and ionizing the desorbed organic material using a second laser source to generate ionized organic material. The ionized organic material is then analyzed using a mass spectrometer. A second beam from the first laser is then applied to the sample to ablate inorganic material from the location of the sample. The ablated inorganic material is then ionized using the second laser source to generate ionized inorganic material. The mass spectrometer is then used to analyze the ionized inorganic material. During analysis, one or more images of the sample may also be captured and linked to the collected analysis data.
Type:
Grant
Filed:
November 1, 2021
Date of Patent:
September 26, 2023
Assignee:
Exum Instruments
Inventors:
Jeffrey Williams, Stephen Strickland, Neal Wostbrock, Oleg Maltsev, Matthew McGoogan, Scott Messina
Abstract: Systems and methods for sample analysis include applying, using a first laser source, a first beam to a sample to desorb organic material from a location of the sample and ionizing the desorbed organic material using a second laser source to generate ionized organic material. The ionized organic material is then analyzed using a mass spectrometer. A second beam from the first laser is then applied to the sample to ablate inorganic material from the location of the sample. The ablated inorganic material is then ionized using the second laser source to generate ionized inorganic material. The mass spectrometer is then used to analyze the ionized inorganic material. During analysis, one or more images of the sample may also be captured and linked to the collected analysis data.
Type:
Grant
Filed:
April 11, 2019
Date of Patent:
November 2, 2021
Assignee:
Exum Instruments
Inventors:
Jeffrey Williams, Stephen Strickland, Neal Wostbrock, Oleg Maltsev, Matthew McGoogan, Scott Messina
Abstract: A technique for sample analysis includes capturing an image of an analysis location of a sample disposed within a sample chamber using an imaging device having a field of view into the sample chamber along an axis. Subsequent to capturing the image, a material removal beam is directed along the axis the sample to desorb or ablate sample material from the sample at the analysis location. An ionization beam is then applied to the sample material to generate ionized sample material and the ionized sample material is delivered to a mass spectrometer for analysis. Each of organic and inorganic analysis may be conducted at a given analysis location by desorbing and analyzing organic material and subsequently ablating and analyzing inorganic material, the desorption and ablation processes performed using beams delivered along the same axis as the imaging device's field of view.
Type:
Application
Filed:
February 26, 2021
Publication date:
June 17, 2021
Applicant:
Exum Instruments
Inventors:
Jeffrey T. Williams, Oleg V. Maltsev, Gurpreet Singh, Stephen C. Strickland, Cole D. Naymark, Jonathan Putman, Jens Cole
Abstract: Systems and methods for sample analysis include applying, using a first laser source, a first beam to a sample to desorb organic material from a location of the sample and ionizing the desorbed organic material using a second laser source to generate ionized organic material. The ionized organic material is then analyzed using a mass spectrometer. A second beam from the first laser is then applied to the sample to ablate inorganic material from the location of the sample. The ablated inorganic material is then ionized using the second laser source to generate ionized inorganic material. The mass spectrometer is then used to analyze the ionized inorganic material. During analysis, one or more images of the sample may also be captured and linked to the collected analysis data.
Type:
Application
Filed:
April 11, 2019
Publication date:
October 15, 2020
Applicant:
Exum Instruments
Inventors:
Jeffrey Williams, Stephen Strickland, Neal Wostbrock, Oleg Maltsev, Matthew McGoogan, Scott Messina